CAV25128
http://onsemi.com
2
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters Ratings Units
Operating Temperature −45 to +130 °C
Storage Temperature −65 to +150 °C
Voltage on any Pin with Respect to Ground (Note 1) −0.5 to +6.5 V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The DC input voltage on any pin should not be lower than −0.5 V or higher than V
CC
+ 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than −1.5 V or overshoot to no more than V
CC
+ 1.5 V, for periods of less than 20 ns.
Table 2. RELIABILITY CHARACTERISTICS (Note 2)
Symbol
Parameter Min Units
N
END
(Notes 3, 4) Endurance 1,000,000 Program / Erase Cycles
T
DR
Data Retention 100 Years
2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
3. Page Mode, V
CC
= 5 V, 25°C.
4. The device uses ECC (Error Correction Code) logic with 6 ECC bits to correct one bit error in 4 data bytes. Therefore, when a single byte
has to be written, 4 bytes (including the ECC bits) are re−programmed. It is recommended to write by multiple of 4 bytes in order to benefit
from the maximum number of write cycles.
Table 3. D.C. OPERATING CHARACTERISTICS (V
CC
= 2.5 V to 5.5 V, T
A
= −40°C to +125°C, unless otherwise specified.)
Symbol
Parameter Test Conditions Min Max Units
I
CCR
Supply Current (Read Mode) Read, SO open, f
SCK
= 10 MHz 2 mA
I
CCW
Supply Current (Write Mode) Write, CS = V
CC
2 mA
I
SB1
Standby Current V
IN
= GND or V
CC
, CS = V
CC
,
WP
= V
CC
, V
CC
= 5.5 V
3
mA
I
SB2
Standby Current V
IN
= GND or V
CC
, CS = V
CC
,
WP
= GND, V
CC
= 5.5 V
5
mA
I
L
Input Leakage Current V
IN
= GND or V
CC
−2 2
mA
I
LO
Output Leakage Current CS = V
CC
V
OUT
= GND or V
CC
−2 2
mA
V
IL
Input Low Voltage −0.5 0.3 V
CC
V
V
IH
Input High Voltage 0.7 V
CC
V
CC
+ 0.5 V
V
OL
Output Low Voltage I
OL
= 3.0 mA 0.4 V
V
OH
Output High Voltage I
OH
= −1.6 mA V
CC
− 0.8 V V
Table 4. PIN CAPACITANCE (Note 5) (T
A
= 25°C, f = 1.0 MHz, V
CC
= +5.0 V)
Symbol
Test Conditions Min Typ Max Units
C
OUT
Output Capacitance (SO) V
OUT
= 0 V 8 pF
C
IN
Input Capacitance (CS, SCK, SI, WP, HOLD) V
IN
= 0 V 8 pF
5. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100
and JEDEC test methods.
