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AD9387NKBBCZRL-80

P1-P3P4-P6P7-P9
AD9387NK
Rev. 0 | Page 3 of 8
SPECIFICATIONS
Table 1. AD9387NKBBCZ-80/AD9387NKBBCZRL-80
Parameter Conditions Temp Test Level
1
Min Typ Max Unit
DIGITAL INPUTS
Input Voltage, High (V
IH
) Full VI 1.4 3.5 V
Input Voltage, Low (V
IL
) Full VI −0.3 +0.7 V
Input Capacitance 25°C VIII 3 pF
THERMAL CHARACTERISTICS
Thermal Resistance
Junction-to-Case BGA (θ
JC
) V 15.2 °C/W
Junction-to-Ambient (θ
JA
) V 59 °C/W
Ambient Temperature Full V −25 +25 +90 °C
DC SPECIFICATIONS
Input Leakage Current (I
IL
) Full VI −10 +10 μA
AC SPECIFICATIONS
CLK Frequency Full IV 13.5 80 MHz
TMDS Output CLK Duty Cycle Full IV 48 52 %
Input Data Setup Time Full IV 1 ns
Input Data Hold Time Full IV 0.7 ns
TMDS Differential Swing VI 900 1000 1100 mV
VSYNC and HSYNC Delay from DE Falling Edge IV 1 UI
2
VSYNC and HSYNC Delay to DE Rising Edge IV 1 UI
2
Differential Output Swing
Low-to-High Transition Time 25°C VII 75 175 ps
High-to-Low Transition Time 25°C VII 75 175 ps
AUDIO AC TIMING
Sample Rate I
2
S and S/PDIF Full IV 32 192 kHz
I
2
S Cycle Time 25°C IV 1 UI
2
I
2
S Setup Time 25°C IV 2 ns
I
2
S Hold Time 25°C IV 2 ns
1
See the section. Explanation of Test Levels
2
UI = unit interval.
AD9387NK
Rev. 0 | Page 4 of 8
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Digital Inputs −0.3 V to +5 V
Digital Output Current 20 mA
Operating Temperature Range −40°C to +100°C
Storage Temperature Range −65°C to +150°C
Maximum Junction Temperature 150°C
Maximum Case Temperature 150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
EXPLANATION OF TEST LEVELS
I. 100% production tested.
II. 100% production tested at 25°C and sample tested at
specified temperatures.
III. Sample tested only.
IV. Parameter is guaranteed by design and characterization
testing.
V. Parameter is a typical value only.
VI. 100% production tested at 25°C; guaranteed by design
and characterization testing.
VII. Limits defined by HDMI specification; guaranteed by
design and characterization testing.
VIII. Guaranteed by design.
ESD CAUTION
AD9387NK
Rev. 0 | Page 5 of 8
APPLICATIONS INFORMATION
DESIGN RESOURCES
The following resources, as well as evaluation kits,
reference design schematics, and other support
documentation, are available after signing an NDA
available from flatpanel_apps@analog.com. Users can
access a programming guide, a hardware user guide, a
software driver user guide, and software driver source
code after signing an NDA.
Other references include the following:
EIA/CEA-861, a technical specifications document, describes
audio and video InfoFrames, as well as the E-EDID structure for
HDMI. It is available from the Consumer Electronics
Association (CEA).
HDMI v.1.3, a defining document for HDMI v.1.3, and the
HDMI Compliance Test Specification v.1.3 are available from
HDMI Licensing, LLC.
HDCP Specification v.1.3, the defining technical specifications
document for the HDCP v.1.3, is available from Digital Content
Protection, LLC.
DOCUMENT CONVENTIONS
In this data sheet, data is represented using the conventions
described in Table 3.
Table 3. Document Conventions
Data
Type Format
0xNN
Hexadecimal (Base 16) numbers are represented using
the C language notation, preceded by 0x.
0bNN
Binary (Base 2) numbers are represented using the C
language notation, preceded by 0b.
NN
Decimal (Base 10) numbers are represented using no
additional prefixes or suffixes.
Bit
Bits are numbered in little endian format; that is, the
least significant bit of a byte or word is referred to as Bit 0.
P1-P3P4-P6P7-P9

AD9387NKBBCZRL-80

Mfr. #:
Buy AD9387NKBBCZRL-80
Manufacturer:
Analog Devices Inc.
Description:
IC TRANSMITTER HDMI/DVI 76CSPBGA
Lifecycle:
New from this manufacturer.
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