EVAL-ADUM4136EBZ

EVAL-ADuM4136EBZ User Guide
UG-1019
One Technology Way P. O. Box 9106 Norwood, MA 02062-9106, U.S.A. Te l: 781.329.4700 Fax: 781.461.3113 www.analog.com
Evaluation Board for the ADuM4136 iCoupler, Dual-Supply, High Voltage, Isolated
IGBT Gate Driver
PLEASE SEE THE LAST PAGE FOR AN IMPORTANT
WARNING AND LEGAL TERMS AND CONDITIONS.
Rev. 0 | Page 1 of 5
FEATURES
4 A peak drive output capability
Output power device resistance: <1 Ω
Desaturation protection
Isolated fault output
Soft shutdown on fault
Isolated fault and ready functions
Low propagation delay: <50 ns
Operating temperature range: −40°C to +125°C
Output voltage range to 35 V
Output and input undervoltage lockout (UVLO)
Pad placement for multiple switch types
Screw terminals for easy connectivity
Jumpered enable/disable
EVALUATION KIT CONTENTS
EVAL-ADuM4136EBZ evaluation board
EQUIPMENT NEEDED
Suggested test equipment
Primary side power supply: 0 V to 6 V at 100 mA
Secondary side supply: 0 V to 35 V at 250 mA
Optional secondary supply: 0 V to 15 V at 250 mA
Square wave generator: 0 V to 5 V
GENERAL DESCRIPTION
The EVAL-ADuM4136EBZ evaluation board supports the
ADuM4136 single-channel gate driver, which is specifically
optimized for driving insulated gate bipolar transistors (IGBTs).
Analog Devices, Inc., iCoupler® technology provides isolation
between the input signal and the output gate driver.
The ADuM4136 provides operation with voltages of up to 35 V.
With a dual-rail supply, the negative rail can go as low as −15 V,
providing robust turn off of the IGBT.
The EVAL-ADuM4136EBZ evaluation board facilitates testing
of the desaturation circuitry with pads available for standard
desaturation detection. The evaluation board has layout locations
for three different types of discrete switches, allowing for a wide
range of device testing. Screw terminals provide easy access to
supplying the secondary side with either a single or dual supply.
For complete information about the ADuM4136, refer to the
product data sheet that should be consulted in conjunction
with this user guide when using the evaluation board.
14754-001
Figure 1. Picture of the EVAL-ADuM4136EBZ in Stock Configuration
UG-1019 EVAL-ADuM4136EBZ User Guide
Rev. 0 | Page 2 of 5
TABLE OF CONTENTS
Features .............................................................................................. 1
Evaluation Kit Contents ................................................................... 1
Equipment Needed ........................................................................... 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Setting Up the EVAL-ADuM4136EBZ .......................................... 3
Initial Configuration .....................................................................3
Pad Layout for the Device Under Test (DUT)...........................3
Power Connections .......................................................................3
Input/Output Connections ..........................................................3
Bill of Materials ..............................................................................4
REVISION HISTORY
7/2016—Revision 0: Initial Version
EVAL-ADuM4136EBZ User Guide UG-1019
Rev. 0 | Page 3 of 5
SETTING UP THE EVAL-ADUM4136EBZ
INITIAL CONFIGURATION
Before the first use, certain steps must be completed to prepare
the board for operation. In the stock configuration, the R1 to R6
resistors are not placed. These are the locations of the series external
resistors for the charging and discharging paths to V
OUT_ON
and
V
OUT_OFF
. It is recommended to use 1206 surface-mount resistors
with values between approximately 1 Ω and 10 Ω, depending on
the load being driven. An actual IGBT or MOSFET can be placed
in the provided landing patterns to the right of P1. P1 allows
shorting across the series external resistors to observe overshoot
and/or allow the user to probe voltage to quantify peak currents.
In the stock configuration, the desaturation circuitry is left
open. Before the first use, if desaturation functionality is not
used, it is recommended to short the DESAT pin to ground,
either by a wire or by placing a 0 Ω resistor in the C6 component
pad. Failure to do so results in a desaturation fault being
observed on the first rising edge of the output.
If the desaturation circuitry is tested, an IGBT or MOSFET
must be added to the circuit to allow for the DESAT pin to be
pulled down during on times, preventing the desaturation fault.
Additionally, C6 (C
BLANK
), R12 (R
BLANK
), and D1 must have the
appropriate components placed. For details about sizing, refer
to the ADuM4136 data sheet. R11 is provided to allow extra
DESAT pin blanking current by means of an external pull-up
resistor. C7 can provide decoupling for this external pull-up
current source, if desired.
R13 and R14 come with 10 kΩ resistors in place. These resistors
provide pull-ups to the READY and
FAULT
pins. P2 allows for
easy enabling and disabling of the device by means of jumper
pins. A silkscreen reminder is included to show which pins to
short to enable or disable the device. R8 and R10 allow for easy
placement of 50 Ω terminating resistors, if desired.
Pins accompany the screw terminals. The user can decide which
connection mechanism to use. Do not leave VSS2 floating. It
must always be at or less than the potential of GND2. Shorting
VSS2 and GND2 is a valid operating point.
During operation, if a fault is seen, the
FAULT
pin is brought
low. In this case, the device can be reset by either powering
down VDD1 to GND1 and powering back up, or by bringing
the
RESET
pin low then high again. The easiest way to toggle
RESET
is to remove the jumper on P3 from Pin 2 and Pin 3 and
then replace it. An internal pull-down resistor brings
RESET
low on its own.
PAD LAYOUT FOR THE DEVICE UNDER TEST (DUT)
Figure 4 shows the top layer artwork for the dual-gate driver circuit.
U1 is the footprint for the ADuM4136.
C1, C2, and C5 are 0.1 µF bypass capacitors; C3 and C4 are
10 µF bypass capacitors. C7 is provided as an extra space in
case more decoupling is desired. C6 allows for a desaturation
blanking capacitor to be placed.
Q1, Q2, and Q3 can be populated with TO-252 MOSFETs
or IGBTs with the pinout shown in Figure 2.
R1 to R6 are gate resistors that control the edges of the
outputs. By default, no resistors are installed; these resistors
must be populated with low value 1206 resistors, generally
in the 1 Ω to 10 Ω range.
2
C/D
1
G
3
E/S
14754-002
Figure 2. IGBT/MOSFET Footprint
POWER CONNECTIONS
Follow these steps to connect the ADuM4136 evaluation board
to the power supply:
1. Connect the 5 V or 3.3 V input supply with the positive
terminal on VDD1 and the ground on VSS1.
2. Connect the ADuM4136 VDD2 supply voltage (12 V to
35 V) to the VDD2 pin and its return to the VSS2 pin.
VSS1 and VSS2 are functionally isolated. The emitter/source of
the IGBT/MOSFET is tied to GND2.
INPUT/OUTPUT CONNECTIONS
The VI+ and VI− pins are complementary metal oxide semicon-
ductor (CMOS) inputs. R8 and R10 are provided in case the user
needs to terminate the inputs with a 50 Ω load.
R7 and R9 are provided to add damping, if needed. However, in
most cases, the 0 Ω resistors in the stock configuration can
remain on R7 and R9.
The ADuM4136 evaluation board comes with screw terminals
for both the input and output connections. These terminals are
to facilitate connection options but are not the best option for
high performance transient testing. The best measurements
performed on the load, whether it is an IGBT or MOSFET or a
load capacitor, come from small loop measurements performed
right at the load. Using the screw terminals as either the sensing
node or for the connection of the load often results in overshoot
being observed during measurement.

EVAL-ADUM4136EBZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Evaluation Board for the ADuM4136 iCoupler, Dual-Supply, High Voltage, Isolated IGBT Gate Drive
Lifecycle:
New from this manufacturer.
Delivery:
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