VND920-E
8/19
Table 12. Truth Table (per each channel)
Table 13. Electrical Transient Requirements On V
CC
Pin
CONDITIONS INPUT OUTPUT CURRENT SENSE
Normal operation
L
H
L
H
0
Nominal
Overtemperature
L
H
L
L
0
V
SENSEH
Undervoltage
L
H
L
L
0
0
Overvoltage
L
H
L
L
0
0
Short circuit to GND
L
H
H
L
L
L
0
(T
j
<T
TSD
) 0
(T
j
>T
TSD
) V
SENSEH
Short circuit to V
CC
L
H
H
H
0
< Nominal
Negative output voltage clamp L L 0
ISO T/R 7637/1
Test Pulse
TEST LEVELS
I II III IV
Delays and
Impedance
1 -25 V -50 V -75 V -100 V 2 ms 10 Ω
2 +25 V +50 V +75 V +100 V 0.2 ms 10 Ω
3a -25 V -50 V -100 V -150 V 0.1 µs 50 Ω
3b +25 V +50 V +75 V +100 V 0.1 µs 50 Ω
4 -4 V -5 V -6 V -7 V 100 ms, 0.01
Ω
5 +26.5 V +46.5 V +66.5 V +86.5 V 400 ms, 2
Ω
ISO T/R 7637/1
Test Pulse
TEST LEVELS RESULTS
I II III IV
1CCCC
2CCCC
3aCCCC
3bCCCC
4CCCC
5CEEE
CLASS CONTENTS
C All functions of the device are performed as designed after exposure to disturbance.
E One or more functions of the device is not performed as designed after exposure to disturbance
and cannot be returned to proper operation without replacing the device.
Obsolete Product(s) - Obsolete Product(s)
