7
FN9206.3
May 5, 2008
Description
Operation
Designed for versatility and speed, the ISL6614B MOSFET
driver controls both high-side and low-side N-Channel FETs of
two half-bridge power trains from two externally provided PWM
signals.
Prior to VCC exceeding its POR level, the Pre-POR
overvoltage protection function is activated during initial start-
up; the upper gate (UGATE) is held low and the lower gate
(LGATE), controlled by the Pre-POR overvoltage protection
circuits, is connected to the PHASE. Once the VCC voltage
surpasses the VCC Rising Threshold (See the “Electrical
Specifications” table on page 5), the PWM signal takes control
of gate transitions. A rising edge on PWM initiates the turn-off of
the lower MOSFET (see “TIMING DIAGRAM” on page 7). After
a short propagation delay [t
PDLL
], the lower gate begins to fall.
Typical fall times [t
FL
] are provided in the “Electrical
Specifications” table on page 5. Adaptive shoot-through
circuitry monitors the PHASE voltage and determines the upper
gate delay time [t
PDHU
]. This prevents both the lower and
upper MOSFETs from conducting simultaneously. Once this
delay period is complete, the upper gate drive begins to rise
[t
RU
] and the upper MOSFET turns on.
A falling transition on PWM results in the turn-off of the upper
MOSFET and the turn-on of the lower MOSFET. A short
propagation delay [t
PDLU
] is encountered before the upper
gate begins to fall [t
FU
]. Again, the adaptive shoot-through
circuitry determines the lower gate delay time, t
PDHL
. The
PHASE voltage and the UGATE voltage are monitored, and
the lower gate is allowed to rise after PHASE drops below a
level or the voltage of UGATE to PHASE reaches a level
depending upon the current direction (See the following
section for details). The lower gate then rises [t
RL
], turning on
the lower MOSFET.
Advanced Adaptive Zero Shoot-Through Deadtime
Control (Patent Pending)
These drivers incorporate a unique adaptive deadtime control
technique to minimize deadtime, resulting in high efficiency
from the reduced freewheeling time of the lower MOSFETs’
body-diode conduction, and to prevent the upper and lower
MOSFETs from conducting simultaneously. This is
accomplished by ensuring either rising gate turns on its
MOSFET with minimum and sufficient delay after the other has
turned off.
During turn-off of the lower MOSFET, the PHASE voltage is
monitored until it reaches a -0.2V/+0.8V trip point for a
forward/reverse current, at which time the UGATE is released
to rise. An auto-zero comparator is used to correct the r
DS(ON)
drop in the phase voltage preventing from false detection of the
-0.2V phase level during r
DS(ON)
conduction period. In the
case of zero current, the UGATE is released after 35ns delay of
the LGATE dropping below 0.5V. During the phase detection,
the disturbance of LGATE’s falling transition on the PHASE
node is blanked out to prevent falsely tripping. Once the
PHASE is high, the advanced adaptive shoot-through circuitry
monitors the PHASE and UGATE voltages during a PWM
falling edge and the subsequent UGATE turn-off. If either the
UGATE falls to less than 1.75V above the PHASE or the
PHASE falls to less than +0.8V, the LGATE is released to
turn-on.
Three-State PWM Input
A unique feature of these drivers and other Intersil drivers is
the addition of a shutdown window to the PWM input. If the
PWM signal enters and remains within the shutdown window
for a set holdoff time, the driver outputs are disabled and
both MOSFET gates are pulled and held low. The shutdown
state is removed when the PWM signal moves outside the
shutdown window. Otherwise, the PWM rising and falling
thresholds outlined in the the “Electrical Specifications” table
PWM
UGATE
LGATE
t
FL
t
PDHU
t
PDLL
t
RL
t
TSSHD
t
PDTS
t
PDTS
1.5V<PWM<3.2V
1.0V<PWM<2.6V
t
FU
t
RU
t
PDLU
t
PDHL
t
TSSHD
FIGURE 1. TIMING DIAGRAM
ISL6614B
8
FN9206.3
May 5, 2008
on page 5 determine when the lower and upper gates are
enabled.
This feature helps prevent a negative transient on the output
voltage when the output is shut down, eliminating the
Schottky diode that is used in some systems for protecting
the load from reversed output voltage events.
In addition, more than 400mV hysteresis also incorporates
into the three-state shutdown window to eliminate PWM
input oscillations due to the capacitive load seen by the
PWM input through the body diode of the controller’s PWM
output when the power-up and/or power-down sequence of
bias supplies of the driver and PWM controller are required.
Power-On Reset (POR) Function
During initial startup, the VCC voltage rise is monitored.
Once the rising VCC voltage exceeds 6.9V (typically),
operation of the driver is enabled and the PWM input signal
takes control of the gate drives. If VCC drops below the
falling threshold of 5.6V (typically), operation of the driver is
disabled.
Pre-POR Overvoltage Protection
Prior to VCC exceeding its POR level, the upper gate is held
low and the lower gate is controlled by the overvoltage
protection circuits during initial startup. The PHASE is
connected to the gate of the low side MOSFET (LGATE),
which provides some protection to the microprocessor if the
upper MOSFET(s) is shorted during initial start-up. For
complete protection, the low side MOSFET should have a
gate threshold well below the maximum voltage rating of the
load/microprocessor.
When VCC drops below its POR level, both gates pull low
and the Pre-POR overvoltage protection circuits are not
activated until VCC resets.
Internal Bootstrap Device
Both drivers feature an internal bootstrap schottky diode.
Simply adding an external capacitor across the BOOT and
PHASE pins completes the bootstrap circuit. The bootstrap
function is also designed to prevent the bootstrap capacitor
from overcharging due to the large negative swing at the
trailing-edge of the PHASE node. This reduces voltage
stress on the boot to phase pins.
The bootstrap capacitor must have a maximum voltage
rating above UVCC + 5V and its capacitance value can be
chosen from Equation 1:
where Q
G1
is the amount of gate charge per upper MOSFET
at V
GS1
gate-source voltage and N
Q1
is the number of
control MOSFETs per channel. The ΔV
BOOT_CAP
term is
defined as the allowable droop in the rail of the upper gate
drive.
As an example, suppose two IRLR7821 FETs are chosen as
the upper MOSFETs. The gate charge, Q
G
, from the data
sheet is 10nC at 4.5V (V
GS
) gate-source voltage. Then the
Q
GATE
is calculated to be 53nC for PVCC = 12V. We will
assume a 200mV droop in drive voltage over the PWM
cycle. We find that a bootstrap capacitance of at least
0.267µF is required.
Gate Drive Voltage Versatility
The ISL6614B provides the user flexibility in choosing the
gate drive voltage for efficiency optimization. The ISL6614B
ties the upper and lower drive rails together. Simply applying
a voltage from 5V up to 12V on PVCC sets both gate drive
rail voltages simultaneously. Connecting a SOT-23 package
type of dual Schottky diodes from the VCC to BOOT1 and
BOOT2 can bypass the internal bootstrap devices of both
upper gates so that the part can operate as a dual ISL6612B
driver, which has a fixed VCC (7V to 12V typically) on the
upper gate and a programmable lower gate drive voltage.
Power Dissipation
Package power dissipation is mainly a function of the
switching frequency (f
SW
), the output drive impedance, the
external gate resistance, and the selected MOSFET’s
internal gate resistance and total gate charge. Calculating
the power dissipation in the driver for a desired application is
critical to ensure safe operation. Exceeding the maximum
allowable power dissipation level will push the IC beyond the
maximum recommended operating junction temperature of
+125°C. The maximum allowable IC power dissipation for
the SO14 package is approximately 1W at room
temperature, while the power dissipation capacity in the
C
BOOT_CAP
Q
GATE
ΔV
BOOT_CAP
--------------------------------------
Q
GATE
Q
G1
PVCC
V
GS1
------------------------------------
N
Q1
=
(EQ. 1)
50nC
20nC
FIGURE 2. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE
VOLTAGE
ΔV
BOOT_CAP
(V)
C
BOOT_CAP
(µF)
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
0.30.0 0.1 0.2 0.4 0.5 0.6 0.90.7 0.8 1.0
Q
GATE
= 100nC
ISL6614B
9
FN9206.3
May 5, 2008
QFN packages, with an exposed heat escape pad, is around
2W. See “Layout Considerations” on page 9 for thermal
transfer improvement suggestions. When designing the
driver into an application, it is recommended that the
following calculation is used to ensure safe operation at the
desired frequency for the selected MOSFETs. The total gate
drive power losses due to the gate charge of MOSFETs and
the driver’s internal circuitry and their corresponding average
driver current can be estimated with Equations 2 and 3,
respectively,
where the gate charge (Q
G1
and Q
G2
) is defined at a
particular gate to source voltage (V
GS1
and V
GS2
) in the
corresponding MOSFET datasheet; I
Q
is the driver’s total
quiescent current with no load at both drive outputs; N
Q1
and N
Q2
are number of upper and lower MOSFETs,
respectively; PVCC is the drive voltages for both upper and
lower FETs, respectively. The I
Q*
VCC product is the
quiescent power of the driver without capacitive load and is
typically 200mW at 300kHz.
The total gate drive power losses are dissipated among the
resistive components along the transition path. The drive
resistance dissipates a portion of the total gate drive power
losses, the rest will be dissipated by the external gate
resistors (R
G1
and R
G2
) and the internal gate resistors
(R
GI1
and R
GI2
) of MOSFETs. Figures 3 and 4 show the
typical upper and lower gate drives turn-on transition path.
The power dissipation on the driver can be roughly
estimated in Equation 4:
Layout Considerations
For heat spreading, place copper underneath the IC whether
it has an exposed pad or not. The copper area can be
extended beyond the bottom area of the IC and/or
connected to buried copper plane(s) with thermal vias. This
combination of vias for vertical heat escape, extended
copper plane, and buried planes for heat spreading allows
the IC to achieve its full thermal potential.
Place each channel power component as close to each
other as possible to reduce PCB copper losses and PCB
parasitics: shortest distance between DRAINs of upper FETs
and SOURCEs of lower FETs; shortest distance between
DRAINs of lower FETs and the power ground. Thus, smaller
amplitudes of positive and negative ringing are on the
switching edges of the PHASE node. However, some space
in between the power components is required for good
airflow. The traces from the drivers to the FETs should be
kept short and wide to reduce the inductance of the traces
and to promote clean drive signals.
P
Qg_TOT
2P
Qg_Q1
2P
Qg_Q2
I
Q
VCC++=
(EQ. 2)
P
Qg_Q1
Q
G1
PVCC
2
V
GS1
---------------------------------------
f
SW
N
Q1
=
P
Qg_Q2
Q
G2
PVCC
2
V
GS2
---------------------------------------
f
SW
N
Q2
=
I
DR
Q
G1
N
Q1
V
GS1
----------------------------- -
Q
G2
N
Q2
V
GS2
----------------------------- -
+
⎝⎠
⎜⎟
⎛⎞
f
SW
2 I
Q
+=
(EQ. 3)
P
DR
2P
DR_UP
2P
DR_LOW
I
Q
VCC++=
(EQ. 4)
P
DR_UP
R
HI1
R
HI1
R
EXT1
+
--------------------------------------
R
LO1
R
LO1
R
EXT1
+
----------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
P
Qg_Q1
2
---------------------
=
P
DR_LOW
R
HI2
R
HI2
R
EXT2
+
--------------------------------------
R
LO2
R
LO2
R
EXT2
+
----------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
P
Qg_Q2
2
---------------------
=
R
EXT1
R
G1
R
GI1
N
Q1
-------------
+=
R
EXT2
R
G2
R
GI2
N
Q2
-------------
+=
FIGURE 3. TYPICAL UPPER-GATE DRIVE TURN-ON PATH
FIGURE 4. TYPICAL LOWER-GATE DRIVE TURN-ON PATH
Q1
D
S
G
R
GI1
R
G1
BOOT
R
HI1
C
DS
C
GS
C
GD
R
LO1
PHASE
PVCC
PVCC
Q2
D
S
G
R
GI2
R
G2
R
HI2
C
DS
C
GS
C
GD
R
LO2
ISL6614B

ISL6614BCRZ

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
Gate Drivers DL SYNCH BUCK MSFT HV DRVR LW POR 16LD
Lifecycle:
New from this manufacturer.
Delivery:
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