ZHT431
Issue 7- July 2009 4 www.diodes.com
© Diodes Incorporated
Typical Characteristics
ZHT431
Issue 7- July 2009 5 www.diodes.com
© Diodes Incorporated
Typical Characteristics
Gain v Frequency
Frequency (Hz)
Load Capacitance (F)
Stability Boundary Conditions
Time (
µ
s)
Pulse Response
I
Z
15k
V
Z
V
Z
Test Circuit for Open Loop Voltage Gain
8k25
9µF
230
+
-
I
Z
= 10mA,
T
A
= 25°C
Test Circuit for Stability Boundary Conditions
Input
150
10k
V
ref
< V
Z
< 20, I
Z
= 10mA, T
A
= 25°C
V
Z
I
Z
Input Monitor
Test Circuit for Pulse Response
220
50
Pulse
Generator
T
A
= 25°C
60
40
20
0
100 1k 10k 100k 1M
)Bd( niaG egatloV pooL nepO
)V( gniwS egatloV
2.0
0
00.40.60.81.00.2
1.0
0
5.0
3.0
Repetitive pulse
Single pulse
V
Z
INPUT
STABLESTABLE
0
10p
20
40
60
80
100
100p 1000p
0.01
µ
0.1
µ
1
µ
)Am( tnerruC edohtaC
4-31
ZHT431
Issue 7- July 2009 6 www.diodes.com
© Diodes Incorporated
DC Test Circuits
Input Input Input
Fig 1 - Test circuit for V
Z
= V
ref
Fig 2 - Test circuit for V
Z
> V
ref
Fig 3 - Test circuit for for Of
state current
V
Z
I
Z
I
Z
I
ref
I
ref
V
ref
V
ref
R1
R2
I
L
I
L
I
ZOFF
V
Z

ZHT431C02L

Mfr. #:
Manufacturer:
Diodes Incorporated
Description:
Voltage References High Temp 431 Prog
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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