CBTL02GP023 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2017. All rights reserved.
Product data sheet Rev. 2 — 14 August 2017 5 of 19
NXP Semiconductors
CBTL02GP023
5 Gbps rail-to-rail low insertion loss switch
7. Limiting values
[1] Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the
device. These are stress ratings only and functional operation of the device at these or any conditions
beyond those indicated under recommended operating conditions is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
[2] All voltage values, except differential voltages, are with respect to network ground terminal.
[3] Human Body Model: ANSI/EOS/ESD-S5.1-1994, standard for ESD sensitivity testing, Human Body Model -
Component level; Electrostatic Discharge Association, Rome, NY, USA.
[4] Charged Device Model: ANSI/EOS/ESD-S5.3-1-1999, standard for ESD sensitivity testing, Charged Device
Model - Component level; Electrostatic Discharge Association, Rome, NY, USA.
8. Recommended operating conditions
Table 6. Limiting values
[1]
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
V
DD
supply voltage
[2]
0.3 +4.6 V
V
I
input voltage of control pins
[2]
0.3 +5.5 V
V
IO
voltage of I/O pins of
switches
[2]
0.3 +4.6 V
T
stg
storage temperature 65 +150 C
V
ESD
electrostatic discharge
voltage
HBM
[3]
- 2000 V
CDM
[4]
-750V
Table 7. Operating conditions
Symbol Parameter Conditions Min Typ Max Unit
VDD supply voltage 3.3 V supply option 2.7 - 3.5 V
V
I
input voltage CMOS inputs 0.3 - +5.5 V
MUX I/O pins 0.3 - +3.5 V
T
amb
ambient operating
temperature
operating in free air 20 - +85 C
