DLW32SH510XK2L Datasheet DLW32SH110XK2L, DLW32SH510XK2L, DLW32SH101XK2L | P1-P3

Spec. No. JEFL243C-9119-01 P1/9

Reference Only

1.Scope

This reference specification applies to Wire Wound Chip Common Mode Choke Coil DLW32SH_XK Series

for Automotive Electronics based on AEC-Q200.

2.Part Numbering

(ex) DL W 32 S H 101 X K 2 L

(1) (2) (3) (4) (5) (6) (7) (8) (9) (10)

(1)

Product ID (6) Inductance(Typ. at 0.1MHz)

(2) Structure (7) Circuit

(3) Dimension Type(LxW) (8) Features

(4) Type (9) Number of line

(5) Category (10) Packing code L : Taping(φ180mm), *B:Bulk

*Bulk packing also available. (A product is put in the plastic bag under the taping conditions.)

3.Rating

Customer

Part Number

Murata

Part Number

Common Mode

Inductance

(

at 0.1MHz

Under Standard

Testing Condition)

Rated

Voltage

V(DC)

Withstanding

Voltage

V(DC)

Rated

Current

(mA)

Resistance

(Ω max.)

Insulation

Resistance

(MΩ min.)

ESD

Rank

5B:15kV

DLW32SH110XK2L

11uH (-30%/+50%)

80 200 300 0.4 10 5B

DLW32SH110XK2B

11uH (-30%/+50%)

80 200 300 0.4 10 5B

DLW32SH220XK2L

22uH (-30%/+50%)

80 200 250 0.5 10 5B

DLW32SH220XK2B

22uH (-30%/+50%)

80 200 250 0.5 10 5B

DLW32SH510XK2L

51uH (-30%/+50%)

80 200 200 0.7 10 5B

DLW32SH510XK2B

51uH (-30%/+50%)

80 200 200 0.7 10 5B

DLW32SH101XK2L

100uH (-30%/+50%)

80 200 150 1.5 10 5B

DLW32SH101XK2B

100uH (-30%/+50%)

80 200 150 1.5 10 5B

・Operating Temperature Range. –40°C to +125°C ・Storage Temperature Range. –40°C to +125°C

4. Testing Conditions

《Unless otherwise specified》《In case of doubt》

Temperature : Ordinary Temperature / 15°C to 35°C

Temperature : 20°C ± 2°C

Humidity

: Ordinary Humidity / 25%(RH) to 85 %(RH) Humidity : 60%(RH) to 70 %(RH)

Atmospheric Pressure : 86kPa to 106 kPa

5. Appearance and Dimensions

■ Equivalent Circuits

■ Unit Mass (Typical value)

0.072g

6. Marking

No Marking.

Wire Wound Chip Common Mode Choke Coil

DLW32SH□□□XK2□ Murata Standard Reference Specification 【AEC-Q200】

(1)

(4)

(2)

(3)

No polarity

Spec. No. JEFL243C-9119-01 P2/9

Reference Only

7. Electrical Performance

No. Item Specification Test Method

7.1 Common Mode

Inductance (Lc)

Meet item 3. Measuring Equipment : KEYSIGHT 4294A or the equivalent

Measuring Frequency:0.1MHz (ref.item 9.1)

7.2 Insulation

Resistance (I.R.)

Measuring voltage : Rated Voltage

Measuring time : 1 min max. (ref.item 9.3)

7.3 Withstanding

Voltage

Products shall not be damaged. Test Voltage : 2.5 times for Rated Voltage

Time : 1 to 5 s

Charge Current : 1 mA max. (ref.item 9.2)

7.4 DC Resistance

(Rdc)

Meet item 3. Measuring current : 10mA max.

(In case of doubt in the above mentioned standard condition,

measure by 4 terminal method.) (ref.item 9.4)

8. Q200 Requirement

8-1. Performance

AEC-Q200 Rev.D issued June 1. 2010

AEC-Q200

Murata Specification / Deviation

No.

Stress Test Method

High Temperature

Exposure

1000h at 125 deg C

Set for 24h at room temperature,

then measured.

Meet Table A after testing.

Table A

4 Temperature Cycling 1000cycles

-40 deg C to +125 deg C

Set for 24h at room temperature,

then measured.

Meet Table A after testing.

5 Destructive

Physical Analysis

Per EIA469

No electrical tests

Not Applicable

7 Biased Humidity 1000h at 85 deg C, 85%RH

Apply rated current

Meet Table A after testing.

(ref.item 9.5)

8 Operational Life 1000h at 125 deg C

pply rated current

Set for 24h at room temperature,

then measured

Meet Table A after testing.

(ref.item 9.6)

9 External Visual

Visual inspection

No abnormalities

10 Physical Dimension Meet ITEM 4

（Style and Dimensions）

No defects

12 Resistance to Solvents Per MIL-STD-202 Method 215 Not Applicable

13 Mechanical Shock

Per MIL-STD-202 Method 213

Conditon F:

1500g’s(14.7N)/0.5ms/Half sine

Meet Table A after testing.

14 Vibration 5g's(0.049N) for 20 min,

12cycles each of 3 oritentations

Test from 10-2000Hz.

Meet Table A after testing.

15 Resistance

to Soldering Heat

No-heating

Solder temperature

260C+/-5 deg C

Immersion time 10s

Pre-heating:150 to 180C / 90±30s

Meet Table A after testing.

Appearance No damaged

Common Mode

Inductance Change

(at 0.1MHz)

Within ±20%

Spec. No. JEFL243C-9119-01 P3/9

Reference Only

AEC-Q200

Murata Specification / Deviation

No.

Stress Test Method

17 ESD

Per AEC-Q200-002

Meet Table A after testing.

ESD Rank: Refer to Item 3. Rating.

18 Solderbility

Per J-STD-002

Method b : Not Applicable

95% of the terminations is to be soldered.(except partly-exposed wire)

Flux:Ethanol solution of rosin,25(wt)% includes activator equivalent to 0.06

to 0.10(wt)% chlorine

19 Electrical

Characterization

Measured :

Common mode Inductance

No defects

20 Flammability Per UL-94

Not Applicable

21 Board Flex Epoxy-PCB(1.6mm)

Deflection 2mm(min)

60 s minimum holding time

Meet Table A after testing.

22 Terminal Strength

Per AEC-Q200-006

A force of 17.7N for 60s

No defects

30 Electrical Transient

Conduction

Per ISO-7637-2

Not Applicable

9. Terminal to be Tested.

When measuring and supplying the voltage, the following terminal is applied.

No. Item Terminal to be Tested

9.1 Common Mode Inductance

(Measurement Terminal)

9.2 Withstanding Voltage

(Measurement Terminal)

9.3 Insulation Resistance

(Measurement Terminal)

9.4 DC Resistance

(Measurement Terminal)

9.5 Biased Humidity

(Supply Terminal)

9.6 Operational Life

(Supply Terminal)

10. P.C.B., Flux, Solder and Soldering condition

Test shall be done using P.C.B., Flux, Solder and Soldering condition which are

specified in item 13 except the case of being specified special condition.

Terminal

P1-P3 P4-P6 P7-P9

DLW32SH510XK2L

Mfr. #:

Buy DLW32SH510XK2L

Manufacturer:

Murata Electronics

Description:

Common Mode Chokes / Filters 1210 80VDC 51uH 200mA AEC-Q200

Lifecycle:

New from this manufacturer.

Delivery:

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Payment:

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DLW32SH510XK2L

DLW32SH510XK2L

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