MC100ES6220AER2

Advanced Clock Drivers Devices
Freescale Semiconductor 7
MC100ES6220
APPLICATIONS INFORMATION
Using the Thermally Enhanced Package of the
MC100ES6220
The MC100ES6220 uses a thermally enhanced exposed
pad (EP) 52 lead LQFP package. The package is molded so
that the lead frame is exposed at the surface of the package
bottom side. The exposed metal pad will provide the low
thermal impedance that supports the power consumption of
the MC100ES6220 high-speed bipolar integrated circuit and
eases the power management task for the system design. A
thermal land pattern on the printed circuit board and thermal
vias are recommended in order to take advantage of the
enhanced thermal capabilities of the MC100ES6220. Direct
soldering of the exposed pad to the thermal land will provide
an efficient thermal path. In multilayer board designs, thermal
vias thermally connect the exposed pad to internal copper
planes. Number of vias, spacing, via diameters and land
pattern design depend on the application and the amount of
heat to be removed from the package. A nine thermal via
array, arranged in a 3 x 3 array and using a 1.2 mm pitch in
the center of the thermal land is a requirement for
MC100ES6220 applications on multi-layer boards. The
recommended thermal land design comprises a 3 x 3 thermal
via array as shown in Figure 6, providing an efficient heat
removal path.
Figure 6. Recommended thermal land pattern
The via diameter is should be approx. 0.3 mm with 1 oz.
copper via barrel plating. Solder wicking inside the via
resulting in voids during the solder process must be avoided.
If the copper plating does not plug the vias, stencil print solder
paste onto the printed circuit pad. This will supply enough
solder paste to fill those vias and not starve the solder joints.
The attachment process for exposed pad package is
equivalent to standard surface mount packages. Figure 7
shows a recommend solder mask opening with respect to the
recommended 3 x 3 thermal via array. Because a large solder
mask opening may result in a poor release, the opening
should be subdivided as shown in Figure 7. For the nominal
package standoff 0.1 mm, a stencil thickness of 5 to 8 mils
should be considered.
Figure 7. Recommended Solder Mask Openings
For thermal system analysis and junction temperature
calculation the thermal resistance parameters of the package
is provided:
It is recommended that users employ thermal modeling
analysis to assist in applying the general recommendations
to their particular application. The exposed pad of the
MC100ES6220 package does not have an electrical low
impedance path to the substrate of the integrated circuit and
its terminals. The thermal land should be connected to GND
through connection of internal board layers.
4.8
Thermal via array (3x3),
1.2 mm pitch,
0.3 mm diameter
Exposed pad
land pattern
all units mm
4.8
Table 8. Thermal Resistance
(1)
1. Applicable for a 3 x 3 thermal via array.
ConvectionL
FPM
R
THJA
(2)
°C/W
2. Junction to ambient, four conductor layer test board (2S2P),
per JES51-7 and JESD 51-5.
R
THJA
(3)
°C/W
3. Junction to ambient, single layer test board, per JESD51-3.
R
THJC
°C/W
R
THJB
(4)
°C/W
4. Junction to board, four conductor layer test board (2S2P) per
JESD 51-8.
Natural 20 48
4
(5)
29
(6)
5. Junction to exposed pad.
6. Junction to top of package.
16
100 18 47
200 17 46
400 16 43
800 15 41
Exposed pad land
pattern
4.8
Thermal via array (3x3),
1.2 mm pitch,
0.3 mm diameter
1.0
0.2
all units mm
4.8
1.0
0.2
MC100ES6220
Low Voltage Dual 1:10 Differential ECL/PECL Clock Fanout Buffer NETCOM
IDT™ Low Voltage Dual 1:10 Differential ECL/PECL Clock Fanout Buffer
Freescale Timing Solutions Organization has been acquired by Integrated Device Technology, Inc
MC100ES6220
7
Advanced Clock Drivers Devices
8 Freescale Semiconductor
MC100ES6220
PACKAGE DIMENSIONS
CASE 1336A-01
ISSUE O
52-LEAD LQFP PACKAGE
NOTES:
1.
2.
3.
4.
5.
6.
7.
8.
DIMENSIONS ARE IN MILLIMETERS.
INTERPRET DIMENSIONS AND TOLERANCES PER
ASME Y14.5M, 1994.
DATUMS A, B AND D TO BE DETERMINED AT DATUM
PLANE H.
DIMENSION TO BE DETERMINED AT SEATING PLANE
C.
THIS DIMENSION DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR PROTRUSION
SHALL NOT CAUSE THE LEAD WIDTH TO EXCEED
0.46 mm. DAMBAR CANNOT BE LOCATED ON THE
LOWER RADIUS OR THE FOOT. MINIMUM SPACE
BETWEEN PROTRUSION AND ADJACENT LEAD
SHALL NOT BE LESS THAN 0.07 mm.
THIS DIMENSION DOES NOT INCLUDE MOLD
PROTRUSION. ALLOWABLE PROTRUSION IS 0.25mm
PER SIDE. THIS DIMENSION IS MAXIMUM PLSTIC
BODY SIZE DIMENSION INCLUDING MOLD MISMATCH.
EXACT SHAPE OF EACH CORNER IS OPTIONAL.
THESE DIMENSIONS APPLY TO THE FLAT SECTION
OF THE LEAD BETWEEN 0.10mm AND 0.25mm FROM
THE LEAD TIP.
52
0.2 H A-B D
1
40
39
14
13
26
27
B
5
10
4X 4X 13 TIPS
0.2 C A-B D
A
D
PIN 1
INDEX
7
6
5
6
12
10
12
4
4
4
4
6
6
6
6
B
B
0.65
48X
X=A, B OR D
C
L
VIEW Y
X
0.05
0.25
GAUGE PLANE
1.3
(0.2)
R
(1)
0.75
0.20
VIEW AA
1.5
0.05
0.45
0˚ MIN
0.20
0.08
R
0.20
0.08
(12˚)
4X
SEATING
PLANE
1.7 MAX
VIEW AA
0.1
C
C
H
A-B
M
0.08 DC
52X
0.40
JJ
0.22
52X
5
(12˚)
4X
SECTION B-B
0.20
PLATING
BASE METAL
8
8
8
8
0.35
(0.3)
0.09
0.20
0.07
0.16
4.78
4.58
VIEW J-J
EXPOSED PAD
VIEW Y
4.78
4.58
MC100ES6220
Low Voltage Dual 1:10 Differential ECL/PECL Clock Fanout Buffer NETCOM
IDT™ Low Voltage Dual 1:10 Differential ECL/PECL Clock Fanout Buffer
Freescale Timing Solutions Organization has been acquired by Integrated Device Technology, Inc
MC100ES6220
8
© 2006 Integrated Device Technology, Inc. All rights reserved. Product specifications subject to change without notice. IDT and the IDT logo are trademarks of Integrated Device
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PART NUMBERS
INSERT PRODUCT NAME AND DOCUMENT TITLE NETCOM
MPC92459
900 MHz Low Voltage LVDS Clock Synthesizer NETCOM
MC100ES6220
Low Voltage Dual 1:10 Differential ECL/PECL Clock Fanout Buffer NETCOM

MC100ES6220AER2

Mfr. #:
Manufacturer:
IDT
Description:
Clock Buffer FSL Dual 1-10 Diff LVPECL Fanout Buffer
Lifecycle:
New from this manufacturer.
Delivery:
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