4
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. B
04/18/05
IS41LV16105B ISSI
®
Functional Description
The IS41LV16105B is a CMOS DRAM optimized for high-
speed bandwidth, low power applications. During READ or
WRITE cycles, each bit is uniquely addressed through the
16 address bits. These are entered ten bits (A0-A9) at a
time. The row address is latched by the Row Address
Strobe (RAS). The column address is latched by the
Column Address Strobe (CAS). RAS is used to latch the
first nine bits and CAS is used the latter nine bits.
The IS41LV16105B has two CAS controls, LCAS and
UCAS. The LCAS and UCAS inputs internally generates a
CAS signal functioning in an identical manner to the single
CAS input on the other 1M x 16 DRAMs. The key difference
is that each CAS controls its corresponding I/O tristate
logic (in conjunction with OE and WE and RAS). LCAS
controls I/O0 through I/O7 and UCAS controls I/O8 through
I/O15.
The IS41LV16105B CAS function is determined by the first
CAS (LCAS or UCAS) transitioning LOW and the last
transitioning back HIGH. The two CAS controls give the
IS41LV16105B both BYTE READ and BYTE WRITE cycle
capabilities.
Memory Cycle
A memory cycle is initiated by bring RAS LOW and it is
terminated by returning both RAS and CAS HIGH. To
ensures proper device operation and data integrity any
memory cycle, once initiated, must not be ended or
aborted before the minimum tRAS time has expired. A new
cycle must not be initiated until the minimum precharge
time tRP, tCP has elapsed.
Read Cycle
A read cycle is initiated by the falling edge of CAS or OE,
whichever occurs last, while holding WE HIGH. The
column address must be held for a minimum time speci-
fied by tAR. Data Out becomes valid only when tRAC, tAA,
tCAC and tOEA are all satisfied. As a result, the access time
is dependent on the timing relationships between these
parameters.
Write Cycle
A write cycle is initiated by the falling edge of CAS and WE,
whichever occurs last. The input data must be valid at or
before the falling edge of CAS or WE, whichever occurs
last.
Refresh Cycle
To retain data, 1,024 refresh cycles are required in each
16 ms period. There are two ways to refresh the memory.
1. By clocking each of the 1,024 row addresses (A0
through A9) with RAS at least once every 16 ms. Any
read, write, read-modify-write or RAS-only cycle re-
freshes the addressed row.
2. Using a CAS-before-RAS refresh cycle. CAS-before-
RAS refresh is activated by the falling edge of RAS,
while holding CAS LOW. In CAS-before-RAS refresh
cycle, an internal 9-bit counter provides the row ad-
dresses and the external address inputs are ignored.
CAS-before-RAS is a refresh-only mode and no data
access or device selection is allowed. Thus, the output
remains in the High-Z state during the cycle.
Power-On
After application of the VDD supply, an initial pause of
200 µs is required followed by a minimum of eight
initialization cycles (any combination of cycles contain-
ing a RAS signal).
During power-on, it is recommended that RAS track with
VDD or be held at a valid VIH to avoid current surges.
Integrated Silicon Solution, Inc. — 1-800-379-4774
5
Rev. B
04/18/05
IS41LV16105B ISSI
®
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Parameters Rating Unit
VT Voltage on Any Pin Relative to GND 3.3V –0.5 to +4.6 V
VDD Supply Voltage 3.3V –0.5 to +4.6 V
IOUT Output Current 50 mA
PD Power Dissipation 1 W
T
A Commercial Operation Temperature 0 to +70 °C
Extended Temperature –30 to +85 °C
Industrial Temperature –40 to +85 °C
TSTG Storage Temperature –55 to +125 °C
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent
damage to the device. This is a stress rating only and functional operation of the device at these
or any other conditions above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect
reliability.
RECOMMENDED OPERATING CONDITIONS (Voltages are referenced to GND.)
Symbol Parameter Min. Typ. Max. Unit
VDD Supply Voltage 3.3V 3.0 3.3 3.6 V
VIH Input High Voltage 3.3V 2.0 VDD + 0.3 V
VIL Input Low Voltage 3.3V –0.3 0.8 V
TA Commercial Ambient Temperature 0 +70 °C
Extended Ambient Temperature –30 +85 °C
Industrial Ambient Temperature –40 +85 °C
CAPACITANCE
(1,2)
Symbol Parameter Max. Unit
CIN1 Input Capacitance: A0-A9 5 pF
CIN2 Input Capacitance: RAS, UCAS, LCAS, WE, OE 7pF
CIO Data Input/Output Capacitance: I/O0-I/O15 7 pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: T
A = 25°C, f = 1 MHz,
6
Integrated Silicon Solution, Inc. — 1-800-379-4774
Rev. B
04/18/05
IS41LV16105B ISSI
®
ELECTRICAL CHARACTERISTICS
(1)
(Recommended Operating Conditions unless otherwise noted.)
Symbol Parameter Test Condition Speed Min. Max. Unit
IIL Input Leakage Current Any input 0V VIN VDD –5 5 µA
Other inputs not under test = 0V
I
IO Output Leakage Current Output is disabled (Hi-Z) 5 5 µA
0V VOUT VDD
VOH Output High Voltage Level IOH = –2.0 mA (3.3V) 2.4 V
VOL Output Low Voltage Level IOL = 2.0 mA (3.3V) 0.4 V
ICC1 Standby Current: TTL RAS, LCAS, UCAS VIH
Commerical 3.3V 1 mA
Extended/Industrial 3.3V 2 mA
ICC2 Standby Current: CMOS
RAS, LCAS, UCAS VDD – 0.2V
3.3V 0.5 mA
I
CC3 Operating Current: RAS, LCAS, UCAS, -50 160 mA
Random Read/Write
(2,3,4)
Address Cycling, tRC = tRC (min.) -60 145
Average Power Supply Current
ICC4 Operating Current: RAS = VIL, LCAS, UCAS, -50 90 mA
Fast Page Mode
(2,3,4)
Cycling tPC = tPC (min.) -60 80
Average Power Supply Current
ICC5 Refresh Current: RAS Cycling, LCAS, UCAS VIH -50 160 mA
RAS-Only
(2,3)
tRC = tRC (min.) -60 145
Average Power Supply Current
ICC6 Refresh Current: RAS, LCAS, UCAS Cycling -50 160 mA
CBR
(2,3,5)
tRC = tRC (min.) -60 145
Average Power Supply Current
Notes:
1. An initial pause of 200 µs is required after power-up followed by eight RAS refresh cycles (RAS-Only or CBR) before proper device
operation is assured. The eight RAS cycles wake-up should be repeated any time the t
REF refresh requirement is exceeded.
2. Dependent on cycle rates.
3. Specified values are obtained with minimum cycle time and the output open.
4. Column-address is changed once each Fast page cycle.
5. Enables on-chip refresh and address counters.

IS41LV16105B-60KLI-TR

Mfr. #:
Manufacturer:
ISSI
Description:
DRAM 16M 1Mx16 60ns
Lifecycle:
New from this manufacturer.
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