OPTEK Technology Inc. — 1645 Wallace Drive, Carrollton, Texas 75006
Phone: (972) 323-2200 or (800) 341-4747 FAX: (972) 323-2396 sensors@optekinc.com www.optekinc.com
Issue A.3 11/09
Page 9 of 12
OPTEK reserves the right to make changes at any time in order to improve design and to supply the best product possible.
Solid State Relays
4-Pin SIP Package—VDC Input—VAC/VDC Output
OSSRD2001D and OSSRD2002A
Label Identification:
DESCRIPTION:
Size: 3” (7.4 cm) X 2.2” (5.5 cm)
Lettering shall be black on white background.
Format shall be as:
Notes:
1. The DATE CODE is a 4-digit code for date of manufacture where YY is
the last two digits of the year, and WW is week number of manufacture.
2. The LOT I.D. is the manufacturing location lot identification where Y is
the year of manufacture, NNNN is a sequential lot identifier, and DDD is
the day of the year of manufacture. – or use equivalent label format.
Parameter Failure Criteria Test Conditions
Room Temperature Operating Life
(for light emitting diodes only)
± 20%
T
A
= 25°C, I
F
= 60mA or max. rated,
Time = 1000 hours
High Humidity, High Temperature
Reverse Bias
± 20%
JEDEC, Method A101-B
T
A
= 85°C, Humidity = 85%RH,
Time = 1000 hours
High Temperature Forward Bias ± 20%
JEDEC, Method A108-A
T
A
= 70°C, I
F
= 20mA, Time = 1000 hours
Autoclave 0 Fail
T
A
= 121°C, Pressure = 15psi,
Humidity = 100%
IR Reflow / Solderability Test 0 Fail
JEDEC (J-STD-020) /
MIL-STD-883E, Method 2003.7
MTTF @ 90% confidence 150,000 Min. @ 25°C, 25mADC
Moisture Sensitivity Level MSL 1 per JDEC stnd J-STD-020B
Glass Transition of body 125°C Min. DSC test method
Temperature Humidity-Bias ± 20% 85°C, 85%RH, 500Hrs, 80% min Iceo
Temperature Cycle ± 20% per Method 1010.7 of MIL-STD-883E
High Temperature Storage ± 20% 85°C, 500Hrs
Quality and Reliability Requirements
