CY7C245
Document #: 38-04007 Rev. *D Page 4 of 12
Maximum Ratings
[2]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ..................................... −65°C to +150°C
Ambient Temperature with
Power Applied.................................................. −55°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12).................................................−0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State .....................................................−0.5V to +7.0V
DC Input Voltage .................................................−3.0V to +7.0V
DC Program Voltage (Pins 7, 18, 20) ...........................13.0V
UV Erasure...................................................7258 Wsec/cm
2
Static Discharge Voltage...........................................> 2001V
(per MIL-STD-883, Method 3015)
Latch-up Current.....................................................> 200 mA
Operating Range
Range Ambient Temperature V
CC
Commercial 0°C to +70°C 5V ±10%
Military
[3]
−55°C to +125°C 5V ±10%
Industrial –40°C to +85°C 5V ±10%
Electrical Characteristics Over the Operating Range
[4,5]
Parameter Description Test Conditions
7C245A-15 7C245A-18
7C245A-25
7C245A-35
7C245A-45
UnitMin. Max. Min. Max. Min. Max.
V
OH
Output HIGH Voltage V
CC
= Min., I
OH
= −4.0 mA
V
IN
= V
IH
or V
IL
2.4 2.4 2.4 V
V
OL
Output LOW Voltage V
CC
= Min., I
OL
= 16 mA
V
IN
= V
IH
or V
IL
0.4 0.4 0.4 V
V
IH
Input HIGH Level Guaranteed Input Logical
HIGH Voltage for All Inputs
2.0 V
CC
2.0 V
CC
2.0 V
CC
V
V
IL
Input LOW Level Guaranteed Input Logical
LOW Voltage for All Inputs
0.8 0.8 0.8 V
I
IX
Input Leakage Current GND < V
IN
< V
CC
−10 +10 −10 +10 −10 +10 µA
V
CD
Input Clamp Diode Voltage Note 5
I
OZ
Output Leakage Current GND < V
O
< V
CC
Output
Disabled
[6]
−10 +10 −10 +10 −10 +10 µA
I
OS
Output Short Circuit Current V
CC
= Max., V
OUT
= 0.0V
[7]
−20 −90 −20 −90 −20 −90 mA
I
CC
Power Supply Current V
CC
= Max.,
I
OUT
= 0 mA
Com’l 120 120 90 mA
Mil 120 120
V
PP
Programming Supply Voltage 12 13 12 13 12 13 V
I
PP
Programming Supply Current 50 50 50 mA
V
IHP
Input HIGH Programming Voltage 3.0 3.0 3.0 V
V
ILP
Input LOW Programming Voltage 0.4 0.4 0.4 V
Capacitance
[5]
Parameter Description Test Conditions Max. Unit
C
IN
Input Capacitance T
A
= 25°C, f = 1 MHz,
V
CC
= 5.0V
10 pF
C
OUT
Output Capacitance 10 pF
Notes:
2. The voltage on any input or I/O pin cannot exceed the power pin during power-up.
3. T
A
is the “instant on” case temperature.
4. See page 3 of this data sheet for Group A subgroup testing information.
5. See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.
6. For devices using the synchronous enable, the device must be clocked after applying these voltages to perform this measurement.
7. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
