Nexperia
74CB3Q3253
Dual 1-of-4 FET multiplexer/demultiplexer with charge pump
74CB3Q3253 All information provided in this document is subject to legal disclaimers. © Nexperia B.V. 2017. All rights reserved.
Product data sheet Rev. 1 — 14 August 2017
8 / 17
10.3 ON resistance test circuit and graph
aaa-027229
GND
nA nBn
nOE
Sn
V
IL
or V
IH
V
IL
V
CC
V
I
V
SW
I
SW
V
I
(V)
0 542 31
aaa-027230
16
12
8
4
R
ON
(Ω)
0
(1)
(2)
R
ON
= V
SW
/ I
SW
T
amb
= 25 °C
(1) V
CC
= 2.5 V
(2) V
CC
= 3.3 V
Figure 7. Test circuit for measuring ON resistance (one
channel)
Figure 8. Typical ON resistance as a function of input
voltage
11 Dynamic characteristics
Table 8. Dynamic characteristics
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); for test circuit, see Figure 11.
T
amb
= -40 °C to +85 °CSymbol Parameter Conditions
Min Max
Unit
nA to nBn or nBn to nA; see Figure 9
[1]
[2]
V
CC
= 2.3 V to 2.7 V - 0.12 ns
V
CC
= 3.0 V to 3.6 V - 0.2 ns
Sn to nA; see Figure 9
[1]
V
CC
= 2.3 V to 2.7 V 1.5 6.7 ns
t
pd
propagation
delay
V
CC
= 3.0 V to 3.6 V 1.5 5.9 ns
nOE to nA, nBn; see Figure 10
[1]
V
CC
= 2.3 V to 2.7 V 1.5 6.7 ns
V
CC
= 3.0 V to 3.6 V 1.5 5.9 ns
Sn to nBn; see Figure 10
[1]
V
CC
= 2.3 V to 2.7 V 1.5 6.7 ns
t
en
enable time
V
CC
= 3.0 V to 3.6 V 1.5 5.9 ns
