NCV7721
www.onsemi.com
4
Table 2. MAXIMUM RATINGS (Voltages are with respect to device substrate.)
Rating
Value Unit
Power Supply Voltage (V
S
)
DC
AC, t < 500 ms, I
Vs
> −2 A
−0.3 to 40
−1
V
Output Pin OUTx
DC
AC, t < 500 ms, I
Vs
> −2 A
−0.3 to 40
−1
V
Pin Voltage
(IN1, IN2, EN, VCC)
(FLTB)
−0.3 to 5.5
−0.3 to (VCC + 0.3)
V
Output Current (OUTx)
DC
AC, 50 ms pulse, 1s period
−1.8 to 1.8
−4.0 to 4.0
A
Electrostatic Discharge, Human Body Model
(V
S
, OUT1, OUT2) (Note 3)
6 kV
Electrostatic Discharge, Human Body Model
All other pins (Note 3)
2 kV
Electrostatic Discharge, Machine Model
All pins
200 V
Moisture Sensitivity Level MSL3 −
Operating Junction Temperature, T
J
−40 to 150 °C
Storage Temperature Range −55 to 150 °C
Peak Reflow Soldering Temperature: Lead−free
60 to 150 seconds at 217°C (Note 4)
260 peak °C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
Thermal Parameters
Test Conditions (Typical Value) Unit
14 Pin Fused SOIC Package Min−pad board
(Note 1)
1″ pad board
(Note 2)
Junction−to−Lead (psi−JL8, Y
JL8
) or Pins 1, 7, 8, 14
23 22 °C/W
Junction−to−Ambient (R
q
JA
, q
JA
)
122 83 °C/W
1. 1−oz copper, 67 mm
2
copper area, 0.062″ thick FR4.
2. 1−oz copper, 645 mm
2
copper area, 0.062″, thick FR4.
3. This device series incorporates ESD protection and is characterized by the following methods:
ESD HBM according to AEC−Q100−002 (EIA/JESD22−A114)
ESD MM according to AEC−Q100−003 (EIA/JESD22−A115)
4. For additional information, see or download ON Semiconductor’s Soldering and Mounting Techniques Reference Manual, SOLDERRM/D,
and Application Note AND8003/D.