SSM6N7002BFE,LM

SSM6N7002BFE
2014-03-01
1
TOSHIBA Field-Effect Transistor Silicon N Channel MOS Type (U-MOS)
SSM6N7002BFE
High-Speed Switching Applications
Analog Switch Applications
Small package
Low ON-resistance : R
DS(ON)
= 3.3 Ω (max) (@V
GS
= 4.5 V)
: R
DS(ON)
= 2.6 Ω (max) (@V
GS
= 5 V)
: R
DS(ON)
= 2.1 Ω (max) (@V
GS
= 10 V)
Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 Common)
Characteristics Symbol Rating Unit
Drain-source voltage V
DSS
60 V
Gate-source voltage V
GSS
±20 V
DC I
D
200
Drain current
Pulse I
DP
800
mA
Power dissipation P
D
(Note 1) 150 mW
Channel temperature T
ch
150 °C
Storage temperature range T
stg
55 to 150 °C
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the
absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1:Total rating, mounted on FR4 board
(25.4 mm × 25.4 mm × 1.6 mm, Cu Pad: 0.135mm
2
× 6)
Marking Equivalent Circuit
(top view)
Unit: mm
0.12±0.05
0.55±0.05
0.2±0.05
6
1.2±0.05
1.6±0.05
1.0±0.05
1
2
0.50.5
3
1.6±0.05
5
4
JEDEC
JEITA
TOSHIBA 2-2N1D
Weight: 3.0 mg (typ.)
ES6
1.SOURCE1
2.GATE1
3.DRAIN2
4.SOURCE2
5.GATE2
6.DRAIN1
NM
6 5 4
1 2 3
654
123
Q1
Q2
Start of commercial production
2009-11
SSM6N7002BFE
2014-03-01
2
Electrical Characteristics
(Ta = 25°C)(Q1, Q2 Common)
Characteristics Symbol Test Condition Min Typ Max Unit
Gate leakage current I
GSS
V
GS
= ±20 V, V
DS
= 0 V ±10 μA
V
(BR) DSS
I
D
= 10 mA, V
GS
= 0 V 60
Drain-source breakdown voltage
V
(BR) DSX
I
D
= 10 mA, V
GS
= -10 V 45
V
Drain cutoff current I
DSS
V
DS
= 60 V, V
GS
= 0 V 1 μA
Gate threshold voltage V
th
V
DS
= 10 V, I
D
= 0.25 mA 1.5 3.1 V
Forward transfer admittance Y
fs
V
DS
= 10 V, I
D
= 200 mA (Note 2) 225 mS
I
D
= 500 mA, V
GS
= 10 V (Note 2) 1.62 2.1
I
D
= 100 mA, V
GS
= 5 V (Note 2) 1.90 2.6
Drain-source ON-resistance R
DS (ON)
I
D
= 100 mA, V
GS
= 4.5 V (Note 2) 2.10 3.3
Ω
Input capacitance C
iss
17.0
Reverse transfer capacitance C
rss
1.9
Output capacitance C
oss
V
DS
= 25 V, V
GS
= 0 V, f = 1 MHz
3.6
pF
Turn-on delay time td
(on)
3.3 6.6
Switching time
Turn-off delay time td
(off)
V
DD
= 30 V , I
D
= 200 mA,
V
GS
= 0 to 10 V
14.5 40
ns
Drain-source forward voltage V
DSF
I
D
= -200 mA, V
GS
= 0 V (Note 2) -0.84 -1.2 V
Note2: Pulse test
Switching Time Test Circuit
Precaution
Let V
th
be the voltage applied between gate and source that causes the drain current (I
D
)
to be low (0.25 mA for the
SSM6N7002BFE). Then, for normal switching operation, V
GS(on)
must be higher than V
th,
and V
GS(off)
must be lower
than V
th.
This relationship can be expressed as: V
GS(off)
< V
th
< V
GS(on).
Take this into consideration when using the device
Handling Precaution
When handling individual devices that are not yet mounted on a circuit board, make sure that the environment is
protected against electrostatic discharge. Operators should wear antistatic clothing, and containers and other objects that
come into direct contact with devices should be made of antistatic materials.
Thermal resistance R
th (ch-a)
and Power dissipation P
D
vary depending on board material, board area, board thickness
and pad area. When using this device, please take heat dissipation into consideration.
(c) V
OUT
(b) V
IN
(a) Test circuit
td
(on)
90 %
10 %
0 V
10 V
90 %
10 %
td
(off)
t
r
t
f
V
DD
V
DS
(
ON
)
V
DD
= 30 V
Duty
1%
V
IN
: t
r
, t
f
< 2 ns
(Z
out
= 50 Ω)
Common Source
Ta = 25 °C
10 V
0
10 μs
V
DD
OUT
IN
50 Ω
R
L
SSM6N7002BFE
2014-03-01
3
(Q1, Q2 Common)
300
R
DS (ON)
– I
D
Drain current I
D
(mA)
Drain–source ON-resistance
R
DS (ON)
()
10 30
0
100 1000
5
1
VGS = 10 V
5.0 V
4.5 V
4
3
2
Common Source
Ta = 25°C
Ambient temperature Ta (°C)
R
DS (ON)
– Ta
Drain–source ON-resistance
R
DS (ON)
()
0
50
0
50 150 100
5
2
Common Source
I
D
= 500 mA / V
GS
= 10 V
100 mA / 4.5 V
100 mA / 5.0V
4
3
1
Ambient temperature Ta (°C)
V
th
– Ta
Gate threshold voltage V
th
(V)
3.0
0
50 0 150
2.0
50 100
1.0
Common Source
V
DS
= 10 V
I
D
= 0.25 mA
Gate–source voltage V
GS
(V)
I
D
– V
GS
Drain current I
D
(mA)
1000
0
10
100
0.1
1
0.01
5.0
4.0
-25 °C
2.0
3.0
1.0
Common Source
V
DS
= 10 V
25 °C
Ta = 100 °C
Drain–source voltage V
DS
(V)
I
D
– V
DS
Drain current I
D
(mA)
0
400
0
0.4 0.8 1.2 2.0
200
1.6
600
800
10 V
Common Source
Ta = 25 °C
7.0 V
3.5 V
VGS = 3.3 V
4.5 V
1000
5.0 V
4.0 V
Drain–source ON-resistance
R
DS (ON)
()
0
10
Gate–source voltage V
GS
(V)
0
R
DS (ON)
– V
GS
20
2
25 °C
5
Ta = 100 °C
-25 °C
I
D
= 100 mA
Common Source
Ta = 25°C
4
3
1

SSM6N7002BFE,LM

Mfr. #:
Manufacturer:
Toshiba
Description:
MOSFET ES6 S-MOS TRSTR Pd: 0.15W F: 1MHz
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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