TCUT1300X01
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Vishay Semiconductors
Rev. 2.9, 04-Oct-11
5
Document Number: 84756
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Fig. 13 - Relative Collector Current vs. Vertical Displacement
Fig. 14 - Rise/Fall Time vs. Collector Current
Fig. 15 - Application example
REFLOW SOLDER PROFILE
Fig. 16 - Lead (Pb)-free Reflow Solder Profile acc. J-STD-020
FLOOR LIFE
Level 1, acc. JEDEC, J-STD-020. No time limit.
0
0.5
1
- 1.5 - 1 - 0.5 0 0.5 1 1.5
S - Vertical Displacement (mm)
I
Crel
- Rel. Collector Current
20610
S
1 ± 0.2
Optical axis
0
10
20
30
40
50
60
70
80
90
100
0 250 500 750 1000 1250 1500 1750 2000
I
C
- Collector Current (µA)
t
r
/t
f
- Rise/Fall Time (µs)
t
f
t
r
20599
R
L
= 100 Ω
13887
74HCT14
GND
I
F
= 15 mA + V
C
= 5 V
10 kΩ
V
E
U
Q
0
50
100
150
200
250
300
0 50 100 150 200 250 300
Time (s)
Temperature (°C)
240 °C
245 °C
max. 260 °C
max. 120 s
max. 100 s
217 °C
max. 30 s
max. ramp up 3 °C/s
max. ramp down 6 °C/s
19841
255 °C
RELIABILITY TESTS IN REFERENCE TO AEC-Q101 RELEASE
TEST CONDITION DURATION LOT SIZE - REJECTS
High temperature storage T
stg (max.)
= 100 °C 1000 h 3 x 50 pcs - 0 pcs
Low temperature storage T
stg (min.)
= - 40 °C 1000 h 3 x 50 pcs - 0 pcs
Temperature cycling - 40 °C/+ 100 °C 1000 x 3 x 77 pcs - 0 pcs
H3TRB
85 °C/85 % RH,
emitters: V
R
= 4 V, detectors: V
CEO
= 5 V
1000 h 3 x 77 pcs - 0 pcs
Intermittent operational life
Emitters: I
F
= 80 mA DC, detectors: V
CE
= 16 V,
duty cycle: 2 min on, 2 min off, T
amb
= 25 °C
1000 h
(15 000 cycles)
3 x 77 pcs - 0 pcs
RELIABILITY TESTS IN REFERENCE TO ENHANCED TEMPERATURE RELEASE ACC. AEC-Q101
TEST CONDITION DURATION LOT SIZE - REJECTS
High temperature storage T
stg(max.)
= 125 °C 1000 h 1 x 50 pcs - 0 pcs
Temperature cycling - 40 °C/+ 150 °C 1000 x 1 x 77 pcs - 0 pcs
Power temperature cycle
- 25 °C/+ 85 °C, I
F
= 50 mA, V
CE
= 16 V,
2 min. on, 2 min. off
1000 h
(15 000 cycles)
1 x 77 pcs - 0 pcs