ADG1419 Data Sheet
Rev. A | Page 6 of 16
Parameter 25°C −40°C to +85°C −40°C to +125°C Unit Test Conditions/Comments
DYNAMIC CHARACTERISTICS
1
Transition Time, t
TRANSITION
310 ns typ R
L
= 300 Ω, C
L
= 35 pF
410 495 560 ns max V
S
= 3 V; see Figure 25
t
ON
(EN) 230 ns typ R
L
= 300 Ω, C
L
= 35 pF
305 355 390 ns max V
S
= 3 V; see Figure 27
t
OFF
(EN) 220 ns typ R
L
= 300 Ω, C
L
= 35 pF
290 335 365 ns max V
S
= 3 V; see Figure 27
Break-Before-Make Time Delay, t
D
65 ns typ R
L
= 300 Ω, C
L
= 35 pF
31 ns min V
S1
= V
S2
= 3 V; see Figure 26
Charge Injection 59 pC typ
V
S
= 0 V, R
S
= 0 Ω, C
L
= 1 nF; see
Figure 28
Off Isolation −60 dB typ
R
L
= 50 Ω, C
L
= 5 pF, f = 1 MHz;
see Figure 29
Channel-to-Channel Crosstalk −60 dB typ
R
L
= 50 Ω, C
L
= 5 pF, f = 1 MHz;
see Figure 30
Total Harmonic Distortion Plus
Noise
0.04 % typ
R
L
= 10 kΩ, 5 V p-p, f = 20 Hz to 20 kHz;
see Figure 32
−3 dB Bandwidth 105 MHz typ R
L
= 50 Ω, C
L
= 5 pF; see Figure 31
Insertion Loss 0.28 dB typ
R
L
= 50 Ω, C
L
= 5 pF, f = 1 MHz;
see Figure 31
C
S
(Off) 26 pF typ V
S
= 0 V, f = 1 MHz
C
D
(Off) 62 pF typ V
S
= 0 V, f = 1 MHz
C
D
, C
S
(On) 128 pF typ V
S
= 0 V, f = 1 MHz
POWER REQUIREMENTS V
DD
= +5.5 V, V
SS
= −5.5 V
I
DD
0.001 μA typ Digital inputs = 0 V or V
DD
1.0 μA max
I
SS
0.001 μA typ Digital inputs = 0 V or V
DD
1.0 μA max
V
DD
/V
SS
±4.5/±16.5 V min/max Ground = 0 V
1
Guaranteed by design, not subject to production test.
CONTINUOUS CURRENT PER CHANNEL, S OR D
Table 4.
Parameter 25°C 85°C 125°C Unit Test Conditions/Comments
CONTINUOUS CURRENT PER CHANNEL
1
±15 V Dual Supply V
DD
= +13.5 V, V
SS
= −13.5 V
8-Lead MSOP (θ
JA
= 206°C/W) 215 135 80 mA maximum
8-Lead LFCSP (θ
JA
= 50.8°C/W) 390 215 100 mA maximum
+12 V Single Supply V
DD
= 10.8 V, V
SS
= 0 V
8-Lead MSOP (θ
JA
= 206°C/W) 175 115 70 mA maximum
8-Lead LFCSP (θ
JA
= 50.8°C/W) 320 185 95 mA maximum
±5 V Dual Supply V
DD
= +4.5 V, V
SS
= −4.5 V
8-Lead MSOP (θ
JA
= 206°C/W) 165 110 70 mA maximum
8-Lead LFCSP (θ
JA
= 50.8°C/W) 310 180 95 mA maximum
1
Guaranteed by design, not subject to production test.