7©2015 Integrated Device Technology, Inc December 7, 2015
87972I-147 Datasheet
Absolute Maximum Ratings
NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device.
These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect product reliability.
DC Electrical Characteristics
Table 4A. Power Supply DC Characteristics, V
DD
= V
DDA
= V
DDO
= 3.3V ± 5%, T
A
= -40°C to 85°C
Table 4B. LVCMOS/LVTTL DC Characteristics, V
DD
= V
DDA
= V
DDO
= 3.3V ± 5%, T
A
= -40°C to 85°C
NOTE 1: Outputs terminated with 50 to V
DDO
/2. See Parameter Measurement Information section. Load Test Circuit diagram.
Item Rating
Supply Voltage, V
DD
4.6V
Inputs, V
I
-0.5V to V
DD
+ 0.5V
Outputs, V
O
-0.5V to V
DDO
+ 0.5V
Package Thermal Impedance,
JA
42.3C/W (0 lfpm)
Storage Temperature, T
STG
-65C to 150C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
DD
Core Supply Voltage 3.135 3.3 3.465 V
V
DDA
Analog Supply Voltage 3.135 3.3 3.465 V
V
DDO
Output Supply Voltage 3.135 3.3 3.465 V
I
DD
Power Supply Current 250 mA
I
DDA
Analog Supply Current 20 mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input High Voltage 2 V
DD
+ 0.3 V
V
IL
Input Low Voltage
VCO_SEL, PLL_SEL,
REF_SEL, CLK_SEL,
EXT_FB, FSEL_FB[0:2],
FSEL_A[0:1], FSEL_B[0:1],
FSEL_C[0:1], FRZ_DATA
-0.3 0.8 V
CLK0, CLK1,
INV_CLK, FRZ_CLK
-0.3 1.3 V
I
IN
Input Current ±120 µA
V
OH
Output High Voltage; NOTE 1 I
OH
= -20mA 2.4 V
V
OL
Output Low Voltage; NOTE 1 I
OL
= 20mA 0.5 V
8©2015 Integrated Device Technology, Inc December 7, 2015
87972I-147 Datasheet
Table 5. Input Frequency Characteristics, V
DD
= V
DDA
= V
DDO
= 3.3V ± 5%, T
A
= -40°C to 85°C
NOTE 1: Input frequency depends on the feedback divide ratio to ensure "clock * feedback divide" is in the VCO range of 240MHz to
500MHz.
Table 6. Crystal Characteristics
AC Electrical Characteristics
Table 7. AC Characteristics, V
DD
= V
DDA
= V
DDO
= 3.3V ± 5%, T
A
= -40°C to 85°C
NOTE 1: Defined as the time difference between the input reference clock and the average feedback input signal when the PLL is locked
and the input reference frequency is stable.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DDO
/2.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: These parameters are guaranteed by characterization. Not tested in production.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
F
IN
Input Frequency
CLK0, CLK1; NOTE 1 150 MHz
XTAL1, XTAL 12 40 MHz
FRZ_CLK 20 MHz
Parameter Test Conditions Minimum Typical Maximum Units
Mode of Oscillation Fundamental
Frequency 12 40 MHz
Equivalent Series Resistance (ESR) 50
Shunt Capacitance 7pF
Parameter Symbol Test Conditions Minimum Typical Maximum Units
f
MAX
Output Frequency
÷2 150 MHz
÷4 125 MHz
÷6 83.33 MHz
÷8 62.5 MHz
t(Ø)
Static Phase
Offset; NOTE 1
CLK0
QFB ÷ 8,
In Frequency = 50MHz
-10 145 300 ps
CLK1 -65 90 245 ps
tsk(o) Output Skew; NOTE 2, 3 200 ps
tjit(cc) Cycle-to-Cycle Jitter; NOTE 3 All Banks ÷ 4 55 ps
f
VCO
PLL VCO Lock Range 240 500 MHz
t
LOCK
PLL Lock Time; NOTE 4 10 ms
t
R
/ t
F
Output Rise/Fall Time 0.8V to 2V 0.15 0.7 ns
odc Output Duty Cycle 45 55 %
t
PZL,
t
PZH
Output Enable Time; NOTE 4 10 ns
t
PLZL,
t
PHZ
Output Disable Time; NOTE 4 8 ns
9©2015 Integrated Device Technology, Inc December 7, 2015
87972I-147 Datasheet
Parameter Measurement Information
3.3V Core/3.3V LVCMOS Output Load AC Test Circuit
Cycle-to-Cycle Jitter
Static Phase Offset
Output Skew
Output Duty Cycle/Pulse Width Period
Output Rise/Fall Time
SCOPE
Qx
GND
V
DD,
1.65V±5%
-1.65V±5%
V
DDO
V
DDA,
V
DDO
2
V
DDO
2
V
DDO
2
t
cycle n
t
cycle n+1
t
jit(cc) =
|
t
cycle n –
t
cycle n+1
|
1000 Cycles
QA[0:3],
QB[0:3],
QC[0:3],
QSYNC,
QFB
t(Ø)
V
DD
2
V
DD
2
t(Ø) mean = Static Phase Offset
Where t(Ø) is any random sample, and t(Ø) mean is the
average of the sampled cycles measured on controlled edges
CLK0,
CLK1
EXT_FB
t
sk(o)
Qx
Qy
t
PERIOD
t
PW
t
PERIOD
odc =
V
DDO
2
x 100%
t
PW
QA[0:3],
QB[0:3],
QC[0:3],
QSYNC,
QFB
0.8V
2V
2V
0.8V
t
R
t
F
QA[0:3],
QB[0:3],
QC[0:3],
QSYNC,
QFB

87972DYI-147LF

Mfr. #:
Manufacturer:
IDT
Description:
Clock Generators & Support Products 12 LVCMOS OUT CLOCK GENERATOR
Lifecycle:
New from this manufacturer.
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