3-1
TM
AN9822
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HI5767EVAL1 Evaluation Board User’s Manual
Description
The HI5767EVAL1 evaluation board allows the circuit
designer to evaluate the performance of the Intersil HI5767
monolithic 10-bit 20/40/60MSPS analog-to-digital converter
(ADC). As shown in the Evaluation Board Functional Block
Diagram, the evaluation board includes sample clock
generation circuitry, a single-ended to differential analog
input amplifier configuration, an on board external variable
reference voltage generator and a digital data output
header/connector. The digital data outputs are conveniently
provided for easy interfacing to a ribbon connector or logic
probes. In addition, the evaluation board includes some
prototyping area for the addition of user designed custom
interfaces or circuits.
The sample clock generator circuit accepts the external
sampling signal through an SMA type RF connector, J2. This
input is AC-coupled and terminated in 50 allowing for
connection to most laboratory signal generators. In addition,
the duty cycle of the clock driving the A/D converter is
adjustable by way of a potentiometer. This allows the effects
of sample clock duty cycle on the HI5767 to be observed.
The analog input signal is also connected through an SMA
type RF connector, J1, and applied to a single-ended to
differential analog input amplifier. This input is AC-coupled
and terminated in 50 allowing for connection to most
laboratory signal generators. Also, provisions for a
differential RC lowpass filter are incorporated on the output
of the differential amplifier to limit the broadband noise going
into the HI5767 converter.
The converters’ digital data outputs along with two phases
of the sample clock (CLK and
CLK) are provided at the
output header/connector. With this output configuration the
digital data output transitions seen at the I/O
header/connector are essentially time aligned with the
rising edge of the sampling clock (CLK) or the falling edge
of the out of phase sampling clock (
CLK).
Refer to the component layout and the evaluation board
electrical schematic for the following discussions.
Evaluation Board Functional Block Diagram
+5V
D
V
REFIN
V
REFOUT
V
IN
-
G = +1
10
CLOCK
DIGITAL
DGND
AGND
D
0
-D
9
HI5767
ANALOG
50
+5V
D
+5V
A
-5V
A
50
OUT
DATA
V
IN
+
CLK
INPUT
OUT
CLK
(D0 - D9)
G = -1
1.2V
BANDGAP
VOLTAGE
REFERENCE
SAMPLE
CLOCK
INPUT
+2.5V
GAIN
VAR
CLK
BIAS
TEE
J2
J1
Application Note January 1999
3-2
External Reference Voltage Generator,
V
REFOUT
and V
REFIN
The HI5767 has an internal reference voltage generator,
therefore no external reference voltage is required. The
evaluation board, however, offers the ability to use the
converters’ internal reference voltage, V
REFOUT
, or the on
board external variable reference voltage generator.
The external variable reference voltage circuitry is
implemented using the Intersil ICL8069 low voltage, 1.2V,
bandgap reference (D1) sourcing a non-inverting variable
gain operational amplifier circuit based on the Intersil
HA5127 ultra-low noise precision operational amplifier (U1).
Potentiometer VR1 is used to adjust the output voltage level
of this external voltage reference. With this the user is able
to observe the effects of reference voltage variations on the
converters performance. Turning VR1 in a clockwise (CW)
direction will decrease the external reference voltage while
turning VR1 in a counterclockwise (CCW) direction will
decrease the external reference voltage.
Selection of the reference voltage to be used by the
converter is accomplished by placing the P3 header jumper
across the appropriate pins. The converters’ internal
reference voltage generator, V
REFOUT
, must be connected
to V
REFIN
when using the converters internal reference and
is selected by placing the P3 header jumper across P3-2 and
P3-3. Alternately, if it is desired to use the on board external
variable reference voltage generator, selection of this option
is done by placing the P3 header jumper across P3-1 and
P3-2. See Appendix A, Board Layout for the location of the
P3 reference voltage selection header.
Analog Input
The fully differential analog input of the HI5767 A/D can be
configured in various ways depending on the signal source
and the required level of performance.
Differential Analog Input Configuration
A fully differential connection (Figure 1) will yield the best
performance from the HI5767 A/D converter. Since the
HI5767 is powered off a single +5V supply, the analog input
must be biased so it lies within the analog input common
mode voltage range of 0.25V to 4.75V. Figure 2 illustrates
the differential analog input common mode voltage, VDC,
range that the converter will accommodate. The
performance of the converter does not change significantly
with the value of the analog input common mode voltage.
A DC bias voltage source, V
DC
, equal to 3.0V (typical), is
made available to the user to help simplify circuit design
when using an AC coupled differential input. This low output
impedance voltage source is not designed to be a reference
but makes an excellent DC bias source and stays well within
the analog input common mode voltage range over
temperature.
For the AC coupled differential input (Figure 1) and with
V
REFIN
connected to V
REFOUT
, full scale is achieved when
the V
IN
and -V
IN
input signals are 0.5V
P-P
, with -V
IN
being
180 degrees out of phase with V
IN
. The converter will be at
positive full scale when the V
IN
+ input is at V
DC
+ 0.25V and
the V
IN
- input is at V
DC
- 0.25V (V
IN
+-V
IN
- = +0.5V).
Conversely, the converter will be at negative full scale when
the V
IN
+ input is equal to V
DC
- 0.25V and V
IN
- is at
V
DC
+ 0.25V (V
IN
+-V
IN
- = -0.5V).
It should be noted that overdriving the analog input beyond
the ±0.5V fullscale input voltage range will not damage the
converter as long as the overdrive voltage stays within the
converters analog supply voltages. In the event of an
overdrive condition the converter will recover within one
sample clock cycle.
FIGURE 2A.
FIGURE 2B.
FIGURE 2C.
FIGURE 2. DIFFERENTIAL ANALOG INPUT COMMON MODE
VOLTAGE RANGE
V
IN
+
V
DC
V
IN
-
HI5767
V
IN
-V
IN
FIGURE 1. AC COUPLED DIFFERENTIAL INPUT
V
IN
+V
IN
-
0.5V
P-P
VDC = 4.75V
+5V
+5V
V
IN
+
V
IN
-
0.5V
P-P
0.25V < VDC < 4.75V
0V
V
IN
+
V
IN
-
0.5V
P-P
VDC = 0.25V
0V
Application Note 9822
3-3
The evaluation board provides a single-ended to differential
analog front-end for converting the typical laboratory signal
generators 50 single-ended output to a differential input
signal for the converters differential-in-differential-out
sample-and-hold front end. The evaluation boards analog
front end is implemented utilizing two Intersil HFA1109
450MHz, low power, current feedback video operational
amplifiers. One operational amplifier of the analog front-
end, U3, is configured in a unity gain configuration, A
V
=1,
driving the non-inverting input of the converter while the
second operational amplifier, U4, is configured in an
inverting-gain of one, A
V
= -1, configuration driving the
inverting input of the converter. The input of this analog
front-end, RF SMA connector J1, is AC coupled and
provides a termination impedance of 50. It should be
pointed out that provision for increasing the gain of the
single-ended to differential analog front-end has been
provided. For the non-inverting amplifier a location for R3 is
present but not utilized for the unity gain configuration but
could be installed to change the gain of this amplifier. Of
course, it would also be necessary to match the magnitude
of the new gain in the inverting amplifier signal path. It is
recommended that the user refer to the HFA1109 data
sheets and application notes for specific details on making
any changes to these amplifier configurations.
Evaluation Board Layout and Power
Supplies
The HI5767 evaluation board is a four layer board with a
layout optimized for the best performance of the converter.
This application note includes an electrical schematic of the
evaluation board, a component parts list, a component
placement layout drawing and reproductions of the various
board layers used in the board stack-up. The user should
feel free to copy the layout in their application.
The HI5767 monolithic A/D converter has been designed
with separate analog and digital supply and ground pins to
keep digital noise out of the analog signal path. The
evaluation board provides separate low impedance analog
and digital ground planes on layer 2. Since the analog and
digital ground planes are connected together at a single
point where the power supplies enter the board, DO NOT tie
them together back at the power supplies.
The analog and digital supplies are also kept separate on
the evaluation board and should be driven by clean linear
regulated supplies. The external power supplies are
hooked up with the twisted pair wires soldered to the plated
through holes marked +5VAIN, +5VA1IN, -5VAIN, +5VDIN,
+5VD1IN, +5VD2IN, AGND and DGND near the
prototyping area. +5VDIN, +5VD1IN and +5VD2IN are
digital supplies and are returned to DGND. +5VAIN,
+5VA1IN and -5VAIN are the analog supplies and are
returned to AGND. Table 1 lists the operational supply
voltages, typical current consumption and the evaluation
board circuit function being powered. Single supply
operation of the converter is possible but the overall
performance of the converter may degrade.
Sample Clock Driver
In order to ensure rated performance of the HI5767, the duty
cycle of the sample clock should be held at 50% ±5%. It must
also have low phase noise and operate at standard TTL levels.
It can be difficult to find a low phase noise generator that will
provide a 60MHz squarewave at TTL logic levels.
Consequently, the HI5767EVAL1 evaluation board is
designed with a logic inverter (U5) acting as a voltage
comparator to generate the sampling clock for the HI5767
when a sinewave (<±1.5V) is applied to the AC-coupled, 50
terminated CLK input through SMA type RF connector, J2,
of the evaluation board. The sample clock sinewave is AC
coupled into the input of the inverter and a discrete bias tee
is used to bias the sinewave around the trigger level of the
inverter’s input. A potentiometer (VR2) varies the DC bias
voltage added to the sinewave input allowing the user to
adjust the duty cycle of the sampling clock to obtain the best
performance from the ADC and to evaluate the effects of
sample clock duty cycle on the performance of the converter.
The trigger level for the sample clock input to the HI5767
converter is approximately 1.5V. Therefore, the duty cycle of
the sampling clock should be measured at the 1.5V trigger
level of the HI5767 sample clock input pin.
The sinewave to logic level comparator drives a series of
additional inverters that provide isolation between the three
sample clocks used on the evaluation board. One clock is
used to drive the converter sample clock input pin and the
other two provide CLK and
CLK at the data output
header/connector, P2. The clock/data relationship at the P2
output connector is as follows. CLK has rising edges aligned
with digital data transitions and
CLK has rising edges
aligned mid-bit.
TABLE 1. HI5767EVAL1 EVALUATION BOARD POWER
SUPPLIES
POWER
SUPPLY
NOMINAL
VALUE
CURRENT
(TYP)
FUNCTION(S)
SUPPLIED
+5VAIN 5.0V ±5% 26mA Analog Input and
External Reference
Voltage Operational
Amplifiers, Bandgap
Reference
-5VAIN -5.0V ±5% 24mA Analog Input and
External Reference
Voltage Operational
Amplifiers
+5VA1IN 5.0V ±5% 50mA A/D AV
CC
+5VDIN 5.0V ±5% 63mA Sample Clock
Generation
+5VD1IN 5.0V ±5% 20mA A/D DV
CC1
+5VD2IN 3.0V ±10% 5mA A/D DV
CC2
Application Note 9822

HI5767EVAL1

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
Data Conversion IC Development Tools HI5767 LW FREQUENCY EVALUATION PLATFORM
Lifecycle:
New from this manufacturer.
Delivery:
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