NB3L553MNR4G

NB3L553
www.onsemi.com
4
Table 5. DC CHARACTERISTICS (V
DD
= 2.375 V to 2.625 V, GND = 0 V, T
A
= −40°C to +85°C) (Note 3)
Symbol
Characteristic Min Typ Max Unit
I
DD
Power Supply Current @ 135 MHz, No Load 25 30 mA
V
OH
Output HIGH Voltage – I
OH
= −16 mA 1.7 V
V
OL
Output LOW Voltage – I
OL
= 16 mA 0.4 V
V
IH,
I
CLK
Input HIGH Voltage, I
CLK
(V
DD
÷2)+0.5 5.0 V
V
IL,
I
CLK
Input LOW Voltage, I
CLK
(V
DD
÷2)−0.5 V
V
IH,
OE Input HIGH Voltage, OE 1.8 V
DD
V
V
IL,
OE Input LOW Voltage, OE 0.7 V
ZO Nominal Output Impedance 20
W
CIN Input Capacitance, I
CLK
, OE 5.0 pF
IOS Short Circuit Current ± 28 mA
DC CHARACTERISTICS (V
DD
= 3.15 V to 3.45 V, GND = 0 V, T
A
= −40°C to +85°C) (Note 3)
Symbol Characteristic Min Typ Max Unit
I
DD
Power Supply Current @ 135 MHz, No Load 35 40 mA
V
OH
Output HIGH Voltage – I
OH
= −25 mA 2.4 V
V
OL
Output LOW Voltage – I
OL
= 25 mA 0.4 V
V
OH
Output HIGH Voltage – I
OH
= −12 mA (CMOS level) V
DD
− 0.4 V
V
IH,
I
CLK
Input HIGH Voltage, I
CLK
(V
DD
÷2)+0.7 5.0 V
V
IL,
I
CLK
Input LOW Voltage, I
CLK
(V
DD
÷2)−0.7 V
V
IH,
OE Input HIGH Voltage, OE 2.0 V
DD
V
V
IL,
OE Input LOW Voltage, OE 0 0.8 V
ZO Nominal Output Impedance 20
W
CIN Input Capacitance, OE 5.0 pF
IOS Short Circuit Current ± 50 mA
DC CHARACTERISTICS (V
DD
= 4.75 V to 5.25 V, GND = 0 V, T
A
= −40°C to +85°C) (Note 3)
Symbol Characteristic Min Typ Max Unit
I
DD
Power Supply Current @ 135 MHz, − No Load 45 85 mA
V
OH
Output HIGH Voltage – I
OH
= −35 mA 2.4 V
V
OL
Output LOW Voltage – I
OL
= 35 mA 0.4 V
V
OH
Output HIGH Voltage – I
OH
= −12 mA (CMOS level) V
DD
− 0.4 V
V
IH,
I
CLK
Input HIGH Voltage, I
CLK
(V
DD
÷2) + 1 5.0 V
V
IL,
I
CLK
Input LOW Voltage, I
CLK
(V
DD
÷2) − 1 V
V
IH,
OE Input HIGH Voltage, OE 2.0 V
DD
V
V
IL,
OE Input LOW Voltage, OE 0.8 V
ZO Nominal Output Impedance 20
W
CIN Input Capacitance, OE 5.0 pF
IOS Short Circuit Current ± 80 mA
NB3L553
www.onsemi.com
5
Table 6. AC CHARACTERISTICS; V
DD
= 2.5 V +5% (V
DD
= 2.375 V to 2.625 V, GND = 0 V, T
A
= −40°C to +85°C) (Note 3)
Symbol
Characteristic Min Typ Max Unit
f
in
Input Frequency 200 MHz
t
r
/t
f
Output rise and fall times; 0.8 V to 2.0 V 1.0 1.5 ns
t
pd
Propagation Delay, CLK to Q
n
(Note 4) 2.2 3.0 5.0 ns
t
skew
Output−to−output skew; (Note 5) 35 50 ps
t
skew
Device−to−device skew, (Note 5) 500 ps
AC CHARACTERISTICS; V
DD
= 3.3 V +5% (V
DD
= 3.15 V to 3.45 V, GND = 0 V, T
A
= −40°C to +85°C) (Note 3)
Symbol
Characteristic Conditions Min Typ Max Unit
f
in
Input Frequency 200 MHz
t
jitter
(f)
RMS Phase Jitter (Integrated 12 kHz −
20 MHz) (See Figures 2 and 3)
f
carrier
= 100 MHz 18 fs
t
r
/t
f
Output rise and fall times; 0.8 V to 2.0 V 0.6 1.0 ns
t
pd
Propagation Delay, CLK to Q
n
(Note 4) 2.0 2.4 4.0 ns
t
skew
Output−to−output skew; (Note 5) 35 50 ps
t
skew
Device−to−device skew, (Note 5) 500 ps
AC CHARACTERISTICS; V
DD
= 5.0 V +5% (V
DD
= 4.75 V to 5.25 V, GND = 0 V, T
A
= −40°C to +85°C) (Note 3)
Symbol
Characteristic Min Min Typ Max Unit
f
in
Input Frequency 200 MHz
t
jitter
(f)
RMS Phase Jitter (Integrated 12 kHz −
20 MHz) (See Figures 2 and 3)
f
carrier
= 100 MHz 29 fs
t
r
/t
f
Output rise and fall times; 0.8 V to 2.0 V 0.3 0.7 ns
t
pd
Propagation Delay, CLK to Q
n
(Note 4) 1.7 2.5 4.0 ns
t
skew
Output−to−output skew; (Note 5) 35 50 ps
t
skew
Device−to−device skew, (Note 5) 500 ps
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
3. Outputs loaded with external R
L
= 33 W series resistor and C
L
= 15 pF to GND. Duty cycle out = duty in. A 0.01 mF decoupling capacitor should
be connected between V
DD
and GND.
4. Measured with rail−to−rail input clock
5. Measured on rising edges at V
DD
÷ 2 between any two outputs with equal loading.
NB3L553
www.onsemi.com
6
Figure 2. Phase Noise Plot at 100 MHz at an Operating Voltage of 3.3 V, Room Temperature
The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3L553 device measured with an input
source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz;
as shown in the shaded area) is 18 fs (RMS Phase Jitter of the input source is 75.40 fs and Output (DUT+Source) is 93.16 fs).
Figure 3. Phase Noise Plot at 100 MHz at an Operating Voltage of 5 V, Room Temperature
The above plot captured using Agilent E5052A shows Additive Phase Noise of the NB3L553 device measured with an input
source generated by Agilent E8663B. The RMS phase jitter contributed by the device (integrated between 12 kHz to 20 MHz;
as shown in the shaded area) is 29 fs (RMS Phase Jitter of the input source is 75.40 fs and Output (DUT+Source) is 103.85 fs).

NB3L553MNR4G

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
Clock Buffer 1:4 Clock Buffer 2.5/3.3/5 V
Lifecycle:
New from this manufacturer.
Delivery:
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