SpecNo.JELF243C-0007P-01
P.3/9
MURATA MFG. CO.,LTD.
Reference
Only
6.Electrical Performance
No. Item Specification Test Method
6.1 Inductance
Inductance shall meet item 3.
Measuring Equipment:
Agilent4291A or equivalent
Measuring Frequency:500MHz
Measuring Condition:
Test signal level / about 7dBm
Electrical length / 0.94cm
Weight / about 1N to 5N
Measuring Fixture: Agilent 16193A
Position coil under test as shown in below
and contact coil with each terminal by
adding weight.
Coil pattern should be a topside, and inner
end of the coil should be in the direction of
the fixture for position of chip coil.
Measuring Method:See P.9
<Electrical Performance:Measuring
Method of Inductance/Q>
6.2 Q Q shall meet item 3.
6.3 DC Resistance DC Resistance shall meet item 3. Measuring Equipment:Digital multi meter
6.4 Self Resonant
Frequency
(S.R.F)
S.R.F shall meet item 3. Measuring Equipment:
Agilent 8753C or equivalent
6.5 Rated Current Self temperature rise shall be
limited to 25°C max.
The rated current is applied.
7.Mechanical Performance
No. Item Specification Test Method
7.1 Shear Test Chip coil shall not be damaged
after tested as test method.
Substrate:Glass-epoxy substrate
Force:10N
Hold Duration:5s±1s
Applied Direction: Parallel to PCB.
7.2 Bending Test Chip coil shall not be damaged
after tested as test method.
Substrate:Glass-epoxy substrate
(100mm×40mm×1.6mm)
Speed of Applying Force:1mm/s
Deflection:2mm
Hold Duration:30 s
(in mm)
0.5mm
11.5mm
Inner end of the coil
F
Substrate
Chip Coil
45
R340
F
Deflection
45
Product
Pressure jig
