AOWF11C60

AOWF11C60
600V,11A N-Channel MOSFET
General Description Product Summary
V
DS
@ T
j,max
700V
I
DM
80A
R
DS(ON),max
< 0.44
Q
g,typ
30nC
E
oss
@ 400V 5.1µJ
Applications
100% UIS Tested
100% R
g
Tested
• Latest Trench Power AlphaMOS-II technology
• Low R
DS(ON)
• Low Ciss and Crss
• High Current Capability
• RoHS and Halogen Free Compliant
• General Lighting for LED and CCFL
• AC/DC Power supplies for Industrial, Consumer, and
Telecom
AOWF11C60
Orderable Part Number Package Type Form Minimum Order Quantity
TO-262F
Tube
1000
G
D
S
Top View
TO-262F
Bottom View
G
D
S
G
D
S
AOWF11C60
V
DS
V
GS
I
DM
I
AR
E
AR
E
AS
MOSFET dv/dt ruggedness
Peak diode recovery dv/dt
T
J
, T
STG
T
L
Symbol
R
θ
JA
R
θJC
* Drain current limited by maximum junction temperature.
28
0.2
Maximum Junction-to-Ambient
A,D
65
AOWF11C60
P
D
11
TO-262F
Tube
4.5
300
-55 to 150
Max
°C
°C/W
Units
°C/W
A
°C
mJ
W
W/°C
mJ
20
dv/dt
100
V/ns
V±30Gate-Source Voltage
T
C
=100°C
A
80Pulsed Drain Current
C
Continuous Drain
Current
T
C
=25°C
I
D
11*
9*
Parameter
Absolute Maximum Ratings T
A
=25°C unless otherwise noted
Drain-Source Voltage 600
Max
1000
Maximum Junction-to-Case
Avalanche Current
C,J
60
Single pulsed avalanche energy
G
750
Parameter
Maximum lead temperature for soldering
purpose, 1/8" from case for 5 seconds
Junction and Storage Temperature Range
Derate above 25°
C
Repetitive avalanche energy
C,J
T
C
=25°C
Thermal Characteristics
Power Dissipation
B
V
Units
Rev.2.0: Auguest 2014
www.aosmd.com Page 1 of 6
AOWF11C60
Symbol Min Typ Max Units
600
700
BV
DSS
/
∆TJ
0.55
V/
o
C
1
10
I
GSS
Gate-Body leakage current
±100
nΑ
V
GS(th)
Gate Threshold Voltage
3 4 5 V
R
DS(ON)
0.36 0.44
g
FS
12 S
V
SD
0.7 1 V
I
S
Maximum Body-Diode Continuous Current 11 A
I
SM
80 A
C
iss
2000 pF
C
oss
84 pF
C
o(er)
60 pF
C
o(tr)
107 pF
C
rss
2.8 pF
R
g
3.5
Q
g
30 42 nC
Q
gs
14 nC
Breakdown Voltage Temperature
Coefficient
Drain-Source Breakdown Voltage
I
D
=250µA, V
GS
=0V, T
J
=25°C
Static Drain-Source On-Resistance
V
GS
=10V, I
D
=5.5A
I
D
=250µA, V
GS
=0V
Maximum Body-Diode Pulsed Current
C
Input Capacitance
Output Capacitance
Gate resistance
V
GS
=0V, V
DS
=0V, f=1MHz
Total Gate Charge
V
GS
=10V, V
DS
=480V, I
D
=11A
Reverse Transfer Capacitance
Electrical Characteristics (T
J
=25°C unless otherwise noted)
STATIC PARAMETERS
Parameter Conditions
V
GS
=0V, V
DS
=0 to 480V, f=1MHz
Effective output capacitance, time
related
I
V
DS
=5V,
I
D
=250µA
V
DS
=480V, T
J
=125°C
V
DS
=0V, V
GS
=±30V
I
DSS
Zero Gate Voltage Drain Current
V
DS
=600V, V
GS
=0V
µA
BV
DSS
V
I
D
=250µA, V
GS
=0V, T
J
=150°C
SWITCHING PARAMETERS
I
S
=1A,V
GS
=0V
V
DS
=40V, I
D
=5.5A
Forward Transconductance
Gate Source Charge
Diode Forward Voltage
Effective output capacitance, energy
related
H
DYNAMIC PARAMETERS
V
GS
=0V, V
DS
=100V, f=1MHz
V
GS
=0V, V
DS
=100V, f=1MHz
gs
Q
gd
4 nC
t
D(on)
50 ns
t
r
50 ns
t
D(off)
70 ns
t
f
32 ns
t
rr
485
ns
Q
rr
7.2
µC
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Body Diode Reverse Recovery Charge
I
F
=11A,dI/dt=100A/µs,V
DS
=100V
Turn-On DelayTime
Turn-Off DelayTime
V
GS
=10V, V
DS
=300V, I
D
=11A,
R
G
=25
Turn-Off Fall Time
Body Diode Reverse Recovery Time
I
F
=11A,dI/dt=100A/µs,V
DS
=100V
Turn-On Rise Time
Gate Drain Charge
A. The value of R
θJA
is measured with the device in a still air environment with T
A
=25°C.
B. The power dissipation P
D
is based on T
J(MAX)
=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper
dissipation limit for cases where additional heatsinking is used.
C. Repetitive rating, pulse width limited by junction temperature T
J(MAX)
=150°C, Ratings are based on low frequency and duty cycles to keep initial
T
J
=25°C.
D. The R
θJA
is the sum of the thermal impedance from junction to case R
θJC
and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a
maximum junction temperature of T
J(MAX)
=150°C. The SOA curve provides a single pulse rating.
G. L=60mH, I
AS
=5A, V
DD
=150V, R
G
=25, Starting T
J
=25°C.
H. C
o(er)
is a fixed capacitance that gives the same stored energy as C
oss
while V
DS
is rising from 0 to 80% V
(BR)DSS.
I. C
o(tr)
is a fixed capacitance that gives the same charging time as C
oss
while V
DS
is rising from 0 to 80% V
(BR)DSS.
J. L=1.0mH, V
DD
=150V, R
G
=25Ω, Starting T
J
=25°C.
Rev.2.0: Auguest 2014 www.aosmd.com Page 2 of 6
AOWF11C60
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
0
6
12
18
24
30
0 5 10 15 20 25 30
I
D
(A)
V
DS
(Volts)
Fig 1: On-Region Characteristics
V
GS
=5.5V
6V
10V
6.5V
7V
8V
0.1
1
10
100
2 4 6 8 10
I
D
(A)
V
GS
(Volts)
Figure 2: Transfer Characteristics
-
55
°
C
V
DS
=40V
25°C
125
°
C
0.0
0.2
0.4
0.6
0.8
1.0
0 5 10 15 20 25
R
DS(ON)
(
)
I
D
(A)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage
V
GS
=10V
0
0.5
1
1.5
2
2.5
3
-100 -50 0 50 100 150 200
Normalized On-Resistance
Temperature (°C)
Figure 4: On
-
Resistance vs. Junction Temperature
V
GS
=10V
I
D
=5.5A
40
1E-04
1E-03
1E-02
1E-01
1E+00
1E+01
1E+02
0.0 0.2 0.4 0.6 0.8 1.0
I
S
(A)
V
SD
(Volts)
Figure 6: Body-Diode Characteristics (Note E)
25°C
125°C
Voltage
Figure 4: On
-
Resistance vs. Junction Temperature
0.8
0.9
1
1.1
1.2
-100 -50 0 50 100 150 200
BV
DSS
(Normalized)
T
J
(°C)
Figure 5:Break Down vs. Junction Temperature
Rev.2.0: Auguest 2014 www.aosmd.com Page 3 of 6

AOWF11C60

Mfr. #:
Manufacturer:
Description:
MOSFET N-CH 600V 11A TO-262F
Lifecycle:
New from this manufacturer.
Delivery:
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Payment:
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