2
Electrical Specications
1. Small/Large -signal data measured in a fully de-embedded test xture form TA = 25°C.
2. Pre-assembly into package performance veried 100% on-wafer.
3. This nal package part performance is veried by a functional test correlated to actual performance at one or more
frequencies.
4. Specications are derived from measurements in a 50 Ω test environment. Aspects of the amplier performance
may be improved over a more narrow bandwidth by application of additional conjugate, linearity, or low noise
(Гopt) matching.
Table 1. RF Electrical Characteristics
TA=25°C, Vd=50V, Vg=-1.4V, Idq=85mA, Zin=Zout=50 Ω
Parameter Min Typ. Max Unit
Output Power, Pout 13 16 dBm
Input Power at 1dB Gain Compression,
IP-1dB
2 dBm
Input Return Loss, RLin -15 dB
Output Return Loss, RLout -10 dB
Fundamental Suppresion, Sup 18 25 dBc
3rd Harmonic Suppression, Sup3 25 dBc
4th Harmonic Suppression, Sup4 35 dBc
Single Side Band Phase Noise, SSBPN
(@100kHz oset, fout=15.6GHz)
-140 dBc
Table 2. Recommended Operating Range
1. Ambient operational temperature TA = 25°C unless otherwise noted.
2. Channel-to-backside Thermal Resistance (Tchannel (Tc) = 34°C) as measured using infrared microscopy. Thermal Re-
sistance at backside temperature (Tb) = 25°C calculated from measured data.
Description Min. Typical Max. Unit Comments
Drain Supply Current, Id 85 110 mA Vd = 5V, Under any RF power
drive and temperature
Gate Current, Ig 9 uA
Table 3. Thermal Properties
Parameter Test Conditions Value
Thermal Resistance, qch-b
Channel-to-backside Thermal Resistance Tchannel(Tc)=34°C
Thermal Resistance at backside temperature Tb=25°C
qch-b = 34 °C/W
Absolute Minimum and Maximum Ratings
Table 4. Minimum and Maximum Ratings
Description Min. Max. Unit Comments
Drain Supply Voltage, Vd 7 V
Gate Supply Voltage, Vg -3.0 +0.5 V
Drain Current, Idq 120 mA
CW Input Power, Pin 15 dBm
Channel Temperature, Tch +150 °C
Storage Temperature , Tstg -65 +150 °C
Maximum Assembly Temperature, Tmax +300 °C 60 second maximum
Notes:
1. Operation in excess of any one of these conditions may result in permanent damage to this device.