74ALVCH16260PAG8

INDUSTRIAL TEMPERATURE RANGE
4
IDT74ALVCH16260
3.3V CMOS 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCH
Symbol Parameter Test Conditions Min. Typ.
(1)
Max. Unit
VIH Input HIGH Voltage Level VCC = 2.3V to 2.7V 1.7 V
VCC = 2.7V to 3.6V 2
V
IL Input LOW Voltage Level VCC = 2.3V to 2.7V 0.7 V
VCC = 2.7V to 3.6V 0.8
IIH Input HIGH Current VCC = 3.6V VI = VCC —— ±A
IIL Input LOW Current VCC = 3.6V VI = GND ±A
IOZH High Impedance Output Current VCC = 3.6V VO = VCC ——±10 µ A
IOZL (3-State Output pins) VO = GND ±10
VIK Clamp Diode Voltage VCC = 2.3V, IIN = –18mA –0.7 –1.2 V
VH Input Hysteresis VCC = 3.3V 100 mV
I
CCL Quiescent Power Supply Current VCC = 3.6V 0.1 40 µ A
ICCH VIN = GND or VCC
ICCZ
ΔICC Quiescent Power Supply Current One input at VCC - 0.6V, other inputs at VCC or GND 750 µ A
Variation
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Operating Condition: TA = –40°C to +85°C
NOTE:
1. Typical values are at VCC = 3.3V, +25°C ambient.
BUS-HOLD CHARACTERISTICS
Symbol Parameter
(1)
Test Conditions Min. Typ.
(2)
Max. Unit
IBHH Bus-Hold Input Sustain Current VCC = 3V VI = 2V 75 µ A
IBHL VI = 0.8V 75
IBHH Bus-Hold Input Sustain Current VCC = 2.3V VI = 1.7V 45 µ A
IBHL VI = 0.7V 45
IBHHO Bus-Hold Input Overdrive Current VCC = 3.6V VI = 0 to 3.6V ±500 µA
IBHLO
NOTES:
1. Pins with Bus-Hold are identified in the pin description.
2. Typical values are at VCC = 3.3V, +25°C ambient.
INDUSTRIAL TEMPERATURE RANGE
IDT74ALVCH16260
3.3V CMOS 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCH
5
OPERATING CHARACTERISTICS, TA = 25°C
VCC = 2.5V ± 0.2V VCC = 3.3V ± 0.3V
Symbol Parameter Test Conditions Typical Typical Unit
CPD Power Dissipation Capacitance Outputs enabled CL = 0pF, f = 10Mhz 37 41 pF
CPD Power Dissipation Capacitance Outputs disabled 4 7
NOTE:
1. VIH and VIL must be within the min. or max. range shown in the DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE table for the appropriate VCC range.
TA = – 40°C to + 85°C.
OUTPUT DRIVE CHARACTERISTICS
Symbol Parameter Test Conditions
(1)
Min. Max. Unit
VOH Output HIGH Voltage VCC = 2.3V to 3.6V IOH = – 0.1mA VCC – 0.2 V
V
CC = 2.3V IOH = – 6mA 2
VCC = 2.3V IOH = – 12mA 1.7
V
CC = 2.7V 2.2
VCC = 3V 2.4
VCC = 3V IOH = – 24mA 2
VOL Output LOW Voltage VCC = 2.3V to 3.6V IOL = 0.1mA 0.2 V
V
CC = 2.3V IOL = 6mA 0.4
I
OL = 12mA 0.7
VCC = 2.7V IOL = 12mA 0.4
VCC = 3V IOL = 24mA 0.55
NOTES:
1. See TEST CIRCUITS AND WAVEFORMS. TA = – 40°C to + 85°C.
2. Skew between any two outputs of the same package and switching in the same direction.
SWITCHING CHARACTERISTICS
(1)
VCC = 2.5V ± 0.2V VCC = 2.7V VCC = 3.3V ± 0.3V
Symbol Parameter Min. Max. Min. Max. Min. Max. Unit
t
PLH Propagation Delay 1 5.4 5.1 1.2 4.3 ns
tPHL Ax to 1Bx or Ax to 2Bx
t
PLH Propagation Delay 1 5.4 5.1 1.2 4.3 ns
tPHL 1Bx to Ax or 2Bx to Ax
tPLH Propagation Delay 1 5.6 5.2 1 4.4 ns
tPHL LEXB to Ax
t
PLH Propagation Delay 1 5.6 5.2 1 4.4 ns
tPHL LE1B to 1BX or LEA2B to 2Bx
t
PLH Propagation Delay 1 6.9 6.6 1.1 5.6 ns
tPHL SEL to Ax
tPZH Output Enable Time 1 6.7 6.4 1 5.4 ns
tPZL OEA to Ax, OE1B to 1Bx, or OE2B to 2Bx
t
PHZ Output Disable Time 1 5.7 5 1.3 4.6 ns
tPLZ OEA to Ax, OE1B to 1Bx, or OE2B to 2Bx
tSU Set-up Time, data before LE1B, LE2B, LEA1B, LEA2B 1.4 1.1 1.1 ns
tH Hold Time, data after LE1B, LE2B, LEA1B, LEA2B 1.6 1.9 1.5 ns
tW Pulse Width, LE1B, LE2B, LEA1B, or LEA2B HIGH 3.3 3.3 3.3 ns
t
SK(O) Output Skew
(2)
———500 ps
INDUSTRIAL TEMPERATURE RANGE
6
IDT74ALVCH16260
3.3V CMOS 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCH
Open
V
LOAD
GND
V
CC
Pulse
Generator
D.U.T.
500Ω
500Ω
C
L
R
T
V
IN
V
OUT
(1, 2)
ALVC Link
INPUT
V
IH
0V
V
OH
V
OL
t
PLH1
t
SK
(x)
OUTPUT 1
OUTPUT 2
t
PHL1
t
SK
(x)
t
PLH2
t
PHL2
V
T
V
T
V
OH
V
T
V
OL
t
SK
(x)
= t
PLH2
-
t
PLH1
or
t
PHL2
-
t
PHL1
ALVC Link
SAME PHASE
INPUT TRANSITION
OPPOSITE PHASE
INPUT TRANSITION
0V
0V
V
OH
V
OL
t
PLH
t
PHL
t
PHL
t
PLH
OUTPUT
V
IH
V
T
V
T
V
IH
V
T
ALVC Link
DATA
INPUT
0V
0V
0V
0V
t
REM
TIMING
INPUT
SYNCHRONOUS
CONTROL
t
SU
t
H
t
SU
t
H
V
IH
V
T
V
IH
V
T
V
IH
V
T
V
IH
V
T
ALVC Link
ASYNCHRONOUS
CONTROL
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
V
T
t
W
V
T
ALVC Link
CONTROL
INPUT
t
PLZ
0V
OUTPUT
NORMALLY
LOW
t
PZH
0V
SWITCH
CLOSED
OUTPUT
NORMALLY
HIGH
ENABLE
DIS-
ABLE
SWITCH
OPEN
t
PHZ
0V
V
LZ
V
OH
V
T
V
T
t
PZL
V
LOAD/2
V
LOAD/2
V
IH
V
T
V
OL
V
HZ
ALVC Link
TEST CIRCUITS AND WAVEFORMS
Propagation Delay
Test Circuit for All Outputs
Enable and Disable Times
Set-up, Hold, and Release Times
NOTES:
1. For tSK(o) OUTPUT1 and OUTPUT2 are any two outputs.
2. For tSK(b) OUTPUT1 and OUTPUT2 are in the same bank.
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
NOTES:
1. Pulse Generator for All Pulses: Rate 1.0MHz; tF 2.5ns; tR 2.5ns.
2. Pulse Generator for All Pulses: Rate 1.0MHz; tF 2ns; tR 2ns.
Output Skew - tSK(X)
Pulse Width
NOTE:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
Symbol VCC
(1)
= 3.3V±0.3V VCC
(1)
= 2.7V VCC
(2)
= 2.5V±0.2V Unit
VLOAD 6 6 2 x Vcc V
VIH 2.7 2.7 Vcc V
VT 1.5 1.5 Vcc / 2 V
VLZ 300 300 150 mV
VHZ 300 300 150 mV
C
L 50 50 30 pF
TEST CONDITIONS
SWITCH POSITION
Test Switch
Open Drain
Disable Low V
LOAD
Enable Low
Disable High GND
Enable High
All Other Tests Open

74ALVCH16260PAG8

Mfr. #:
Manufacturer:
IDT
Description:
Latches 3.3V FAST CMOS 18BIT
Lifecycle:
New from this manufacturer.
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