Reliability
Micron’s SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and
firmware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 6: Uncorrectable Bit Error Rate
Uncorrectable Bit Error Rate Operation
<1 sector per 10
15
bits read READ
Mean Time to Failure
Mean time to failure (MTTF) for the SSD can be predicted based on the component reli-
ability data using the methods referenced in the Telcordia SR-332 reliability prediction
procedures for electronic equipment.
Table 7: MTTF
Density MTTF (Operating Hours)
1
32GB 1.2 million
64GB 1.2 million
Note:
1. The product achieves a mean time to failure (MTTF) of 1.2 million hours, based on popu-
lation statistics not relevant to individual units.
Endurance
Endurance for the SSD can be predicted based on the usage conditions applied to the
device, the internal NAND component cycles, the write amplification factor, and the
wear-leveling efficiency of the drive. The table below shows the drive lifetime for each
SSD density based on predefined usage conditions.
Table 8: Drive Lifetime
Density Drive Lifetime (Total Bytes Written)
32GB 36TB
64GB 36TB
Notes:
1. Total bytes written calculated with the drive 90% full.
2. Access patterns are 50% sequential and 50% random and consist of the following: 5%
are 4k; 5% are 8k; 10% are 16k; 10% are 32k; 35% are 64K; and 35% are 128k.
3. GB/day can be calculated by dividing the total bytes written value by (365 × number of
years). For example: 36 TB/5 years/365 days = 20 GB/day for 5 years.
C400v mSATA NAND Flash SSD
Reliability
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Electrical Characteristics
Stresses greater than those listed may cause permanent damage to the device. This is a
stress rating only, and functional operation of the device at these or any other condi-
tions above those indicated in the operational sections of this specification is not im-
plied. Exposure to absolute maximum rating conditions for extended periods may affect
reliability.
Table 9: mSATA Power Consumption
Density Idle Average Active Average
Sequential Write/Read Maximum
(128k transfer) Unit
32GB <65 150 1900 1600
64GB <65 150 2400 1700 mW
Notes:
1. Data taken at 25°C using a 6 Gb/s SATA interface.
2. Active average power measured while running MobileMark
®
2007 Productivity Suite.
3. DIPM (device-initiated power management) enabled.
4. Sequential power measured in IOMETER MAX with 128KB transfer size.
Table 10: Maximum Ratings
Parameter/Condition Symbol Min Max Unit
Voltage input 3V3 3.14 3.46 V
Operating temperature T
C
0 70 °C
Non-operating temperature –40 85 °C
Rate of temperature change 20 °C/hour
Relative humidity (non-condensing) 5 95 %
Notes:
1. Temperature is best measured with a thermocouple attached to the center point of the
drive controller ASIC package. This is the larger package closest to the interface connec-
tor on the primary side. Refer to the Package Dimensions for details.
2. Supply voltage slew rate during asynchronous power-down should follow a slope of no
steeper than 60 mV/ms.
3. Power-off sequence: When the Micron C400 SSD is shut down, the ATA STANDBY IMME-
DIATE (STBI) command should be the last command sent by the host and acknowledged
by the SSD. Failure to follow this process could result in a longer than normal time-to-
ready(TTR) during the subsequent power-on sequence. TTR is the time from power-on
to drive ready to accept SATA commands.
Table 11: Shock and Vibration
Parameter/Condition Specification
Operating shock 1500 G/1.0ms
Operating vibration 2–500Hz at 3.1G
C400v mSATA NAND Flash SSD
Electrical Characteristics
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Device ID
Table 12: Identity Device
See Note 1 for setting definitions
Word Bit(s) Setting Default Value Description
0 General configuration bit-significant information
15 F 0b 0 = ATA device
14–8 X 0000100b Retired
7 F 0b 1 = removable media device
6 F 1b Obsolete
5–3 X 000b Retired
2 V 0b Response incomplete
1 X 0b Retired
0 F 0b Reserved
1 3FFFh Obsolete
2 F C837h Specific configuration
3 F 0010h Obsolete
4 F 0000h 0000h Retired
6 F 003Fh Obsolete
7 (O)V 0000h 0000h
Reserved for assignment by the CompactFlash Association
9 ( )X 0000h Retired
10 (M)F varies Serial number (20 ASCII characters)
20 ( )X 0000h 0000h
0000h
Retired/Obsolete
23 (M)F varies Firmware revision (8 ASCII characters)
27 (M)F varies Model number (40 ASCII characters)
47 15–8 F 80h 80h
7–0 F 10h 00h = Reserved
01h-FFh = Maximum number of logical sectors that shall be
transferred per DRQ data block on READ/WRITE MULTIPLE
commands
48 Trusted Computing feature set options
15 F 0b Shall be cleared to zero
14 F 1b Shall be set to one
13–1 F 0000000000000b Reserved for the Trusted Computing Group
0 F 0b 1=Trusted Computing feature set is support
C400v mSATA NAND Flash SSD
Device ID
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Micron Technology, Inc. reserves the right to change products or specifications without notice.
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MTFDDAT064MAM-1J1

Mfr. #:
Manufacturer:
Micron
Description:
SSD 64GB MSATA MLC SATA III 3.3V
Lifecycle:
New from this manufacturer.
Delivery:
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