IC specification
MLX10803
High power LED driver
3901010803 Page 12/25
Data Sheet
Rev026 Jun/2012
6. Automotive test pulses
The following chapter is valid for a completely assembled module. That means that automotive test pulses are
applied to the module and not to the single IC.
In the recommended application according to chapter 1.1, the reverse polarity diode together with the capacitors
on the supply and the load dump protected IC itself protect the module against the automotive test pulses listed
below.
The exact values of the capacitors for the application have to be figured out according to the automotive and
EMI requirements.
No damage occurs for any of the test pulses. A deviation of the IC’s characteristics is allowed during pulse 1, 2, 4;
the module returns to normal operation after the pulse without any additional action.
During test pulse 3a, 3b, 5 the module operates within characteristic limits.
Functional status
Transient test pulses in accordance to ISO7
& 3. Pin VREF goes outside of module via
resistor of 47kΩ
ΩΩ
Ω. Module schematic is according to application notes mentioned in 1.1.1.
Test pulse #1 at module pins VBAT,
VS/PWM. VREF_SET, IC pin IREF1 ->
GND
vpulse1 -100 V 5000 pulses,
functional state C
Test pulse #2 at module pins VBAT,
VS/PWM. VREF_SET, IC pin IREF1 ->
GND
vpulse2 100 V 5000 pulses
functional state C
Test pulse #3a at module pins VBAT,
VS/PWM. VREF_SET, IC pin IREF1 ->
GND
vpulse3a -150 V 1h,
functional state A
Test pulse #3b at module pins VBAT,
VS/PWM. VREF_SET, IC pin IREF1 ->
GND
vpulse3b 100 V 1h,
functional state A
Test pulse #4 at module pin VBAT,
VS/PWM, VREF_SET -> GND
vspulse4
vapulse4
-6
-5
-4
-2.5
V
V
1 pulse,
functional state C
Test pulse #5 at IC pin VS/PWM -> GND vpulse5 45 85 V functional state C
Description of functional status:
A: All functions of the module are performed as designed during and after the disturbance.
B: All functions of the module are performed as designed during and after the disturbance:
However, one or more can deviate from specified tolerance. All functions return automatically
to normal limits after exposure is removed. Memory functions shall remain class A.
C: A function of the module is not performed as designed during disturbance but returns automatically to
a normal operation after the disturbance.
