MMA2204D

Sensors
4 Freescale Semiconductor
MMA2204
PRINCIPLE OF OPERATION
The Freescale accelerometer is a surface-micromachined
integrated-circuit accelerometer.
The device consists of a surface micromachined
capacitive sensing cell (g-cell) and a CMOS signal
conditioning ASIC contained in a single integrated circuit
package. The sensing element is sealed hermetically at the
wafer level using a bulk micromachined “cap'' wafer.
The g-cell is a mechanical structure formed from
semiconductor materials (polysilicon) using semiconductor
processes (masking and etching). It can be modeled as a set
of beams attached to a movable central mass that move
between fixed beans. The movable beams can be deflected
from their rest position by subjecting the system to an
acceleration (Figure 3).
When the beams attached to the center mass move, the
distance from them to the fixed beams on one side will
increase by the same amount that the distance to the fixed
beams on the other side decreases. The change in distance
is a measure of acceleration.
The g-cell beams form two back-to-back capacitors
(Figure 4). As the center plate moves with acceleration, the
distance between the beams change and each capacitor's
value will change, (C = NAε/D). Where A is the area of the
facing side of the beam, ε is the dielectric constant, and D is
the distance between the beams, and N is the number of
beams.
The CMOS ASIC uses switched capacitor techniques to
measure the g-cell capacitors and extract the acceleration
data from the difference between the two capacitors. The
ASIC also signal conditions and filters (switched capacitor)
the signal, providing a high level output voltage that is
ratiometric and proportional to acceleration.
SPECIAL FEATURES
Filtering
The Freescale accelerometers contain an onboard 4-pole
switched capacitor filter. A Bessel implementation is used
because it provides a maximally flat delay response (linear
phase) thus preserving pulse shape integrity. Because the
filter is realized using switched capacitor techniques, there is
no requirement for external passive components (resistors
and capacitors) to set the cut-off frequency.
Self-Test
The sensor provides a self-test feature that allows the
verification of the mechanical and electrical integrity of the
accelerometer at any time before or after installation. This
feature is critical in applications such as automotive airbag
systems where system integrity must be ensured over the life
of the vehicle. A fourth “plate'' is used in the g-cell as a self-
test plate. When the user applies a logic high input to the self-
test pin, a calibrated potential is applied across the self-test
plate and the moveable plate. The resulting electrostatic
force (Fe =
1
/
2
AV
2
/d
2
) causes the center plate to deflect. The
resultant deflection is measured by the accelerometer's
control ASIC and a proportional output voltage results. This
procedure assures that both the mechanical (g-cell) and
electronic sections of the accelerometer are functioning.
Ratiometricity
Ratiometricity simply means that the output offset voltage
and sensitivity will scale linearly with applied supply voltage.
That is, as you increase supply voltage the sensitivity and
offset increase linearly; as supply voltage decreases, offset
and sensitivity decrease linearly. This is a key feature when
interfacing to a microcontroller or an A/D converter because
it provides system level cancellation of supply induced errors
in the analog to digital conversion process.
Status
Freescale accelerometers include fault detection circuitry
and a fault latch. The Status pin is an output from the fault
latch, OR'd with self-test, and is set high whenever one (or
more) of the following events occur:
Supply voltage falls below the Low Voltage Detect (LVD)
voltage threshold
Clock oscillator falls below the clock monitor
minimum frequency
Parity of the EPROM bits becomes odd in number.
The fault latch can be reset by a falling edge on the self-
test input pin, unless one (or more) of the fault conditions
continues to exist.
Acceleration
Figure 3. Transducer
Physical Model
Figure 4. Equivalent
Circuit Model
Sensors
Freescale Semiconductor 5
MMA2204
BASIC CONNECTIONS
Pinout Description
Figure 5. SOIC Accelerometer with Recommended
Connection Diagram
PCB Layout
Figure 6. Recommended PCB Layout for Interfacing
Accelerometer to Microcontroller
NOTES:
1. Use a 0.1 µF capacitor on V
DD
to decouple the power
source.
2. Physical coupling distance of the accelerometer to the
microcontroller should be minimal.
3. Place a ground plane beneath the accelerometer to
reduce noise, the ground plane should be attached to
all of the open ended terminals shown in Figure 6.
4. Use an RC filter of 1 k and 0.01 µF on the output of
the accelerometer to minimize clock noise (from the
switched capacitor filter circuit).
5. PCB layout of power and ground should not couple
power supply noise.
6. Accelerometer and microcontroller should not be a
high current path.
7. A/D sampling rate and any external power supply
switching frequency should be selected such that they
do not interfere with the internal accelerometer
sampling frequency. This will prevent aliasing errors.
Table 3. Pin Descriptions
Pin No. Pin Name Description
1 thru 3 No internal connection. Leave
unconnected.
4 ST Logic input pin used to initiate
self-test.
5 V
OUT
Output voltage of the
accelerometer.
6 STATUS Logic output pin to indicate fault.
7 V
SS
The power supply ground.
8 V
DD
The power supply input.
9 thru 13 Trim pins Used for factory trim. Leave
unconnected.
14 thru 16 No internal connection. Leave
unconnected.
N/C
N/C
N/C
ST
V
OUT
STATUS
V
SS
V
DD
N/C
N/C
N/C
N/C
N/C
N/C
N/C
N/C
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
MMA2204D
ST
V
OUT
Output
Signal
R1
1 k
5
C2
0.01 µF
4
7
Logic
Input
V
DD
C1
0.1 µF
6
STATUS
8
V
DD
V
SS
P0
A/D In
V
RH
V
SS
V
DD
ST
V
OUT
V
SS
V
DD
0.01 µF1 k
0.1 µF
0.1 µF
Power Supply
0.1 µF
P1STATUS
Microcontroller
Accelerometer
C
C
C
R
C
Sensors
6 Freescale Semiconductor
MMA2204
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
x
Direction of Earth’s gravity field
(1)
1. When positioned as shown, the Earth’s gravity will result in a positive 1g output.
87654321
9 10111213141516
+x
16-Pin SOIC Package
N/C pins are recommended to be left FLOATING
Front View Side View
Top View
Acceleration of the package in the
+X direction (center plate moves in
the X direction) will result in an
increase in the output.
Dynamic Acceleration Sensing Direction
Static Acceleration Sensing Direction
Activation of Self Test moves the
center plate in the X direction,
resulting in an increase in the
output.

MMA2204D

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
ACCEL 112.5G ANALOG 16SOIC
Lifecycle:
New from this manufacturer.
Delivery:
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