N74F3037N,602

Philips Semiconductors Product specification
74F3037Quad 2-input NAND 30 driver
February 9, 1990
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL PARAMETER LIMITS T
A
=
–40 to
+85
°C
UNIT MIN NOM MAX
V
CC
Supply voltage 4.5 5.0 5.5 V
V
IH
High–level input voltage 2.4 V
V
IL
Low–level input voltage 0.8 V
I
Ik
Input clamp current –18 mA
I
OH
High–level output current –67 mA
I
OL
Low–level output current 160 mA
T
amb
Operating free air temperature range Commercial range 0 +70
°C
Industrial range –40 +85
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER TEST LIMITS UNIT
CONDITIONS
1
MIN TYP
2
MAX
V
CC
= MIN, I
OH
= –45mA
±10%V
CC
2.5 V
V
OH
High–level output voltage V
IL
= MAX,
±5%V
CC
2.7 V
V
IH
= MIN
I
OH1
=
–67mA
3
±10%V
CC
2.0 V
V
OL
Low–level output voltage
V
CC
= MIN, V
IL
=
MAX,
I
OL
= 100mA
±10%V
CC
0.30 0.50 V
V
IH
= MIN
I
OL1
=
160mA
4
±5%V
CC
0.30 0.50 V
V
IK
Input clamp voltage V
CC
= MIN, I
I
= I
IK
-0.73 -1.2 V
I
I
Input current at maximum input voltage V
CC
= MAX, V
I
= 7.0V 100
µA
I
IH
High–level input current V
CC
= MAX, V
I
= 2.7V 20
µA
I
IL
Low–level input current V
CC
= MAX, V
I
= 0.5V -0.6 mA
I
O
Output current
5
V
CC
= MAX, V
O
= 2.25V -100 -200 mA
I
CC
Supply current (total) I
CCH
V
CC
= MAX 6.0 9.0 mA
I
CCL
30 40 mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. I
OH1
is the current necessary to guarantee the low to high transition in a 30 ohm transmission line on the incident wave.
4. I
OL1
is the current necessary to guarantee the high to low transition in a 30 ohm transmission line on the incident wave.
5. I
O
is tested under conditions that produce current approximately one half of the true short–circuit current (I
OS
).
AC ELECTRICAL CHARACTERISTICS
LIMITS
T
amb
= +25°C T
amb
= 0°C to +70°C T
amb
=–40°C to +85°C
SYMBOL PARAMETER TEST V
CC
= +5.0V
V
CC
= +5.0V ± 10% V
CC
= +5.0V ± 10%
UNIT
CONDITION C
L
= 50pF,
R
L
= 500
C
L
= 50pF,
R
L
= 500
C
L
= 50pF,
R
L
= 500
MIN TYP MAX MIN MAX MIN MAX
t
PLH
t
PHL
Propagation delay
Dna, Dnb to Qn
Waveform 1
1.0
1.0
2.0
2.0
5.0
4.5
1.0
1.0
5.5
5.0
1.0
1.0
5.5
5.0
ns
Philips Semiconductors Product specification
74F3037Quad 2-input NAND 30 driver
February 9, 1990
5
AC WAVEFORMS
V
M
V
M
V
M
V
M
Qn
Dna, Dnb
t
PHL
t
PLH
SF00005
Waveform 1. Propagation delay for inverting outputs
Note to AC waveforms
For all waveforms, V
M
= 1.5V.
TEST CIRCUIT AND WAVEFORMS
t
w
90%
V
M
10%
90%
V
M
10%
90%
V
M
10%
90%
V
M
10%
NEGATIVE
PULSE
POSITIVE
PULSE
t
w
AMP (V)
0V
0V
t
THL
(
t
f
)
INPUT PULSE REQUIREMENTS
rep. rate
t
w
t
TLH
t
THL
1MHz 500ns
2.5ns 2.5ns
Input Pulse Definition
V
CC
family
74F
D.U.T.
PULSE
GENERATOR
R
L
C
L
R
T
V
IN
V
OUT
Test Circuit for Totem-Pole Outputs
DEFINITIONS:
R
L
= Load resistor;
see AC ELECTRICAL CHARACTERISTICS for value.
C
L
= Load capacitance includes jig and probe capacitance;
see AC ELECTRICAL CHARACTERISTICS for value.
R
T
= Termination resistance should be equal to Z
OUT
of
pulse generators.
t
THL
(
t
f
)
t
TLH
(
t
r
)
t
TLH
(
t
r
)
AMP (V)
amplitude
3.0V
1.5V
V
M
SF00006
Philips Semiconductors Product specification
74F3037Quad 2-input NAND 30 driver
1990 Feb 09
6
DIP16: plastic dual in-line package; 16 leads (300 mil) SOT38-4

N74F3037N,602

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
Logic Gates QUAD 2-IN NAND DRVR
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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