HEF40193B All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 8 — 18 November 2011 10 of 19
NXP Semiconductors
HEF40193B
4-bit up/down binary counter
[1] The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (C
L
in pF).
t
su
set-up time Dn to PL;
see Figure 6
5 V 160 80 - ns
10 V 6030- ns
15 V 5025- ns
t
h
hold time Dn to PL;
see Figure 6
5 V +10 70 - ns
10 V +5 25 - ns
15 V +5 20 - ns
Table 7. Dynamic characteristics
…continued
V
SS
= 0 V; T
amb
= 25
C; for test circuit see Figure 7; unless otherwise specified.
Symbol Parameter Conditions V
DD
Extrapolation formula
[1]
Min Typ Max Unit
Table 8. Dynamic power dissipation P
D
P
D
can be calculated from the formulas shown. V
SS
= 0 V; t
r
= t
f
20 ns; T
amb
= 25
C.
Symbol Parameter V
DD
Typical formula for P
D
(W) where:
P
D
dynamic power dissipation 5 V P
D
= 600 f
i
+ (f
o
C
L
) V
DD
2
f
i
= input frequency in MHz,
f
o
= output frequency in MHz,
C
L
= output load capacitance in pF,
V
DD
= supply voltage in V,
(f
o
C
L
) = sum of the outputs.
10 V P
D
= 2700 f
i
+ (f
o
C
L
) V
DD
2
15 V P
D
= 7500 f
i
+ (f
o
C
L
) V
DD
2
HEF40193B All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 8 — 18 November 2011 11 of 19
NXP Semiconductors
HEF40193B
4-bit up/down binary counter
11. Waveforms
a. Propagation delays and output transition times
b. PL and MR recovery times, CPU, CPD, PL and MR minimum pulse widths, and Dn to PL set-up and hold times
V
OH
and V
OL
are typical output voltage levels that occur with the output load.
Set-up and hold times are shown as positive values but may be specified as negative values.
The shaded area is where the data can change for predictable performance.
Measurement points are given in Table 9
.
Fig 6. Waveforms showing switching times
001aak070
MR input
V
I
0 V
CPU or CPD
input
V
I
0 V
V
I
V
M
V
M
t
PLH
t
PLH
t
PHL
t
PHL
t
PHL
t
PHL
t
t
t
t
0 V
V
I
0 V
Qn output
90 %
10 %
V
OH
V
OL
TCU input
TCD input
001aae585
CPU or CPD
input
PL input
Dn input
t
W
V
M
V
M
V
I
0 V
MR input
t
W
V
M
t
rec
t
W
V
M
t
rec
t
su
t
h
V
I
0 V
V
I
0 V
V
I
0 V
HEF40193B All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 8 — 18 November 2011 12 of 19
NXP Semiconductors
HEF40193B
4-bit up/down binary counter
a. Input waveforms
b. Test circuit
Test data is given in Table 9.
Definitions for test circuit:
C
L
= Load capacitance including jig and probe capacitance;
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
Fig 7. Test circuit for switching times
V
M
V
M
t
W
t
W
10 %
90 %
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
90 %
10 %
t
f
t
r
t
r
t
f
001aaj781
V
DD
V
I
V
O
001aag182
DUT
C
L
R
T
G
Table 9. Measurement points and test data
Supply voltage Input Load
V
I
V
M
t
r
, t
f
C
L
5Vto15V V
DD
0.5V
I
20 ns 50 pF

HEF40193BT,653

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
Counter Shift Registers 4-BIT U/D BIN COUNTR
Lifecycle:
New from this manufacturer.
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