DC and AC characteristics M27C801
16/24
Figure 7. Read mode AC waveforms
Table 9. Read mode AC characteristics
(1)
(2)
Symbol Alt Parameter
Test
condition
-55
(3)
-80/-90 -100
Unit
Min. Max. Min. Max. Min Max.
t
AVQV
t
ACC
Address valid to output valid
E
= V
IL
,
GV
PP
= V
IL
55 80 100 ns
t
ELQV
t
CE
Chip Enable low to output valid GV
PP
= V
IL
55 80 100 ns
t
GLQV
t
OE
Output Enable low to output valid E = V
IL
30 40 50 ns
t
EHQZ
(4)
t
DF
Chip Enable high to output Hi-Z GV
PP
= V
IL
025035040ns
t
GHQZ
(4)
t
DF
Output Enable high to output Hi-Z E = V
IL
025035040ns
t
AXQX
t
OH
Address transition to output
transition
E = V
IL
,
GV
PP
= V
IL
000ns
1. T
A
= 0 to 70 °C or –40 to 85 °C; V
CC
= 5 V ± 10%.
2. V
CC
must be applied simultaneously with or before V
PP
and removed simultaneously or after V
PP
.
3. Speed obtained with High Speed AC measurement conditions.
4. Sampled only, not 100% tested.
AI01583B
tAXQX
tEHQZ
A0-A19
E
G
Q0-Q7
tAVQV
tGHQZ
tGLQV
tELQV
VALID
Hi-Z
VALID
Obsolete Product(s) - Obsolete Product(s)
M27C801 DC and AC characteristics
17/24
Figure 8. Margin mode AC waveforms
Table 10. Margin mode AC characteristics
(1)
(2)
Symbol Alt Parameter Test condition Min Max Unit
t
A9HVPH
t
AS9
V
A9
high to V
PP
high 2 µs
t
VPHEL
t
VPS
V
PP
high to Chip Enable low 2 µs
t
A10HEH
t
AS10
V
A10
high to Chip Enable high (Set) 1 µs
t
A10LEH
t
AS10
V
A10
low to Chip Enable high (Reset) 1 µs
t
EXA10X
t
AH10
Chip Enable transition to V
A10
transition 1 µs
t
EXVPX
t
VPH
Chip Enable transition to V
PP
transition 2 µs
t
VPXA9X
t
AH9
V
PP
transition to V
A9
transition 2 µs
1. T
A
= 25 °C; V
CC
= 6.25 V ± 0.25 V; V
PP
= 12.75 V ± 0.25 V
2. V
CC
must be applied simultaneously with or before V
PP
and removed simultaneously or after V
PP
.
AI00736B
tA9HVPH tVPXA9X
A8
E
GV
PP
A10 Set
V
CC
tVPHEL
tA10LEH
tEXVPX
tA10HEH
A9
A10 Reset
tEXA10X
Obsolete Product(s) - Obsolete Product(s)
DC and AC characteristics M27C801
18/24
Figure 9. Programming and verify modes AC waveforms
Table 11. Programming mode AC characteristics
(1)
Symbol Alt Parameter Test condition Min. Max. Unit
t
AVEL
t
AS
Address valid to Chip Enable low 2 µs
t
QVEL
t
DS
Input valid to Chip Enable low 2 µs
t
VCHEL
t
VCS
V
CC
high to Chip Enable low 2 µs
t
VPHEL
t
OES
V
PP
high to Chip Enable low 2 µs
t
VPLVPH
t
PRT
V
PP
rise time 50 ns
t
ELEH
t
PW
Chip Enable program pulse width (initial) 45 55 µs
t
EHQX
t
DH
Chip Enable high to Input transition 2 µs
t
EHVPX
t
OEH
Chip Enable high to V
PP
transition 2 µs
t
VPLEL
t
VR
V
PP
low to Chip Enable low 2 µs
t
ELQV
t
DV
Chip Enable low to output valid 1 µs
t
EHQZ
(2)
t
DFP
Chip Enable high to output Hi-Z 0 130 ns
t
EHAX
t
AH
Chip Enable high to address transition 0 ns
1. V
CC
must be applied simultaneously with or before V
PP
and removed simultaneously or after V
PP
.
2. Sampled only, not 100% tested.
tAVEL
VALID
AI01270
A0-A19
Q0-Q7
V
CC
DATA IN DATA OUT
E
tQVEL
tVCHEL
tVPHEL
tEHQX
tEHVPX
tELQV
tELEH
tEHQZ
tVPLEL
PROGRAM VERIFY
GV
PP
tEHAX
Obsolete Product(s) - Obsolete Product(s)

M27C801-90F1

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
EPROM 8M (1Mx8) 90ns
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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