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Freescale Semiconductor 13
Figure 2-3 CS Reset Timing
Figure 2-4 Serial Interface Timing
INTERNAL RESET
CS
t
CSRES
SCLK
t
SCLK
t
DC
t
CDIN
SCLK
D
IN
D
OUT
t
CDOUT
DATA
VALID
CS
t
CSCLK
t
CSN
t
CHCSH
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14 Freescale Semiconductor
SECTION 3 INTERNAL MODULES
3.1 ONE-TIME PROGRAMMABLE DATA ARRAY
A 400-bit programmable data array allows each device to be customized. The array interface incorporates parity circuitry for fault
detection along with a locking mechanism to prevent unintended changes. Portions of the array are reserved for factory-pro-
grammed trim values. Customer accessible data stored in the array are shown in the table below.
Addresses $00 - $0D are associated with the programmable data array. A writable register at address $0E is provided for device
control operations. Two read-only registers at addresses $0F and $10 provide status information.
Unused bits within the data array are always read as ‘0’ values. Unprogrammed OTP bits are also read as ‘0’ values.
Type codes
F: Factory programmed OTP location
R: Read-only register
R/W: Read/write register
N/A: Not applicable
3.1.1 DEVICE CONTROL REGISTER (DEVCTL)
A read-write register at address $0E supports a number of device control operations as described below. Reserved bits within
DEVCTL are always read as logic ‘0’ values.
Table 3-1 Customer Accessible Data
Location Bit Function
Type
Address Register 7 6 5 4 3 2 1 0
$00 SN0 SN[7] SN[6] SN[5] SN[4] SN[3] SN[2] SN[1] SN[0]
F
$01 SN1 SN[15] SN[14] SN[13] SN[12] SN[11] SN[10] SN[9] SN[8]
$02 SN2 SN[23] SN[22] SN[21] SN[20] SN[19] SN[18] SN[17] SN[16]
$03 SN3 SN[31] SN[30] SN[29] SN[28] SN[27] SN[26] SN[25] SN[24]
$04 DEVCFG0 Factory Programmed
$05 DEVCFG1 Factory Programmed
$06 DEVCFG2 Factory Programmed
$07 DEVCFG3 Factory Programmed
$08 DEVCFG4 Factory Programmed
$09 DEVCFG5 LOCK2 PAR2 COMP1 COMP0 SPARE DACEN AD3 AD2
$0A AXCFG_X RNG_X[2] RNG_X[1] RNG_X[0] LPF_X[4] LPF_X[3] LPF_X[2] LPF_X[1] LPF_X[0]
$0B AXCFG_Y RNG_Y[2] RNG_Y[1] RNG_Y[0] LPF_Y[4] LPF_Y[3] LPF_Y[2] LPF_Y[1] LPF_Y[0]
$0C Unused N/A
$0E DEVCTL RES_1 RES_0 CE Reserved HPFB YINV ST1 ST0 R/W
$0D DSPCFG SPARE SPARE INTERP OVLD SD HPFD HPFSEL OFMON F
$0F TEMP TEMP[7] TEMP[6] TEMP[5] TEMP[4] TEMP[3] TEMP[2] TEMP[1] TEMP[0]
R$10 DEVSTAT IDE OSCF DEVINIT TF HPF OFF_Y OFF_X DEVRES
$11 COUNT COUNT[7] COUNT[6] COUNT[5] COUNT[4] COUNT[3] COUNT[2] COUNT[1] COUNT[0]
Table 3-2 Device Control Register
Address Register
Bit
7 6 5 4 3 2 1 0
$0E DEVCTL RES1 RES0 CE Reserved HPFB YINV ST1 ST0
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Freescale Semiconductor 15
3.1.1.1 Reset Control (RES_1, RES_0)
A specific series of three write operations involving these two bits will cause the internal digital circuitry to be reset. The state of
the remaining bits in the DEVCTL register do not affect the reset sequence, however any write operation involving this register
in which both RES_1 and RES_0 are cleared will terminate the sequence.
To reset the internal digital circuitry, the following register write operations must be performed in the order shown:
1. Set RES1. RES0 must remain cleared.
2. Set RES1 and RES0.
3. Clear RES1 and set RES0.
RES1 and RES0 are always read as logic ‘0’ values. After reset sequence has been completed DEVCTL register will read 0X00.
It should be noted that after a reset or power-cycle sequence is completed the DEVCTL register reset to the value 0X00.
3.1.1.2 Clear Error (CE)
Setting this bit to a logic ‘1’ state will clear transient error status conditions. It is necessary to either set this bit or perform a device
reset if an error condition has been reported by the device before acceleration data transfer can be resumed. The device reset
condition may be cleared only after device initialization has completed.
Error conditions and classification are described in Section 4.2.
The state of this bit is always read as logic ‘0’.
3.1.1.3 High-Pass Filter Bypass (HPFB)
Setting this bit will remove the high-pass filter from the signal chain within the DSP block. The state of this bit is indicated when
DEVCTL is read. This bit is always cleared following reset.
The state of the high-pass filter is frozen when this bit is at a logic ‘1’ level.
3.1.1.4 Self-Test Control (ST1, ST0)
Bidirectional self-test control is provided through manipulation of these bits. ST1 controls direction while ST0 enables and dis-
ables the self-test circuitry. ST1 and ST0 are always cleared following internal reset. When ST0 is set, the high-pass filter is by-
passed and the values within the high-pass filter are frozen. Both axes are affected simultaneously by the state of these bits. If
the offset monitor is enabled, self-test activation in a single direction should be limited to less than 30 ms.
The state of the ST0 bit is indicated as part of all acceleration results.
3.1.1.5 Y-Axis Signal Inversion Control (YINV)
This control function is provided as a means to verify operation of the two-channel multiplexor which alternately provides X-axis
and Y-axis data to the DSP. An inverter block and multiplexor at the Y-axis input to the DSP are controlled by the YINV bit. Setting
this bit when ST0 is set has the effect of changing the sign of acceleration in the Y-axis. Operation of the YINV bit is illustrated in
Figure 3-1 below. Y-axis inversion may be selected only during self-test; the state of this bit has no effect when ST0 is cleared.
Figure 3-1 Y-Axis Inversion Function
DSP
YINV
ΣΔ
CONVERTER
SINC
FILTER
X
ΣΔ
CONVERTER
Y
SINC
FILTER
ST0
0
1

MMA6255EGR2

Mfr. #:
Manufacturer:
NXP / Freescale
Description:
Accelerometers 50 /50G DIGITAL XY
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