Document Number: MMA7330L
Rev 2, 8/2007
Freescale Semiconductor
Technical Data
© Freescale Semiconductor, Inc., 2007. All rights reserved.
±4g, ±12g Three Axis Low-g
Micromachined Accelerometer
The MMA7330L is a low power, low profile capacitive micromachined
accelerometer featuring signal conditioning, a 1-pole low pass filter,
temperature compensation, self test, and g-Select which allows for the
selection between 2 sensitivities. Zero-g offset and sensitivity are factory set
and require no external devices. The MMA7330L includes a Sleep Mode that
makes it ideal for handheld battery powered electronics.
Features
3mm x 5mm x 1.0mm LGA-14 Package
Low Current Consumption: 400 μA
Sleep Mode: 3 μA
Low Voltage Operation: 2.2 V – 3.6 V
Selectable Sensitivity (±4g, ±12g)
Fast Turn On Time (0.5 ms Enable Response Time)
Self Test for Freefall Detect Diagnosis
Signal Conditioning with Low Pass Filter
Robust Design, High Shocks Survivability
RoHS Compliant
Environmentally Preferred Product
Low Cost
Typical Applications
3D Gaming: Tilt and Motion Sensing, Event Recorder
HDD MP3 Player: Freefall Detection
Laptop PC: Freefall Detection, Anti-Theft
Cell Phone: Image Stability, Text Scroll, Motion Dialing, E-Compass
Pedometer: Motion Sensing
PDA: Text Scroll
Navigation and Dead Reckoning: E-Compass Tilt Compensation
Robotics: Motion Sensing
ORDERING INFORMATION
Part Number
Temperature
Range
Package
Drawing
Package Shipping
MMA7330LT
–40 to +85°C 1935-01 LGA-14 Tray
MMA7330LR2
–40 to +85°C 1935-01 LGA-14 Tape & Reel
MMA7330L
MMA7330L: XYZ AXIS
ACCELEROMETER
±4g, ±12g
14 LEAD
LGA
CASE 1935-01
Bottom View
Figure 1. Pin Connections
Top View
2
7
8
9
10
11
12
13
14
N/C
X
OUT
Z
OUT
Y
OUT
V
SS
V
DD
Sleep
N/C
N/C
g-Select
Self Test
N/C
N/C
N/C
1
3
4
5
6
Sensors
2 Freescale Semiconductor
MMA7330L
Figure 2. Simplified Accelerometer Functional Block Diagram
ELECTRO STATIC DISCHARGE (ESD)
WARNING: This device is sensitive to electrostatic
discharge.
Although the Freescale accelerometer contains internal
2000 V ESD protection circuitry, extra precaution must be
taken by the user to protect the chip from ESD. A charge of
over 2000 volts can accumulate on the human body or
associated test equipment. A charge of this magnitude can
alter the performance or cause failure of the chip. When
handling the accelerometer, proper ESD precautions should
be followed to avoid exposing the device to discharges which
may be detrimental to its performance.
Table 1. Maximum Ratings
(Maximum ratings are the limits to which the device can be exposed without causing permanent damage.)
Rating Symbol Value Unit
Maximum Acceleration (all axis) g
max
±5000 g
Supply Voltage V
DD
–0.3 to +3.6 V
Drop Test
(1)
1. Dropped onto concrete surface from any axis.
D
drop
1.8 m
Storage Temperature Range T
stg
40 to +125 °C
Sleep
Self Test
C to V
CONVERTER
X
OUT
Y
OUT
Z
OUT
OSCILLATOR
CLOCK
GEN
g-Select
X-TEMP
COMP
G-CELL
SENSOR
GAIN
+
FILTER
CONTROL LOGIC
NVM TRIM
CIRCUITS
Y-TEMP
COMP
Z-TEMP
COMP
V
DD
V
SS
SELFTEST
Sleep
Self Test
C to V
CONVERTER
X
OUT
Y
OUT
Z
OUT
OSCILLATOR
CLOCK
GEN
g-Select
X-TEMP
COMP
G-CELL
SENSOR
GAIN
+
FILTER
CONTROL LOGIC
NVM TRIM
CIRCUITS
Y-TEMP
COMP
Z-TEMP
COMP
V
DD
V
SS
SELFTEST
Sensors
Freescale Semiconductor 3
MMA7330L
Table 2. Operating Characteristics
Unless otherwise noted: –20°C < T
A
< 85°C, 2.2 V < V
DD
< 3.6 V, Acceleration = 0g, Loaded output
(1)
Characteristic Symbol Min Typ Max Unit
Operating Range
(2)
Supply Voltage
(3)
Supply Current
(4)
Supply Current at Sleep Mode
(4)
Operating Temperature Range
Acceleration Range, X-Axis, Y-Axis, Z-Axis
g-Select: 0
g-Select: 1
V
DD
I
DD
I
DD
T
A
g
FS
g
FS
2.2
-40
2.8
400
3
±4
±12
3.6
600
10
+85
V
μA
μA
°C
g
g
Output Signal
Zero g (T
A
= 25°C, V
DD
= 2.8 V)
(5), (6)
Zero g
(4)
Sensitivity (T
A
= 25°C, V
DD
= 2.8 V)
4g
12g
Sensitivity
(4)
Bandwidth Response
XY
Z
Output Impedance
V
OFF
V
OFF
, T
A
S
4g
S
12g
S,T
A
f
-3dBXY
f
-3dBZ
Z
O
1.316
289.5
75.2
1.4
±2.0
308
83.6
±0.03
400
300
32
1.484
326.5
91.9
V
mg/°C
mV/g
mV/g
%/°C
Hz
Hz
kΩ
Self Test
Output Response
X
OUT
, Y
OUT
Z
OUT
Input Low
Input High
Δg
STXY
Δg
STZ
V
IL
V
IH
+0.05
+0.8
V
SS
0.7 V
DD
-0.1
+1.0
+1.2
0.3 V
DD
V
DD
g
g
V
V
Noise
Power Spectral Density RMS (0.1 Hz – 1 kHz)
(4)
n
PSD
350 μg/
Control Timing
Power-Up Response Time
(7)
Enable Response Time
(8)
Self Test Response Time
(9)
Sensing Element Resonant Frequency
XY
Z
Internal Sampling Frequency
t
RESPONSE
t
ENABLE
t
ST
f
GCELLXY
f
GCELLZ
f
CLK
1.0
0.5
2.0
6.0
3.4
11
2.0
2.0
5.0
ms
ms
ms
kHz
kHz
kHz
Output Stage Performance
Full-Scale Output Range (I
OUT
= 30 µA) V
FSO
V
SS
+0.1 V
DD
–0.1 V
Nonlinearity, X
OUT
, Y
OUT
, Z
OUT
NL
OUT
-1.0 +1.0 %FSO
Cross-Axis Sensitivity
(10)
V
XY, XZ, YZ
-5.0 +5.0 %
1. For a loaded output, the measurements are observed after an RC filter consisting of an internal 32kΩ resistor and an external 3.3nF capacitor
(recommended as a minimum to filter clock noise) on the analog output for each axis and a 0.1μF capacitor on V
DD
- GND. The output sensor
bandwidth is determined by the Capacitor added on the output. f = 1/2π * (32 x 10
3
) * C. C = 3.3 nF corresponds to BW = 1507HZ, which is
the minimum to filter out internal clock noise.
2. These limits define the range of operation for which the part will meet specification.
3. Within the supply range of 2.2 and 3.6 V, the device operates as a fully calibrated linear accelerometer. Beyond these supply limits the device
may operate as a linear device but is not guaranteed to be in calibration.
4. This value is measured with g-Select in 4g mode.
5. The device can measure both + and – acceleration. With no input acceleration the output is at midsupply. For positive acceleration the output
will increase above V
DD
/2. For negative acceleration, the output will decrease below V
DD
/2.
6. For optimal 0g offset performance, adhere to AN3484 and AN3447.
7. The response time between 10% of full scale Vdd input voltage and 90% of the final operating output voltage.
8. The response time between 10% of full scale Sleep Mode input voltage and 90% of the final operating output voltage.
9. The response time between 10% of the full scale self test input voltage and 90% of the self test output voltage.
10. A measure of the device’s ability to reject an acceleration applied 90° from the true axis of sensitivity.
Hz

MMA7330L

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
ACCELEROMETER 4-12G ANALOG 14LGA
Lifecycle:
New from this manufacturer.
Delivery:
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