74ALVCH16373 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 6 — 10 July 2012 12 of 18
NXP Semiconductors
74ALVCH16373
2.5 V/3.3 V 16-bit D-type transparent latch; 3-state
12. Test information
Test data is given in Table 9.
Definitions for test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
V
EXT
= External voltage for measuring switching times.
Fig 10. Load circuit for measuring switching times
V
EXT
V
CC
V
I
V
O
mna616
DUT
C
L
R
T
R
L
R
L
G
Table 9. Test data
Supply voltage Input Load V
EXT
V
CC
V
I
t
r
, t
f
C
L
R
L
t
PLH
, t
PHL
t
PLZ
, t
PZL
t
PHZ
, t
PZH
2.3 V to 2.7 V and
< 2.3 V
V
CC
2.0 ns 30 pF 500 open 2 V
CC
GND
2.7 V 2.7 V 2.5 ns 50 pF 500 open 2 V
CC
GND
3.0 V to 3.6 V 2.7 V 2.5 ns 50 pF 500 open 2 V
CC
GND
