Operation modes M48Z08, M48Z18
10/20 Doc ID 2424 Rev 8
Table 4. WRITE mode AC characteristics
2.3 Data retention mode
With valid V
CC
applied, the M48Z08/18 operates as a conventional BYTEWIDE™ static
RAM. Should the supply voltage decay, the RAM will automatically power-fail deselect, write
protecting itself when V
CC
falls within the V
PFD
(max), V
PFD
(min) window. All outputs
become high impedance, and all inputs are treated as “Don't care.
Note: A power failure during a WRITE cycle may corrupt data at the currently addressed location,
but does not jeopardize the rest of the RAM's content. At voltages below V
PFD
(min), the
user can be assured the memory will be in a write protected state, provided the V
CC
fall time
is not less than t
F
. The M48Z08/18 may respond to transient noise spikes on V
CC
that reach
into the deselect window during the time the device is sampling V
CC
. Therefore, decoupling
of the power supply lines is recommended.
When V
CC
drops below V
SO
, the control circuit switches power to the internal battery which
preserves data. The internal button cell will maintain data in the M48Z08/18 for an
accumulated period of at least 11 years when V
CC
is less than V
SO
.
As system power returns and V
CC
rises above V
SO
, the battery is disconnected, and the
power supply is switched to external V
CC
. Write protection continues until V
CC
reaches V
PFD
(min) plus t
rec
(min). E should be kept high as V
CC
rises past V
PFD
(min) to prevent
inadvertent write cycles prior to system stabilization. Normal RAM operation can resume t
rec
after V
CC
exceeds V
PFD
(max). For more information on battery storage life refer to the
application note AN1012.
Symbol Parameter
(1)
1. Valid for ambient operating temperature: T
A
= 0 to 70 °C; V
CC
= 4.75 to 5.5 V or 4.5 to 5.5 V (except where
noted).
M48Z08/M48Z18
Unit
Min Max
t
AVAV
WRITE cycle time 100 ns
t
AVWL
Address valid to WRITE enable low 0 ns
t
AVEL
Address valid to chip enable 1 low 0 ns
t
WLWH
WRITE enable pulse width 80 ns
t
ELEH
Chip enable low to chip enable 1 high 80 ns
t
WHAX
WRITE enable high to address transition 10 ns
t
EHAX
Chip enable high to address transition 10 ns
t
DVWH
Input valid to WRITE enable high 50 ns
t
DVEH
Input valid to chip enable 1 high 30 ns
t
WHDX
WRITE enable high to input transition 5 ns
t
EHDX
Chip enable high to input transition 5 ns
t
WLQZ
(2)(3)
2. C
L
= 30 pF.
3. If E
goes low simultaneously with W going low, the outputs remain in the high impedance state.
WRITE enable low to output Hi-Z 50 ns
t
AVWH
Address valid to WRITE enable high 80 ns
t
AVEH
Address valid to chip enable high 80 ns
t
WHQX
(2)(3)
WRITE enable high to output transition 10 ns
M48Z08, M48Z18 Operation modes
Doc ID 2424 Rev 8 11/20
2.4 V
CC
noise and negative going transients
I
CC
transients, including those produced by output switching, can produce voltage
fluctuations, resulting in spikes on the V
CC
bus. These transients can be reduced if
capacitors are used to store energy which stabilizes the V
CC
bus. The energy stored in the
bypass capacitors will be released as low going spikes are generated or energy will be
absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1 µF (as shown in
Figure 7) is recommended in order to provide the needed filtering.
In addition to transients that are caused by normal SRAM operation, power cycling can
generate negative voltage spikes on V
CC
that drive it to values below V
SS
by as much as
one volt. These negative spikes can cause data corruption in the SRAM while in battery
backup mode. To protect from these voltage spikes, STMicroelectronics recommends
connecting a Schottky diode from V
CC
to V
SS
(cathode connected to V
CC
, anode to V
SS
).
Schottky diode 1N5817 is recommended for through hole and MBRS120T3 is
recommended for surface mount.
Figure 7. Supply voltage protection
AI02169
V
CC
0.1µF DEVICE
V
CC
V
SS
Maximum ratings M48Z08, M48Z18
12/20 Doc ID 2424 Rev 8
3 Maximum ratings
Stressing the device above the rating listed in the absolute maximum ratings table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the operating sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
Table 5. Absolute maximum ratings
Caution: Negative undershoots below –0.3 V are not allowed on any pin while in the battery backup
mode.
Symbol Parameter Value Unit
T
A
Ambient operating temperature 0 to 70 °C
T
STG
Storage temperature (V
CC
off, oscillator off) –40 to 85 °C
T
SLD
(1)
1. Soldering temperature of the IC leads is to not exceed 260 °C for 10 seconds. Furthermore, the devices
shall not be exposed to IR reflow nor preheat cycles (as performed as part of wave soldering). ST
recommends the devices be hand-soldered or placed in sockets to avoid heat damage to the batteries.
Lead solder temperature for 10 seconds 260 °C
V
IO
Input or output voltages –0.3 to 7 V
V
CC
Supply voltage –0.3 to 7 V
I
O
Output current 20 mA
P
D
Power dissipation 1 W

M48Z08-100PC1

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
NVRAM 64K (8Kx8) 100ns
Lifecycle:
New from this manufacturer.
Delivery:
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