Document Number: MMA7261QT
Rev 3, 09/2007
Freescale Semiconductor
Technical Data
© Freescale Semiconductor, Inc., 2005-2007. All rights reserved.
±2.5g - 10g Three Axis Low-g
Micromachined Accelerometer
The MMA7261QT low cost capacitive micromachined accelerometer
features signal conditioning, a 1-pole low pass filter, temperature
compensation and g-Select which allows for the selection among 4
sensitivities. Zero-g offset full scale span and filter cut-off are factory set and
require no external devices. Includes a Sleep Mode that makes it ideal for
handheld battery powered electronics.
Features
Selectable Sensitivity (2.5g/3.3g/6.7g/10g)
Low Current Consumption: 500 μA
Sleep Mode: 3 μA
Low Voltage Operation: 2.2 V – 3.6 V
6mm x 6mm x 1.45mm QFN
Fast Turn On Time
High Sensitivity (2.5 g)
Integral Signal Conditioning with Low Pass Filter
Robust Design, High Shocks Survivability
Environmentally Preferred Package
Low Cost
Typical Applications
HDD MP3 Player: Freefall Detection
Laptop PC: Freefall Detection, Anti-Theft
Cell Phone: Image Stability, Text Scroll, Motion Dialing, E-Compass
Pedometer: Motion Sensing
PDA: Text Scroll
Navigation and Dead Reckoning: E-Compass Tilt Compensation
Gaming: Tilt and Motion Sensing, Event Recorder
Robotics: Motion Sensing
ORDERING INFORMATION
Device Name
Temperature
Range
Package
Drawing
Package
MMA7261QT
– 40 to +105°C 1622-02 QFN-16, Tray
MMA7261QR2
– 40 to +105°C 1622-02 QFN-16,Tape & Reel
MMA7261QT
MMA7261QT: XYZ AXIS
ACCELEROMETER
±2.5g/3.3g/6.7g/10g
16-LEAD
QFN
CASE 1622-02
Bottom View
Figure 1. Pin Connections
Top View
1516 14 13
12
11
10
1
2
3
4
5678
9
g-Select1
N/C
N/C
N/Cg-Select2
V
DD
V
SS
N/CN/C
N/C
N/C
N/C
X
OUT
Y
OUT
Sleep
Mode
Z
OUT
Sensors
2 Freescale Semiconductor
MMA7261QT
Figure 2. Simplified Accelerometer Functional Block Diagram
ELECTRO STATIC DISCHARGE (ESD)
WARNING: This device is sensitive to electrostatic
discharge.
Although the Freescale accelerometer contains internal
2000 V ESD protection circuitry, extra precaution must be
taken by the user to protect the chip from ESD. A charge of
over 2000 volts can accumulate on the human body or
associated test equipment. A charge of this magnitude can
alter the performance or cause failure of the chip. When
handling the accelerometer, proper ESD precautions should
be followed to avoid exposing the device to discharges which
may be detrimental to its performance.
Table 1. Maximum Ratings
(Maximum ratings are the limits to which the device can be exposed without causing permanent damage.)
Rating Symbol Value Unit
Maximum Acceleration (all axis) g
max
±2000 g
Supply Voltage V
DD
–0.3 to +3.6 V
Drop Test
(1)
1. Dropped onto concrete surface from any axis.
D
drop
1.8 m
Storage Temperature Range T
stg
40 to +125 °C
V
SS
Z
OUT
Y
OUT
X
OUT
g-Select1
g-Select2
Sleep Mode
V
DD
G-Cell
Sensor
Oscillator
Clock
Generator
X-Temp
Comp
Y-Temp
Comp
Z-Temp
Comp
C to V
Converter
Gain
+
Filter
Control Logic
EEPROM Trim Circuits
Sensors
Freescale Semiconductor 3
MMA7261QT
Table 2. Operating Characteristics
Unless otherwise noted: –40°C <
T
A
< 105°C, 2.2 V < V
DD
< 3.6 V, Acceleration = 0g, Loaded output
(1)
Characteristic Symbol Min Typ Max Unit
Operating Range
(2)
Supply Voltage
(3)
Supply Current
Supply Current at Sleep Mode
(4)
Operating Temperature Range
Acceleration Range, X-Axis, Y-Axis, Z-Axis
g-Select1 & 2: 00
g-Select1 & 2: 10
g-Select1 & 2: 01
g-Select1 & 2: 11
V
DD
I
DD
I
DD
T
A
g
FS
g
FS
g
FS
g
FS
2.2
-40
3.3
500
3
±2.5
±3.3
±6.7
±10.0
3.6
800
10
+105
V
μA
μA
°C
g
g
g
g
Output Signal
Zero-g (T
A
= 25°C, V
DD
= 3.3 V)
(5)
Zero-g
(4)
X-axis
Y-axis
Z-axis
Sensitivity (T
A
= 25°C, V
DD
= 3.3 V)
2.5g
3.3g
6.7g
10g
Sensitivity
(4)
X-axis
Y-axis
Z-axis
Bandwidth Response
XY
Z
V
OFF
V
OFF
, T
A
V
OFF
, T
A
V
OFF
, T
A
S
2.5g
S
3.3g
S
6.7g
S
10g
S,T
A
S,T
A
S,T
A
f
-3dB
f
-3dB
1.485
-0.5
(6)
-4.2
(6)
-2.5
(6)
444
333
167
111
±0.02
(6)
±0.01
(6)
±0.01
(6)
1.65
-4.5
-6.2
-3.1
480
360
180
120
±0.02
±0.01
±0.00
350
150
1.815
-7.0
(7)
-6.9
(7)
-3.8
(7)
516
387
193
129
±0.02
(7)
±0.01
(7)
±0.01
(7)
V
mg/°C
mg/°C
mg/°C
mV/g
mV/g
mV/g
mV/g
%/°C
%/°C
%/°C
Hz
Hz
Noise
RMS (0.1 Hz – 1 kHz)
(4)
Power Spectral Density RMS (0.1 Hz – 1 kHz)
(4)
n
RMS
n
PSD
4.7
350
mVrms
μg/
Control Timing
Power-Up Response Time
(8)
Enable Response Time
(9)
Sensing Element Resonant Frequency
XY
Z
Internal Sampling Frequency
t
RESPONSE
t
ENABLE
f
GCELL
f
GCELL
f
CLK
1.0
0.5
6.0
3.4
11
2.0
2.0
ms
ms
kHz
kHz
kHz
Output Stage Performance
Full-Scale Output Range (I
OUT
= 30 µA) V
FSO
V
SS
+0.25 V
DD
–0.25 V
Nonlinearity, X
OUT
, Y
OUT
, Z
OUT
NL
OUT
–1.0 +1.0 %FSO
Cross-Axis Sensitivity
(10)
V
XY, XZ, YZ
——5.0 %
1. For a loaded output, the measurements are observed after an RC filter consisting of a 1.0 kΩ resistor and a 0.1 µF capacitor on V
DD
-GND.
2. These limits define the range of operation for which the part will meet specification.
3. Within the supply range of 2.2 and 3.6 V, the device operates as a fully calibrated linear accelerometer. Beyond these supply limits the device
may operate as a linear device but is not guaranteed to be in calibration.
4. This value is measured with g-Select in 2.5g mode.
5. The device can measure both + and – acceleration. With no input acceleration the output is at midsupply. For positive acceleration the output
will increase above V
DD
/2. For negative acceleration, the output will decrease below V
DD
/2.
6.These values represent the 10th percentile, not the minimum.
7.These values represent the 90th percentile, not the maximum.
8. The response time between 10% of full scale V
DD
input voltage and 90% of the final operating output voltage.
9. The response time between 10% of full scale Sleep Mode input voltage and 90% of the final operating output voltage.
10. A measure of the device’s ability to reject an acceleration applied 90° from the true axis of sensitivity.
Hz

MMA7261Q

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
ACCEL 2.5-10G ANALOG 16QFN
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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