CFast 2 HS
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© 2014 Apacer Technology Inc. Rev. 1.7
4. Product Specification
4.1 Capacity
Table 4-1: Capacity specifications
Capacity Total bytes* Cylinders Heads Sectors Max LBA
4 GB 4,011,614,208 7773 16 63 7,835,184
8 GB 8,012,390,400 15525 16 63 15,649,200
16 GB 16,013,942,784 16383 16 63 31,277,232
32 GB 32,017,047,552 16383 16 63 62,533,296
64 GB 64,023,257,088 16383 16 63 125,045,424
*Display of total bytes varies from file systems.**Cylinders, heads or sectors are not applicable for these capacities. Only LBA
addressing applies LBA count addressed in the table above indicates total user storage capacity and will remain the same
throughout the lifespan of the device. However, the total usable capacity of the CFast is most likely to be less than the total physical
capacity because a small portion of the capacity is reserved for device maintenance usages.
4.2 Performance
Performance of CFast 2 HS product family is available as shown in Table 4-2.
Table 4-2: Performance table
Capacity
Performance
4 GB 8 GB 16 GB 32 GB 64 GB
Sustained Read (MB/s) 220 220 285 285 285
Sustained Write (MB/s) 60 65 135 260 260
Note: Performances results are measured by CrystalDiskMark under Windows 7 and may vary from host system
configurations.
4.3 Environmental Specifications
Environmental specification of the CFast 2 HS follows the military standards, shown in Table 4-3.
Table 4-3 Environmental specification
Environment Specification
C to 7C (Operating) / -40°C to 85°C (extended)*
Temperature
-40°C to 100°C (Non-operating)
Vibration
Non-operating : Sine wave,
15(G), 10~2000(Hz),
Operating : Random,
7.69(Grms), 20~2000(Hz)
Shock
Non-operating: Acceleration, 1,500 G, 0.5 ms
Operating: Peak acceleration, 50 G, 11 ms
Note: this Environmental Specification table indicates the conditions for testing the device. Real world usages may affect the results.
*Available in 8, 16, 32, and 64GB models
CFast 2 HS
AP-CFAxxxxACAD-XXT
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© 2014 Apacer Technology Inc. Rev. 1.7
4.4 Mean Time Between Failures (MTBF)
Mean Time Between Failures (MTBF) is predicted based on reliability data for the individual components
in CFast 2 HS. Serving as statistical reference, the prediction result for CFast 2 HS is more than
2,000,000 hours.
Notes about the MTBF:
The MTBF is predicated and calculated based on “Telcordia Technologies Special Report, SR-332, Issue
2” method.
4.5 Certification and Compliance
CFast 2 HS complies with the following standards
CE
FCC
RoHS
MIL-STD
CFast 2 HS
AP-CFAxxxxACAD-XXT
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© 2014 Apacer Technology Inc. Rev. 1.7
5. Flash Management
5.1 Error Correction/Detection
Apacer implements a hardware ECC scheme, based on the BCH algorithm. It can detect and correct up
to 40 bits error in 1K bytes.
5.2 Bad Block Management
Current production technology is unable to guarantee total reliability of NAND flash memory array. When
a flash memory device leaves factory, it comes with a minimal number of initial bad blocks during
production or out-of-factory as there is no currently known technology that produce flash chips free of bad
blocks. In addition, bad blocks may develop during program/erase cycles. When host performs
program/erase command on a block, bad block may appear in Status Register. Since bad blocks are
inevitable, the solution is to keep them in control. Apacer flash devices are programmed with ECC, block
mapping technique and S.M.A.R.T to reduce invalidity or error. Once bad blocks are detected, data in
those blocks will be transferred to free blocks and error will be corrected by designated algorithms.
5.3 Wear Leveling
Flash memory devices differ from Hard Disk Drives (HDDs) in terms of how blocks are utilized. For HDDs,
when a change is made to stored data, like erase or update, the controller mechanism on HDDs will
perform overwrites on blocks. Unlike HDDs, flash blocks cannot be overwritten and each P/E cycle wears
down the lifespan of blocks gradually. Repeatedly program/erase cycles performed on the same memory
cells will eventually cause some blocks to age faster than others. This would bring flash storages to their
end of service term sooner. Wear leveling is an important mechanism that level out the wearing of blocks
so that the wearing-down of blocks can be almost evenly distributed. This will increase the lifespan of
SSDs. Commonly used wear leveling types are Static and Dynamic.
5.4 Power Failure Management
Power Failure Management plays a crucial role when experiencing unstable power supply. Power
disruption may occur when users are storing data into the SSD. In this urgent situation, the controller
would run multiple write-to-flash cycles to store the metadata for later block rebuilding. This urgent
operation requires about several milliseconds to get it done. At the next power up, the firmware will
perform a status tracking to retrieve the mapping table and resume previously programmed NAND blocks
to check if there is any incompleteness of transmission.
5.5 ATA Secure Erase
ATA Secure Erase is an ATA disk purging command currently embedded in most of the storage drives.
Defined in ATA specifications, (ATA) Secure Erase is part of Security Feature Set that allows storage
drives to erase all user data areas. The erase process usually runs on the firmware level as most of the
ATA-based storage media currently in the market are built-in with this command. ATA Secure Erase can
securely wipe out the user data in the drive and protects it from malicious attack.

APCFA004GACAD-AT

Mfr. #:
Manufacturer:
Apacer
Description:
Memory Cards CFast 2 HS 4GB
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New from this manufacturer.
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