MC10E101, MC100E101
www.onsemi.com
4
Table 6. 100E SERIES NECL DC CHARACTERISTICS (V
CCx
= 0.0 V; V
EE
= −5.0 V (Note 1))
Symbol
Characteristic
−40°C 25°C 85°C
Unit
Min Typ Max Min Typ Max Min Typ Max
I
EE
Power Supply Current 30 36 30 36 35 42 mA
V
OH
Output HIGH Voltage (Note 2) −1025 −950 −880 −1025 −950 −880 −1025 −950 −880 mV
V
OL
Output LOW Voltage (Note 2) −1810 −1705 −1620 −1810 −1745 −1620 −1810 −1740 −1620 mV
V
IH
Input HIGH Voltage −1165 −1025 −880 −1165 −1025 −880 −1165 −1025 −880 mV
V
IL
Input LOW Voltage −1810 −1645 −1475 −1810 −1645 −1475 −1810 −1645 −1475 mV
I
IH
Input HIGH Current 150 150 150
mA
I
IL
Input LOW Current 0.5 0.3 0.5 0.25 0.5 0.2
mA
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
1. Input and output parameters vary 1:1 with V
CC
. V
EE
can vary −0.46 V / +0.8 V.
2. Outputs are terminated through a 50ĂW resistor to V
CC
− 2.0 V.
Table 7. AC CHARACTERISTICS (V
CCx
= 5.0 V; V
EE
= 0.0 V or V
CCx
= 0.0 V; V
EE
= −5.0 V (Note 1))
Symbol
Characteristic
−40°C 25°C 85°C
Unit
Min Typ Max Min Typ Max Min Typ Max
f
MAX
Maximum Toggle Frequency 700 700 700 MHz
t
PLH
t
PHL
Propagation Delay to Output
D to Q
300 450 600 300 450 600 300 450 600 ps
t
SKEW
Within-Device Skew (Note 2)
Within-Gate Skew (Note 3)
50
25
50
25
50
25
ps
t
JITTER
Random Clock Jitter (RMS) < 1 < 1 < 1 ps
t
r
t
f
Rise/Fall Time
(20 - 80%)
275 380 575 300 380 575 275 380 575 ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
1. 10 Series: V
EE
can vary −0.46 V / +0.06 V.
100 Series: V
EE
can vary −0.46 V / +0.8 V.
2. Within-device skew is defined as identical transitions on similar paths through a device.
3. Within-gate skew is defined as the variation in propagation delays of a gate when driven from its different inputs.