PDF: 09005aef80e5e752/Source: 09005aef80e5e626 Micron Technology, Inc., reserves the right to change products or specifications without notice.
HTF18C64_128_256x72.fm - Rev. E 3/07 EN
10 ©2003 Micron Technology, Inc. All rights reserved.
512MB, 1GB, 2GB (x72, ECC, SR) 240-Pin DDR2 SDRAM RDIMM
I
DD
Specifications
Table 12: DDR2 IDD Specifications and Conditions (Die Revision A) – 2GB
Values shown for MT47H256M4 DDR2 SDRAM only and are computed from values specified in the
1Gb (256 Meg x 4) component data sheet
Parameter/Condition Symbol -667 -53E -40E Units
Operating one bank active-precharge current:
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RAS =
t
RAS MIN (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
IDD0 1,620 1,440 1,260 mA
Operating one bank active-read-precharge current: I
OUT = 0mA;
BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RAS =
t
RAS
MIN (I
DD),
t
RCD =
t
RCD (IDD); CKE is HIGH, S# is HIGH between valid
commands; Address bus inputs are switching; Data pattern is same as
I
DD4W
I
DD1 1,800 1,710 1,440 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (IDD);
CKE is LOW; Other control and address bus inputs are stable; Data bus
inputs are floating
IDD2P 126 126 126 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (IDD);
CKE is HIGH, S# is HIGH; Other control and address bus inputs are stable;
Data bus inputs are floating
IDD2Q 990 738 630 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (IDD); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are switching;
Data bus inputs are switching
I
DD2N 1,080 810 720 mA
Active power-down current: All device banks open;
t
CK =
t
CK (IDD); CKE is LOW; Other control and address bus
inputs are stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P 720 540 450 mA
Slow PDN exit
MR[12] = 1
180 180 180 mA
Active standby current: All device banks open;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Other control and address bus inputs are switching;
Data bus inputs are switching
IDD3N 1,260 990 810 mA
Operating burst write current: All device banks open; Continuous
burst writes; BL = 4, CL = CL (I
DD), AL = 0;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
I
DD4W 2,880 2,340 1,980 mA
Operating burst read current: All device banks open; Continuous burst
reads; IOUT = 0mA; BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
I
DD4R 2,880 2,610 1,980 mA
Burst refresh current:
t
CK =
t
CK (IDD); REFRESH command at every
t
RFC (IDD) interval; CKE is HIGH, S# is HIGH between valid commands;
Other control and address bus inputs are switching; Data bus inputs are
switching
I
DD5 4,680 4,500 3,960 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and
address bus inputs are floating; Data bus inputs are floating
I
DD6 126 126 126 mA
Operating bank interleave read current: All device banks interleaving
reads; I
OUT = 0mA; BL = 4, CL = CL (IDD), AL =
t
RCD (IDD) - 1 x
t
CK (IDD);
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RRD =
t
RRD (IDD),
t
RCD =
t
RCD (IDD); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are stable
during deselects; Data bus inputs are switching
I
DD7 5,400 5,220 4,680 mA
PDF: 09005aef80e5e752/Source: 09005aef80e5e626 Micron Technology, Inc., reserves the right to change products or specifications without notice.
HTF18C64_128_256x72.fm - Rev. E 3/07 EN
11 ©2003 Micron Technology, Inc. All rights reserved.
512MB, 1GB, 2GB (x72, ECC, SR) 240-Pin DDR2 SDRAM RDIMM
I
DD
Specifications
Table 13: DDR2 IDD Specifications and Conditions (Die Revision E) – 2GB
Values shown for MT47H256M4 DDR2 SDRAM only and are computed from values specified in the
1Gb (256 Meg x 4) component data sheet
Parameter/Condition Symbol
-80E/
-800
-667 -53E -40E Units
Operating one bank active-precharge current:
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RAS =
t
RAS MIN (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
IDD0 1,620 1,530 1,260 1,260 mA
Operating one bank active-read-precharge current: I
OUT = 0mA;
BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RAS =
t
RAS
MIN (I
DD),
t
RCD =
t
RCD (IDD); CKE is HIGH, S# is HIGH between valid
commands; Address bus inputs are switching; Data pattern is same as
I
DD4W
I
DD1 1,980 1,800 1,710 1,620 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (IDD);
CKE is LOW; Other control and address bus inputs are stable; Data bus
inputs are floating
IDD2P 126 126 126 126 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (IDD);
CKE is HIGH, S# is HIGH; Other control and address bus inputs are stable;
Data bus inputs are floating
IDD2Q 900 720 720 630 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (IDD); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are switching;
Data bus inputs are switching
I
DD2N 900 720 720 630 mA
Active power-down current: All device banks open;
t
CK =
t
CK (IDD); CKE is LOW; Other control and address bus
inputs are stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P 720 540 540 540 mA
Slow PDN exit
MR[12] = 1
180 180 180 180 mA
Active standby current: All device banks open;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Other control and address bus inputs are switching;
Data bus inputs are switching
IDD3N 1,080 990 810 720 mA
Operating burst write current: All device banks open; Continuous
burst writes; BL = 4, CL = CL (I
DD), AL = 0;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
I
DD4W 2,880 2,430 2,250 1,890 mA
Operating burst read current: All device banks open; Continuous burst
reads; I
OUT = 0mA; BL = 4, CL = CL (IDD), AL = 0;
t
CK =
t
CK (IDD),
t
RAS =
t
RAS MAX (IDD),
t
RP =
t
RP (IDD); CKE is HIGH, S# is HIGH between
valid commands; Address bus inputs are switching; Data bus inputs are
switching
I
DD4R 2,880 2,430 2,250 1,890 mA
Burst refresh current:
t
CK =
t
CK (IDD); REFRESH command at every
t
RFC (IDD) interval; CKE is HIGH, S# is HIGH between valid commands;
Other control and address bus inputs are switching; Data bus inputs are
switching
I
DD5 4,230 3,870 3,780 3,690 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and
address bus inputs are floating; Data bus inputs are floating
I
DD6 126 126 126 126 mA
Operating bank interleave read current: All device banks interleaving
reads; I
OUT = 0mA; BL = 4, CL = CL (IDD), AL =
t
RCD (IDD) - 1 x
t
CK (IDD);
t
CK =
t
CK (IDD),
t
RC =
t
RC (IDD),
t
RRD =
t
RRD (IDD),
t
RCD =
t
RCD (IDD); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are stable
during deselects; Data bus inputs are switching
I
DD7 6,030 5,040 4,860 4,680 mA
PDF: 09005aef80e5e752/Source: 09005aef80e5e626 Micron Technology, Inc., reserves the right to change products or specifications without notice.
HTF18C64_128_256x72.fm - Rev. E 3/07 EN
12 ©2003 Micron Technology, Inc. All rights reserved.
512MB, 1GB, 2GB (x72, ECC, SR) 240-Pin DDR2 SDRAM RDIMM
Register and PLL Specifications
Register and PLL Specifications
Notes: 1. Timing and switching specifications for the register listed above are critical for proper
operation of the DDR2 SDRAM registered DIMMs. These are meant to be a subset of the
parameters for the specific device used on the module. Detailed information for this regis-
ter is available in JEDEC standard JESD82.
Table 14: Register Specifications
SSTU32866 devices or equivalent JESD82-16
Parameter Symbol Pins Condition Min Max Units
DC high-level
input voltage
V
IH(DC) Address,
control,
command
SSTL_18 VREF(DC) +125 VDDQ + 250 V
DC low-level
input voltage
V
IL(DC) Address,
control,
command
SSTL_18 0 VREF(DC) - 125 V
AC high-level
input voltage
V
IH(AC) Address,
control,
command
SSTL_18 VREF(DC) + 250 VDD V
AC low-level
input voltage
V
IL(AC) Address,
control,
command
SSTL_18 0 VREF(DC) - 250 V
Output high voltage
V
OH Parity output LVCMOS 1.2 V
Output low voltage
V
OL Parity output LVCMOS 0.5 V
Input current
I
I All pins VI = VDDQ or VSSQ–5 5µA
Static standby
I
DD All pins RESET# = VSSQ (IO = 0) 100 µA
Static operating
I
DD All pins RESET# = VSSQ;
VI = VIH(AC) or VIL(DC)
IO = 0
–40mA
Dynamic operating
(clock tree)
I
DDD n/a RESET# = VDD, VI = VIH(AC) or
VIL(AC), IO = 0; CK and CK#
switching 50% duty cycle
–Varies by
manufacturer
µA
Dynamic operating
(per each input)
I
DDD n/a RESET# = VDD, VI = VIH(AC) or
V
IL(AC), IO = 0; CK and CK#
switching 50% duty cycle;
One data input switching at
t
CK/2, 50% duty cycle
–Varies by
manufacturer
µA
Input capacitance
(per device, per pin)
C
I All inputs
except RESET#
VI = VREF ±250mV;
V
DDQ = 1.8V
2.5 3.5 pF
Input capacitance
(per device, per pin)
C
I RESET# VI = VDDQ or VSSQ–Varies by
manufacturer
pF

MT18HTF12872PY-667B1

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR2 SDRAM 1GB 240RDIMM
Lifecycle:
New from this manufacturer.
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