IXYS Reserves the Right to Change Limits, Test Conditions and Dimensions.
IXBF12N300
IXYS MOSFETs and IGBTs are covered 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585 7,005,734 B2 7,157,338B2
by one or more of the following U.S. patents: 4,860,072 5,017,508 5,063,307 5,381,025 6,259,123 B1 6,534,343 6,710,405 B2 6,759,692 7,063,975 B2
4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 B1 6,583,505 6,710,463 6,771,478 B2 7,071,537
Symbol Test Conditions Characteristic Values
(T
J
= 25°C Unless Otherwise Specified) Min. Typ. Max.
g
fS
I
C
= I
C90
, V
CE
= 10V, Note 1 6.5 10.8 S
C
ies
1290 pF
C
oes
V
CE
= 25V, V
GE
= 0V, f = 1MHz 56 pF
C
res
19 pF
Q
g
62 nC
Q
ge
I
C
= I
C90
, V
GE
= 15V, V
CE
= 1000V 13 nC
Q
gc
8.5 nC
t
d(on)
64 ns
t
r
140 ns
t
d(off)
180 ns
t
f
540 ns
t
d(on)
65 ns
t
r
395 ns
t
d(off)
175 ns
t
f
530 ns
R
thJC
1.00 °C/W
R
thCS
0.15 °C/W
Resistive Switching Times, T
J
= 125°C
I
C
= I
C90
, V
GE
= 15V
V
CE
= 1250V, R
G
= 10Ω
Resistive Switching Times, T
J
= 25°C
I
C
= I
C90
V
GE
= 15V
V
CE
= 1250V, R
G
= 10Ω
Reverse Diode
Symbol Test Conditions Characteristic Values
(T
J
= 25°C Unless Otherwise Specified) Min. Typ. Max.
V
F
I
F
= 12A, V
GE
= 0V 2.1 V
t
rr
1.4 μs
I
RM
21 A
I
F
= 6A, V
GE
= 0V, -di
F
/dt = 100A/μs
V
R
= 100V, V
GE
= 0V
ISOPLUS i4-Pak
TM
(HV) Outline
Pin 1 = Gate
Pin2 = Emitter
Pin 3 = Collector
Tab 4 = Isolated
Notes:
1. Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
2. Device must be heatsunk for high temperature leakage current
measurements to avoid thermal runaway.