74HC_HCT4060_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 2 — 10 April 2013 12 of 25
NXP Semiconductors
74HC4060-Q100; 74HCT4060-Q100
14-stage binary ripple counter with oscillator
[1] t
pd
is the same as t
PHL
and t
PLH
.
[2] Qn+1 is the next Qn output.
[3] t
t
is the same as t
THL
and t
TLH
.
[4] C
PD
is used to determine the dynamic power dissipation (P
D
in W):
P
D
=C
PD
V
CC
2
f
i
N+(C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz;
f
o
= output frequency in MHz;
C
L
= output load capacitance in pF;
V
CC
= supply voltage in V;
N = number of inputs switching;
(C
L
V
CC
2
f
o
) = sum of outputs.
12. Waveforms
C
PD
power
dissipation
capacitance
V
I
= GND to V
CC
1.5 V;
V
CC
=5V; f
i
=1MHz
[4]
-40- - - - -pF
Table 6. Dynamic characteristics
…continued
GND = 0 V; C
L
= 50 pF unless otherwise specified; for test circuit see Figure 11.
Symbol Parameter Conditions 25 C 40 C to +85 C 40 C to +125 C Unit
Min Typ Max Min Max Min Max
Measurement points are given in Table 7.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 8. Waveforms showing the clock (RS) to output (Q3) propagation delays, the clock pulse width, the output
transition times and the maximum clock frequency
001aai118
RS input
1/f
max
t
W
t
THL
t
TLH
t
PHL
t
PLH
V
OH
V
I
GND
V
OL
V
M
V
M
10 %
90 %90 %
10 %
Q3 output
74HC_HCT4060_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 2 — 10 April 2013 13 of 25
NXP Semiconductors
74HC4060-Q100; 74HCT4060-Q100
14-stage binary ripple counter with oscillator
Measurement points are given in Table 7.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 9. Waveforms showing the output Qn to output Qn+1 propagation delays
001aai120
Qn output
t
PLH
t
PHL
V
OH
V
OH
V
OL
V
OL
V
M
V
M
Qn+1 output
Measurement points are given in Table 7.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 10. Waveforms showing the master reset (MR) pulse width, the master reset to output (Qn) propagation
delays and the master reset to clock (RS) recovery time
001aai119
RS input
MR input
t
PHL
t
rec
V
OH
V
I
GND
V
I
V
OL
V
M
V
M
T
W
V
M
GND
Qn output
Table 7. Measurement points
Type Input Output
V
M
V
M
74HC4060-Q100 0.5 V
CC
0.5 V
CC
74HCT4060-Q100 1.3 V 1.3 V
74HC_HCT4060_Q100 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 2 — 10 April 2013 14 of 25
NXP Semiconductors
74HC4060-Q100; 74HCT4060-Q100
14-stage binary ripple counter with oscillator
Test data is given in Table 8.
Definitions test circuit:
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= Load capacitance including jig and probe capacitance.
Fig 11. Test circuit for measuring switching times
001aah768
t
W
t
W
t
r
t
r
t
f
V
M
V
I
negative
pulse
GND
V
I
positive
pulse
GND
10 %
90 %
90 %
10 %
V
M
V
M
V
M
t
f
V
CC
DUT
R
T
V
I
V
O
C
L
G
Table 8. Test data
Type Input Load
V
I
t
r
, t
f
C
L
74HC4060-Q100 V
CC
6 ns 15 pF, 50 pF
74HCT4060-Q100 3 V 6 ns 15 pF, 50 pF

74HC4060DB-Q100J

Mfr. #:
Manufacturer:
Nexperia
Description:
Counter ICs 14stage binaryripple counter w/oscillator
Lifecycle:
New from this manufacturer.
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