NXP Semiconductors
NT4H1321
NTAG 413 DNA Secure Unique NFC Message for direct access to web services
NT4H1321_SDS All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Product short data sheet Rev. 3.2 — 12 October 2017
COMPANY PUBLIC 400232 4 / 16
2.3.3.2 NFC Counter
A 3-byte up counter is incremented only once per each session when the NDEF file is
read. This counter value can be optionally mirrored in plain into the NDEF message.
Counter value can be read out encrypted after authentication by using the assigned
application key as well.
2.3.3.3 CMAC
The 8-byte CMAC can be optionally mirrored into the NDEF message. CMAC is
calculated on the defined message length. It is possible to consider only the UID and/or
the NFC Counter for CMAC calculation.
2.3.4 Mutual authentication
NTAG 413 DNA offers 3-pass mutual authentication based on challenge response
protocol with the application key. This mutual authentication enables the authentication of
the tag and host ( who knows the keys) simultaneously.
2.3.5 ECC signature
NTAG 413 DNA offers a static ECC signature calculated on the UID of the chip. This
ECC signature can be used to verify the tag's genuineness using the public key provided
by NXP [8].
2.3.6 Ultimate product authentication
NTAG 413 DNA features can be integrated to design a robust product authentication.
Concatenating of the multiple features e.g. ECC signature, history based UID tracking,
SUN and 3-pass mutual authentication to design enhanced reliability in product
authentication.
2.3.7 Customization from fab
NXP offers commercially the customization of the chip content (securely key injection
known as trust provisioning, personalization of NDEF message and file settings). Refer to
[13] for detail.
3 Applications
NTAG 413 DNA has been designed to fit in many NFC tagging applications, particularly
where security is required. Several applications (but not limited) are mentioned below:
Web-based product authentication without any application installed in NFC reader
device
In general product authentication with application installed in NFC reader device
Access management (logical & Physical)
Electronic voucher
Gaming
Consumer interaction
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NXP Semiconductors
NT4H1321
NTAG 413 DNA Secure Unique NFC Message for direct access to web services
NT4H1321_SDS All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Product short data sheet Rev. 3.2 — 12 October 2017
COMPANY PUBLIC 400232 5 / 16
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Dynamic credential for web log-in
Document authenticity
4 Quick reference data
Table 1. Quick reference data
[1]
[2]
Symbol Parameter Conditions Min Typ Max Unit
C
i
input
capacitance
[3]
[4]
66.5 70 73.5 pF
f
i
input frequency - 13.56 - MHz
EEPROM characteristics
t
ret
retention time T
amb
= 22 °C 50 - - year
N
endu
(W) write endurance T
amb
= 22 °C 200000 500 000 - cycle
t
cy
(W) write cycle time T
amb
= 22 °C - 1 - ms
[1] Stresses above one or more of the values may cause permanent damage to the device.
[2] Exposure to limiting values for extended periods may affect device reliability.
[3] Measured with LCR meter.
[4] T
amb
= 22 °C; f
i
= 13.56 MHz; 2 V RMS
5 Ordering information
Table 2. Ordering information
PackagePart number
Name Description Version
NT4H1321G0DUF/xxyy FFC Bump 8 inch wafer, 75 um thickness, on film frame carrier, electronic
fail die marking according to SECS-II format), Au bumps, 160
bytes user memory, 70pF input capacitance
-
NT4H1321G0DUD/xxyy FFC Bump 8 inch wafer, 120 um thickness, on film frame carrier, electronic
fail die marking according to SECS-II format), Au bumps, 160
bytes user memory, 70pF input capacitance
-
xx = fabkey, yy = version
NXP Semiconductors
NT4H1321
NTAG 413 DNA Secure Unique NFC Message for direct access to web services
NT4H1321_SDS All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Product short data sheet Rev. 3.2 — 12 October 2017
COMPANY PUBLIC 400232 6 / 16
6 Block diagram
VOLTAGE
SENSORS
ACTIVE
SHIELDING,RAIL
SENSORS
PORLA
LB
RECTIFIER,
MODULATOR
SUSPENSION
TIME, TEMP
SENSOR
LIGHT
GLITCH
SENSOR
OSCILLATOR
ANALOG
ROM
RAMMMU
data
bus
CPU
EEPROM
DEMODULATOR
VOLTAGE
REGULATOR
ISO14443
CIU
CRC
16/32
TRNG
AES
128
CLOCK
GENERATION
CLOCK FILTER
aaa-026095
NTAG413 DNA
Figure 2. NTAG 413 DNA block diagram
7 Limiting values
Table 3. Limiting values
[1]
[2]
Symbol Parameter Conditions Min Max Unit
I
i
input current 50 - mA
P
tot/pack
total power dissipation per
package
200 - mW
T
stg
storage temperature -55 125 °C
T
amb
ambient temperature -25 70 °C
V
ESD
electrostatic discharge
voltage
[3]
- 2 kV
[1] Stresses above one or more of the values may cause permanent damage to the device.
[2] Exposure to limiting values for extended periods may affect device reliability.
[3] MIL Standard 883-C method 3015; human body model: C = 100 pF, R = 1.5 kΩ.

NT4H1321G0DUD/062V

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
RFID Transponders CLHW
Lifecycle:
New from this manufacturer.
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