MT41K512M16TNA-125 M:E TR

Table 3: 96-Ball FBGA – x16 Ball Descriptions
Symbol Type Description
A[14:13], A12/BC#,
A11, A10/AP, A[9:0]
Input Address inputs: Provide the row address for ACTIVATE commands, and the column
address and auto precharge bit (A10) for READ/WRITE commands, to select one
location out of the memory array in the respective bank. A10 sampled during a
PRECHARGE command determines whether the PRECHARGE applies to one bank
(A10 LOW, bank selected by BA[2:0]) or all banks (A10 HIGH). The address inputs also
provide the op-code during a LOAD MODE command. Address inputs are referenced
to V
REFCA
. A12/BC#: When enabled in the mode register (MR), A12 is sampled during
READ and WRITE commands to determine whether burst chop (on-the-fly) will be
performed (HIGH = BL8 or no burst chop, LOW = BC4). See Truth Table – Command in
the DDR3 SDRAM data sheet.
BA[2:0] Input Bank address inputs: BA[2:0] define the bank to which an ACTIVATE, READ,
WRITE, or PRECHARGE command is being applied. BA[2:0] define which mode
register (MR0, MR1, MR2, or MR3) is loaded during the LOAD MODE command.
BA[2:0] are referenced to V
REFCA
.
CK, CK# Input Clock: CK and CK# are differential clock inputs. All control and address input signals
are sampled on the crossing of the positive edge of CK and the negative edge of
CK#. Output data strobe (DQS, DQS#) is referenced to the crossings of CK and CK#.
CKE[1:0] Input Clock enable: CKE enables (registered HIGH) and disables (registered LOW) internal
circuitry and clocks on the DRAM. The specific circuitry that is enabled/disabled is de-
pendent upon the DDR3 SDRAM configuration and operating mode. Taking CKE
LOW provides PRECHARGE POWER-DOWN and SELF REFRESH operations (all banks
idle),or active power-down (row active in any bank). CKE is synchronous for power-
down entry and exit and for self refresh entry. CKE is asynchronous for self refresh
exit. Input buffers (excluding CK, CK#, CKE, RESET#, and ODT) are disabled during
POWER-DOWN. Input buffers (excluding CKE and RESET#) are disabled during SELF
REFRESH. CKE is referenced to V
REFCA
.
CS#[1:0] Input Chip select: CS# enables (registered LOW) and disables (registered HIGH) the
command decoder. All commands are masked when CS# is registered HIGH. CS# pro-
vides for external rank selection on systems with multiple ranks. CS# is considered
part of the command code. CS# is referenced to V
REFCA
.
LDM Input Input data mask: LDM is a lower-byte, input mask signal for write data. Lower-byte
input data is masked when LDM is sampled HIGH along with the input data during a
write access. Although the LDM ball is input-only, the LDM loading is designed to
match that of the DQ and DQS balls. LDM is referenced to V
REFDQ
.
ODT[0:1] Input On-die termination: ODT enables (registered HIGH) and disables (registered LOW)
termination resistance internal to the DDR3 SDRAM. When enabled in normal
operation, ODT is only applied to each of the following balls: DQ[15:0], LDQS,
LDQS#, UDQS, UDQS#, LDM, and UDM for the x16; DQ0[7:0], DQS, DQS#, DM/TDQS,
and NF/TDQS# (when TDQS is enabled) for the x8; DQ[3:0], DQS, DQS#, and DM for
the x4. The ODT input is ignored if disabled via the LOAD MODE command. ODT is
referenced to V
REFCA
.
RAS#, CAS#, WE# Input Command inputs: RAS#, CAS#, and WE# (along with CS#) define the command
being entered and are referenced to V
REFCA
.
8Gb: x16 TwinDie DDR3L SDRAM
Ball Assignments and Descriptions
PDF: 09005aef84ccb467
DDR3L_8Gb_x16_2CS_TwinDie.pdf - Rev. D 10/13 EN
4
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2012 Micron Technology, Inc. All rights reserved.
Table 3: 96-Ball FBGA – x16 Ball Descriptions (Continued)
Symbol Type Description
RESET# Input Reset: RESET# is an active LOW CMOS input referenced to V
SS
. The RESET# input re-
ceiver is a CMOS input defined as a rail-to-rail signal with DC HIGH 0.8 × V
DD
and
DC LOW 0.2 × V
DDQ
. RESET# assertion and de-assertion are asynchronous.
UDM Input Input data mask: UDM is an upper-byte input mask signal for write data. Upper-
byte input data is masked when UDM is sampled HIGH along with that input data
during a WRITE access. Although the UDM ball is input-only, the UDM loading is
designed to match that of the DQ and DQS balls. UDM is referenced to V
REFDQ
.
DQ[7:0] I/O Data input/output: Lower byte of bidirectional data bus for the x16 configuration.
DQ[7:0] are referenced to V
REFDQ
.
DQ[15:8] I/O Data input/output: Upper byte of bidirectional data bus for the x16 configuration.
DQ[15:8] are referenced to V
REFDQ
.
LDQS, LDQS# I/O Lower byte data strobe: Output with read data. Edge-aligned with read data.
Input with write data. Center-aligned to write data.
UDQS, UDQS# I/O Upper byte data strobe: Output with read data. Edge-aligned with read data.
Input with write data. DQS is center-aligned to write data.
V
DD
Supply Power supply: 1.35V, 1.283–1.45V.
V
DDQ
Supply DQ power supply: 1.35V, 1.283–1.45V.
V
REFCA
Supply Reference voltage for control, command, and address: V
REFCA
must be
maintained at all times (including self refresh) for proper device operation.
V
REFDQ
Supply Reference voltage for data: V
REFDQ
must be maintained at all times (excluding self
refresh) for proper device operation.
V
SS
Supply Ground.
V
SSQ
Supply DQ ground: Isolated on the device for improved noise immunity.
ZQ[1:0] Reference External reference ball for output drive calibration: This lower byte ball is tied
to an external 240Ω resistor (RZQ), which is tied to V
SSQ
.
NC No connect: These balls should be left unconnected (the ball has no connection to
the DRAM or to other balls).
8Gb: x16 TwinDie DDR3L SDRAM
Ball Assignments and Descriptions
PDF: 09005aef84ccb467
DDR3L_8Gb_x16_2CS_TwinDie.pdf - Rev. D 10/13 EN
5
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2012 Micron Technology, Inc. All rights reserved.
Functional Description
The TwinDie DDR3L SDRAM is a high-speed, CMOS dynamic random access memory
device internally configured as two 8-bank DDR3L SDRAM devices.
Although each die is tested individually within the dual-die package, some TwinDie test
results may vary from a like die tested within a monolithic die package.
The DDR3L SDRAM uses a double data rate architecture to achieve high-speed opera-
tion. The double data rate architecture is an 8n-prefetch architecture with an interface
designed to transfer two data words per clock cycle at the I/O balls. A single read or
write access consists of a single 8n-bit-wide, one-clock-cycle data transfer at the inter-
nal DRAM core and eight corresponding n-bit-wide, one-half-clock-cycle data transfers
at the I/O balls.
The differential data strobe (DQS, DQS#) is transmitted externally, along with data, for
use in data capture at the DDR3L SDRAM input receiver. DQS is center-aligned with da-
ta for WRITEs. The read data is transmitted by the DDR3L SDRAM and edge-aligned to
the data strobes.
Read and write accesses to the DDR3L SDRAM are burst-oriented. Accesses start at a
selected location and continue for a programmed number of locations in a program-
med sequence. Accesses begin with the registration of an ACTIVATE command, which is
then followed by a READ or WRITE command. The address bits registered coincident
with the ACTIVATE command are used to select the bank and row to be accessed. The
address bits (including CSn#, BAn, and An) registered coincident with the READ or
WRITE command are used to select the rank, bank, and starting column location for the
burst access.
This data sheet provides a general description, package dimensions, and the package
ballout. Refer to the Micron monolithic DDR3L data sheet for complete information re-
garding individual die initialization, register definition, command descriptions, and die
operation.
Industrial Temperature
The industrial temperature (IT) option, if offered, requires that the case temperature
not exceed –40°C or 95°C. JEDEC specifications require the refresh rate to double when
T
C
exceeds 85°C; this also requires use of the high-temperature self refresh option. Addi-
tionally, ODT resistance, I
DD
values, some IDD specifications and the input/output im-
pedance must be derated when T
C
is < 0°C or > 95°C. See the DDR3 monolithic data
sheet for details.
8Gb: x16 TwinDie DDR3L SDRAM
Functional Description
PDF: 09005aef84ccb467
DDR3L_8Gb_x16_2CS_TwinDie.pdf - Rev. D 10/13 EN
6
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2012 Micron Technology, Inc. All rights reserved.

MT41K512M16TNA-125 M:E TR

Mfr. #:
Manufacturer:
Micron
Description:
IC DRAM 8G PARALLEL 96FBGA
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New from this manufacturer.
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