Technical Data Sheet
0.56" Dual Digit SMD Displays
ELSD-512SYGWA/S530-E2/S290
Everlight Electronics Co., Ltd. http://www.everlight.com Rev. 2 Page: 6 of 8
Device No.: DDF-0000068 Prepared date: 2009/06/17 Prepared by: Sun Li
■ Reliability test items and conditions:
The reliability of products shall be satisfied with items listed below.
Confidence level：90%
LTPD：10%
NO
Item
Test
Conditions
Test
Hours/Cycle
Sample
Size
Failure
Judgment
Criteria
Ac/Re
1
Reflow
Soldering
TEMP:260°C±5°C
5~10 SEC
6 Min
22 PCS
0/1
2
Temperature
Cycle
H：+100°C 15min
∫ 5min
L：-40°C 15min
300 Cycles
22 PCS
0/1
3
Thermal
Shock
H：+100°C 5min
∫ 10 sec
L：-10°C 5min
300 Cycles
22 PCS
0/1
4
High
Temperature
Storage
TEMP:105°C
1000 HRS
22 PCS
0/1
5
Low
Temperature
Storage
TEMP:-40°C
1000 HRS
22 PCS
0/1
6
DC Operating
Life
TEMP:25°C
If＝10mA
1000 HRS
22 PCS
0/1
7
High
Temperature /
High
Humidity
85°C / 85% RH 1000 HRS 22 PCS
Iv≦Ivt*0.5
or
VF≧U
or
V
F≦L
0/1
Note：Ivt：The test Iv value of the chip before the reliability test
Iv：The test value of the chip that has completed the reliability test
U：Upper Specification Limit
L：Lower Specification Limit
