LTC2271
18
2271f
The digital output is randomized by applying an exclusive
OR logic operation between the LSB and all other data
output bits. To decode, the reverse operation is applied—an
exclusive OR operation is applied between the LSB and all
other bits. The FR and DCO outputs are not affected. The
output randomizer is enabled by serially programming
mode control register A1.
Digital Output Test Pattern
To allow in-circuit testing of the digital interface to the
A/D, there is a test mode that forces the A/D data outputs
(D15-D0) of both channels to known values. The digital
output test patterns are enabled by serially programming
mode control registers A2, A3 and A4. When enabled,
the test patterns override all other formatting modes: 2’s
complement and randomizer.
Output Disable
The digital outputs may be disabled by serially program-
ming mode control register A2. The current drive for all
digital outputs including DCO and FR are disabled to save
power or enable in-circuit testing. When disabled the com-
mon mode of each output pair becomes high impedance,
but the differential impedance may remain low.
Sleep and Nap Modes
The A/D may be placed in sleep or nap modes to conserve
power. In sleep mode the entire device is powered down,
resulting in 1mW power consumption. Sleep mode is
enabled by mode control register A1 (serial program-
ming mode), or by SDI (parallel programming mode).
The amount of time required to recover from sleep mode
depends on the size of the bypass capacitors on V
REF
,
REFH and REFL. For the suggested values in Figure 8, the
A/D will stabilize after 2ms.
In nap mode any combination of A/D channels can be
powered down while the internal reference circuits and the
PLL stay active, allowing faster wake up than from sleep
mode. Recovering from nap mode requires at least 100
clock cycles. If the application demands very accurate DC
settling then an additional 50µs should be allowed so the
on-chip references can settle from the slight temperature
shift caused by the change in supply current as the A/D
leaves nap mode. Nap mode is enabled by mode control
register A1 in the serial programming mode.
DEVICE PROGRAMMING MODES
The operating modes of the LTC2271 can be programmed
by either a parallel interface or a simple serial interface.
The serial interface has more fl exibility and can program
all available modes. The parallel interface is more limited
and can only program some of the more commonly used
modes.
Parallel Programming Mode
To use the parallel programming mode, PAR/SER should
be tied to V
DD
. The CS, SCK, SDI and SDO pins are binary
logic inputs that set certain operating modes. These pins
can be tied to V
DD
or ground, or driven by 1.8V, 2.5V or
3.3V CMOS logic. When used as an input, SDO should
be driven through a 1k series resistor. Table 3 shows the
modes set by CS, SCK, SDI and SDO.
Table 3. Parallel Programming Mode Control Bits (PAR/SER = V
DD
)
PIN DESCRIPTION
CS/SCK 2-Lane/4-Lane/1-Lane Selection Bits
00 = 2-Lane Output Mode
01 = 4-Lane Output Mode
10 = 1-Lane Output Mode
11 = Not Used
SDI Power Down Control Bit
0 = Normal Operation
1 = Sleep Mode
SDO LVDS Current Selection Bit
0 = 3.5mA LVDS Current Mode
1 = 1.75mA LVDS Current Mode
Serial Programming Mode
To use the serial programming mode, PAR/SER should be
tied to ground. The CS, SCK, SDI and SDO pins become
a serial interface that program the A/D mode control
registers. Data is written to a register with a 16-bit serial
word. Data can also be read back from a register to verify
its contents.
Serial data transfer starts when CS is taken low. The data
on the SDI pin is latched at the fi rst 16 rising edges of
SCK. Any SCK rising edges after the fi rst 16 are ignored.
The data transfer ends when CS is taken high again.
APPLICATIONS INFORMATION