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4
Table 6. A.C. CHARACTERISTICS (Note 5), CAT93C56
(V
CC
= +1.8V to +5.5V, T
A
= −40°C to +125°C, unless otherwise specified.)
Symbol
Parameter
Limits
Units
Min Max
t
CSS
CS Setup Time 50 ns
t
CSH
CS Hold Time 0 ns
t
DIS
DI Setup Time 100 ns
t
DIH
DI Hold Time 100 ns
t
PD1
Output Delay to 1 0.25
ms
t
PD0
Output Delay to 0 0.25
ms
t
HZ
(Note 6) Output Delay to High−Z 100 ns
t
EW
Program/Erase Pulse Width 5 ms
t
CSMIN
Minimum CS Low Time 0.25
ms
t
SKHI
Minimum SK High Time 0.25
ms
t
SKLOW
Minimum SK Low Time 0.25
ms
t
SV
Output Delay to Status Valid 0.25
ms
SK
MAX
Maximum Clock Frequency DC 2000 kHz
Table 7. A.C. CHARACTERISTICS (Note 5), CAT93C57, Die Rev. E – Mature Product
(NOT RECOMMENDED FOR NEW DESIGNS)
Symbol Parameter
Limits
Units
V
CC
= 1.8 V − 5.5 V V
CC
= 2.5 V − 5.5 V V
CC
= 4.5 V − 5.5 V
Min Max Min Max Min Max
t
CSS
CS Setup Time 200 100 50 ns
t
CSH
CS Hold Time 0 0 0 ns
t
DIS
DI Setup Time 400 200 100 ns
t
DIH
DI Hold Time 400 200 100 ns
t
PD1
Output Delay to 1 1 0.5 0.25
ms
t
PD0
Output Delay to 0 1 0.5 0.25
ms
t
HZ
(Note 6)
Output Delay to High−Z 400 200 100 ns
t
EW
Program/Erase Pulse Width 10 10 10 ms
t
CSMIN
Minimum CS Low Time 1 0.5 0.25
ms
t
SKHI
Minimum SK High Time 1 0.5 0.25
ms
t
SKLOW
Minimum SK Low Time 1 0.5 0.25
ms
t
SV
Output Delay to Status Valid 1 0.5 0.25
ms
SK
MAX
Maximum Clock Frequency DC 250 DC 500 DC 1000 kHz
Table 8. POWER−UP TIMING (Notes 6 and 7)
Symbol Parameter Max Units
t
PUR
Power−up to Read Operation 1 ms
t
PUW
Power−up to Write Operation 1 ms
5. Test conditions according to “A.C. Test Conditions” table.
6. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate
AEC−Q100 and JEDEC test methods.
7. t
PUR
and t
PUW
are the delays required from the time V
CC
is stable until the specified operation can be initiated.
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Table 9. A.C. TEST CONDITIONS
Input Rise and Fall Times 50 ns
Input Pulse Voltages 0.4 V to 2.4 V 4.5 V v V
CC
v 5.5 V
Timing Reference Voltages 0.8 V, 2.0 V 4.5 V v V
CC
v 5.5 V
Input Pulse Voltages 0.2 V
CC
to 0.7 V
CC
1.8 V v V
CC
v 4.5 V
Timing Reference Voltages 0.5 V
CC
1.8 V v V
CC
v 4.5 V
Output Load Current Source I
OLmax
/I
OHmax
; CL=100 pF
Device Operation
The CAT93C56/57 is a 2048−bit nonvolatile memory
intended for use with industry standard microprocessors.
The CAT93C56/57 can be organized as either registers of 16
bits or 8 bits. When organized as X16, seven 10−bit
instructions for 93C57 or seven 11−bit instructions for
93C56 control the reading, writing and erase operations of
the device. When organized as X8, seven 11−bit instructions
for 93C57 or seven 12−bit instructions for 93C56 control the
reading, writing and erase operations of the device. The
CAT93C56/57 operates on a single power supply and will
generate on chip, the high voltage required during any write
operation.
Instructions, addresses, and write data are clocked into the
DI pin on the rising edge of the clock (SK). The DO pin is
normally in a high impedance state except when reading data
from the device, or when checking the ready/busy status
after a write operation. The serial communication protocol
follows the timing shown in Figure 2.
The ready/busy status can be determined after the start of
internal write cycle by selecting the device (CS high) and
polling the DO pin; DO low indicates that the write
operation is not completed, while DO high indicates that the
device is ready for the next instruction. If necessary, the DO
pin may be placed back into a high impedance state during
chip select by shifting a dummy “1” into the DI pin. The DO
pin will enter the high impedance state on the rising edge of
the clock (SK). Placing the DO pin into the high impedance
state is recommended in applications where the DI pin and
the DO pin are to be tied together to form a common DI/O
pin.
SK
DI
CS
DO
VALID
VALID
DATA VALID
Figure 2. Synchronous Data Timing
t
CSS
t
SKHI
t
SKLOW
t
DIS
t
DIS
t
DIH
t
CSH
t
CSMN
t
PD0
, t
PD1
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The format for all instructions sent to the device is a
logical “1” start bit, a 2−bit (or 4−bit) opcode, 7−bit address
(CAT93C57) / 8−bit address (CAT93C56) (an additional bit
when organized X8) and for write operations a 16−bit data
field (8−bit for X8 organizations). The instruction format is
shown in Instruction Set table.
Table 10. INSTRUCTION SET
Instruction Device Type
Star
t
Bit
Opcode
Address Data
Comments
x8 x16 x8 x16
READ 93C56 (Note 8) 1 10 A8−A0 A7−A0
Read Address
AN–A0
93C57 1 10 A7−A0 A6−A0
ERASE 93C56 (Note 8) 1 11 A8−A0 A7−A0
Clear Address
AN–A0
93C57 1 11 A7−A0 A6−A0
WRITE 93C56 (Note 8) 1 01 A8−A0 A7−A0 D7−D0 D15−D0
Write Address
AN–A0
93C57 1 01 A7−A0 A6−A0 D7−D0 D15−D0
EWEN 93C56 (Note 8) 1 00 11XXXXXXX 11XXXXXX
Write Enable
93C57 1 00 11XXXXXX 11XXXXX
EWDS 93C56 (Note 8) 1 00 00XXXXXXX 00XXXXXX
Write Disable
93C57 1 00 00XXXXXX 00XXXXX
ERAL 93C56 (Note 8) 1 00 10XXXXXXX 10XXXXXX
Clear All
Addresses
93C57 1 00 10XXXXXX 10XXXXX
WRAL 93C56 (Note 8) 1 00 01XXXXXXX 01XXXXXX D7−D0 D15−D0
Write All
Addresses
93C57 1 00 01XXXXXX 01XXXXX D7−D0 D15−D0
8. Address bit A8 for 256x8 organization and A7 for 128x16 organization are “Don’t Care” bits, but must be kept at either a “1” or “0” for READ,
WRITE and ERASE commands.

CAT93C56LI-G

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
EEPROM (256x8)/(128x16) 2K
Lifecycle:
New from this manufacturer.
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