© 2007 Microchip Technology Inc. DS21293C-page 1
MCP3001
Features
10-bit resolution
±1 LSB max DNL
±1 LSB max INL
On-chip sample and hold
SPI™ serial interface (modes 0,0 and 1,1)
Single supply operation: 2.7V - 5.5V
200 ksps sampling rate at 5V
75 ksps sampling rate at 2.7V
Low power CMOS technology
- 5 nA typical standby current, 2 µA max
- 500 µA max active current at 5V
Industrial temp range: -40°C to +85°C
8-pin PDIP, SOIC, MSOP and TSSOP packages
Applications
Sensor Interface
Process Control
Data Acquisition
Battery Operated Systems
Description
The Microchip Technology Inc. MCP3001 is a succes-
sive approximation 10-bit A/D converter (ADC) with on-
board sample and hold circuitry. The device provides a
single pseudo-differential input. Differential Nonlinear-
ity (DNL) and Integral Nonlinearity (INL) are both spec-
ified at ±1 LSB max. Communication with the device is
done using a simple serial interface compatible with the
SPI protocol. The device is capable of sample rates up
to 200 ksps at a clock rate of 2.8 MHz. The MCP3001
operates over a broad voltage range (2.7V - 5.5V).
Low current design permits operation with a typical
standby current of only 5 nA and a typical active current
of 400 µA. The device is offered in 8-pin PDIP, MSOP,
TSSOP and 150 mil SOIC packages.
Package Types
Functional Block Diagram
V
REF
IN+
IN–
V
SS
V
DD
CLK
D
OUT
CS/SHDN
1
2
3
4
8
7
6
5
PDIP, MSOP, SOIC, TSSOP
MCP3001
Illustration not to scale
Comparator
Sample
and
Hold
10-Bit SAR
DAC
Control Logic
CS/SHDN
V
REF
IN+
IN-
V
SS
V
DD
CLK
D
OUT
Shift
Register
2.7V 10-Bit A/D Converter with SPI Serial Interface
SPI™ is a trademark of Motorola Inc.
MCP3001
DS21293C-page 2 © 2007 Microchip Technology Inc.
1.0 ELECTRICAL
CHARACTERISTICS
1.1 Maximum Ratings*
V
DD
.........................................................................7.0V
All inputs and outputs w.r.t. V
SS
...... -0.6V to V
DD
+0.6V
Storage temperature ..........................-65°C to +150°C
Ambient temp. with power applied .....-65°C to +125°C
ESD protection on all pins (HBM)........................> 4kV
*Notice: Stresses above those listed under “Maximum ratings”
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at those or
any other conditions above those indicated in the operational
listings of this specification is not implied. Exposure to maxi-
mum rating conditions for extended periods may affect device
reliability.
PIN FUNCTION TABLE
ELECTRICAL CHARACTERISTICS
Name Function
V
DD
+2.7V to 5.5V Power Supply
V
SS
Ground
IN+ Positive Analog Input
IN- Negative Analog Input
CLK Serial Clock
D
OUT
Serial Data Out
CS/SHDN Chip Select/Shutdown Input
V
REF
Reference Voltage Input
All parameters apply at V
DD
= 5V, V
SS
= 0V, V
REF
= 5V, T
AMB
= -40°C to +85°C, f
SAMPLE
= 200 ksps and f
CLK
= 14*f
SAMPLE
,
unless otherwise noted. Typical values apply for V
DD
= 5V, T
AMB
=25°C, unless otherwise noted.
Parameter Sym Min Typ Max Units Conditions
Conversion Rate:
Conversion Time t
CONV
10 clock
cycles
Analog Input Sample Time t
SAMPLE
1.5 clock
cycles
Throughput Rate f
SAMPLE
200
75
ksps
ksps
V
DD
= V
REF
= 5V
V
DD
= V
REF
= 2.7V
DC Accuracy:
Resolution 10 bits
Integral Nonlinearity INL ±0.5 ±1 LSB
Differential Nonlinearity DNL ±0.25 ±1 LSB No missing codes over tem-
perature
Offset Error ±1.5 LSB
Gain Error ±1 LSB
Dynamic Performance:
Total Harmonic Distortion THD -76 dB V
IN
= 0.1V to 4.9V@1 kHz
Signal to Noise and Distortion
(SINAD)
SINAD 61 dB V
IN
= 0.1V to 4.9V@1 kHz
Spurious Free Dynamic Range SFDR 80 dB V
IN
= 0.1V to 4.9V@1 kHz
Reference Input:
Voltage Range V
REF
0.25 V
DD
VNote 2
Current Drain I
REF
—90
0.001
150
3
µA
µA CS
= V
DD
= 5V
Note 1: This parameter is guaranteed by characterization and not 100% tested.
2: See graph that relates linearity performance to V
REF
level.
3: Because the sample cap will eventually lose charge, clock rates below 10 kHz can affect linearity perfor-
mance, especially at elevated temperatures.
© 2007 Microchip Technology Inc. DS21293C-page 3
MCP3001
Temperature Ranges:
Specified Temperature Range T
A
-40 +85 °C
Operating Temperature Range T
A
-40 +85 °C
Storage Temperature Range T
A
-65 +150 °C
Thermal Package Resistance:
Thermal Resistance, 8L-PDIP
θ
JA
—85°C/W
Thermal Resistance, 8L-SOIC θ
JA
—163°C/W
Thermal Resistance, 8L-MSOP
θ
JA
—206°C/W
Thermal Resistance, 8L-TSSOP θ
JA
——°C/W
Analog Inputs:
Input Voltage Range (IN+) IN+ IN- V
REF
+IN- V
Input Voltage Range (IN-) IN- V
SS
-100 V
SS
+100 mV
Leakage Current 0.001 ±1 µA
Switch Resistance R
SS
—1K Ω See Figure 4-1
Sample Capacitor C
SAMPLE
20 pF See Figure 4-1
Digital Input/Output:
Data Coding Format Straight Binary
High Level Input Voltage V
IH
0.7 V
DD
——V
Low Level Input Voltage V
IL
——0.3 V
DD
V
High Level Output Voltage V
OH
4.1 V I
OH
= -1 mA, V
DD
= 4.5V
Low Level Output Voltage V
OL
——0.4VI
OL
= 1 mA, V
DD
= 4.5V
Input Leakage Current I
LI
-10 10 µA V
IN
= V
SS
or V
DD
Output Leakage Current I
LO
-10 10 µA V
OUT
= V
SS
or V
DD
Pin Capacitance
(all inputs/outputs)
C
IN
, C
OUT
10 pF V
DD
= 5.0V (Note 1)
T
AMB
= 25°C, f = 1 MHz
Timing Parameters:
Clock Frequency f
CLK
——2.8
1.05
MHz
MHz
V
DD
= 5V (Note 3)
V
DD
= 2.7V (Note 3)
Clock High Time t
HI
160 ns
Clock Low Time t
LO
160 ns
CS
Fall To First Rising CLK Edge t
SUCS
100 ns
CLK Fall To Output Data Valid t
DO
125
200
ns
ns
V
DD
= 5V, See Figure 1-2
V
DD
= 2.7, See Figure 1-2
CLK Fall To Output Enable t
EN
125
200
ns
ns
V
DD
= 5V, See Figure 1-2
V
DD
= 2.7, See Figure 1-2
CS Rise To Output Disable t
DIS
100 ns See test circuits, Figure 1-2
(Note 1)
CS
Disable Time t
CSH
350 ns
D
OUT
Rise Time t
R
100 ns See test circuits, Figure 1-2
(Note 1)
D
OUT
Fall Time t
F
100 ns See test circuits, Figure 1-2
(Note 1)
All parameters apply at V
DD
= 5V, V
SS
= 0V, V
REF
= 5V, T
AMB
= -40°C to +85°C, f
SAMPLE
= 200 ksps and f
CLK
= 14*f
SAMPLE
,
unless otherwise noted. Typical values apply for V
DD
= 5V, T
AMB
=25°C, unless otherwise noted.
Parameter Sym Min Typ Max Units Conditions
Note 1: This parameter is guaranteed by characterization and not 100% tested.
2: See graph that relates linearity performance to V
REF
level.
3: Because the sample cap will eventually lose charge, clock rates below 10 kHz can affect linearity perfor-
mance, especially at elevated temperatures.

MCP3001T-I/ST

Mfr. #:
Manufacturer:
Microchip Technology
Description:
Analog to Digital Converters - ADC 10-bit SPI Sgl Chl IND TEMP, TSSOP8
Lifecycle:
New from this manufacturer.
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