84330-02 Data Sheet
©2016 Integrated Device Technology, Inc Revision B May 26, 201610
The schematic of the 84330-02 layout example used in
this layout guideline is shown in Figure 6A. The 84330-02
recommended PCB board layout for this example is shown
in Figure 6B. This layout example is used as a general
LAYOUT GUIDELINE
FIGURE 6A. SCHEMATIC OF RECOMMENDED LAYOUT
guideline. The layout in the actual system will depend on the
selected component types, the density of the components, the
density of the traces, and the stack up of the P.C. board.
M8
N1
M3
N2
U1
ICS84330-02
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
27
26
25
24
23
22
21
28
VCCA
FREF_EXT
XTAL_SEL
X_I N
X_OUT
OE
nP_LOAD
M0
M1
M2
M3
M4
M5
M6
M7
M8
N0
N1
VEE
TEST
S_DATA
S_CLOCK
VCC
FOUT
nFOUT
VEE
VCC
S_LOAD
Zo = 50 Ohm
RD1
1K
Fout = 200 MHz
RU7
1K
VCC
M1
M4
RU1
SP
OE
M8
C16
10u
N0
RD0
1K
M1
RD10
SP
RD12
SP
RU9
SP
M5
RU8
1K
R2
50
VCC
C1
SP
C3
0.1uF
M7
C4
0.1u
RD7
SP
VCC
RD6
1K
nPLOAD
SP = Space (i.e. not intstalled)
M6
C11
0.01u
VCCA
M0
RD8
SP
N[1:0] =00 (Divide by 2)
M0
R7
10
RU0
SP
RD9
1K
M[8:0]= 110010000 (400)
+
-
Zo = 50 Ohm
M7
M2
R3
50
R1
50
X1
16MHz, 18pF
OE
RU11
SP
C2
SP
N1
RU12
1K
nPLoad
VCC=3.3V
RU10
1K
84330-02 Data Sheet
©2016 Integrated Device Technology, Inc Revision B May 26, 201611
FIGURE 6B. PCB BOARD LAYOUT FOR 84330-02
The following component footprints are used in this layout
example:
All the resistors and capacitors are size 0603.
POWER AND GROUNDING
Place the decoupling capacitors C3 and C4, as close as
possible to the power pins. If space allows, placement of the
decoupling capacitor on the component side is preferred. This
can reduce unwanted inductance between the decoupling
capacitor and the power pin caused by the via.
Maximize the power and ground pad sizes and number of vias
capacitors. This can reduce the inductance between the power
and ground planes and the component power and ground pins.
The RC fi lter consisting of R7, C11, and C16 should be placed
as close to the V
CCA
pin as possible.
CLOCK TRACES AND TERMINATION
Poor signal integrity can degrade the system performance or
cause system failure. In synchronous high-speed digital sys-
tems, the clock signal is less tolerant to poor signal integrity
than other signals. Any ringing on the rising or falling edge or
excessive ring back can cause system failure. The shape of the
trace and the trace delay might be restricted by the available
space on the board and the component location. While routing
the traces, the clock signal traces should be routed fi rst and
should be locked prior to routing other signal traces.
The differential 50Ω output traces should have the
same length.
Avoid sharp angles on the clock trace. Sharp angle turns
cause the characteristic impedance to change on the
transmission lines.
Keep the clock traces on the same layer. Whenever pos-
sible, avoid placing vias on the clock traces. Placement
of vias on the traces can affect the trace characteristic
impedance and hence degrade signal integrity.
To prevent cross talk, avoid routing other signal traces
in parallel with the clock traces. If running parallel traces
is unavoidable, allow a separation of at least three trace
widths between the differential clock trace and the other
signal trace.
Make sure no other signal traces are routed between
the clock trace pair.
The matching termination resistors should be located as
close to the receiver input pins as possible.
CRYSTAL
The crystal X1 should be located as close as possible to the
pins 4 (XTAL_IN) and 5 (XTAL_OUT). The trace length between
the X1 and U1 should be kept to a minimum to avoid unwanted
parasitic inductance and capacitance. Other signal traces should
not be routed near the crystal traces.
84330-02 Data Sheet
©2016 Integrated Device Technology, Inc Revision B May 26, 201612
If the FREF_EXT input is driven by a 3.3V LVCMOS driver, the
jitter performance can be improved by reducing the amplitude
swing and slowing down the edge rate. Figure 7A shows an
amplitude reduction approach for a long trace. The swing will
be approximately 0.85V for logic low and 2.5V for logic high
R2
100
VDD
R1
100
Ro ~ 7 Ohm
Driver_LVCMOS
Zo = 50 Ohm
Td
RS
43
VDD
VDD
GND
TEST_CLK
VDD
VDD
GND
TEST_CLK
R1
200
RS
100
Ro ~ 7 Ohm
Driver_LVCMOS
R2
200
VDD
VDD
VDD
R1
400
R2
400
Ro ~ 7 Ohm
Driver_LVCMOS
RS
200
VDD
GND
TEST_CLK
JITTER REDUCTION FOR FREF_EXT SINGLE END INPUT
(instead of 0V to 3.3V). Figure 7B shows amplitude reduction
approach for a short trace. The circuit shown in Figure 7C
reduces amplitude swing and also slows down the edge rate
by increasing the resistor value.
FIGURE 7C. EDGE RATE REDUCTION BY INCREASING THE RESISTOR VALUE
FIGURE 7A. AMPLITUDE REDUCTION FOR A LONG TRACE
FIGURE 7B. AMPLITUDE REDUCTION FOR A SHORT TRACE
FREF_EXT
FREF_EXT
FREF_EXT

84330AV-02LFT

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Manufacturer:
Description:
Clock Synthesizer / Jitter Cleaner 1 LVPECL OUT SYNTHESIZER
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