IRF9310TRPBF

IRF9310PbF
4 www.irf.com
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
Fig 8. Maximum Safe Operating Area
Fig 9. Maximum Drain Current vs.
Ambient Temperature
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 10. Threshold Voltage vs. Temperature
0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1
-V
SD
, Source-to-Drain Voltage (V)
0.10
1.00
10.00
100.00
1000.00
-
I
S
D
,
R
e
v
e
r
s
e
D
r
a
i
n
C
u
r
r
e
n
t
(
A
)
T
J
= 25°C
T
J
= 150°C
V
GS
= 0V
1E-006 1E-005 0.0001 0.001 0.01 0.1 1 10 100 1000
t
1
, Rectangular Pulse Duration (sec)
0.0001
0.001
0.01
0.1
1
10
100
T
h
e
r
m
a
l
R
e
s
p
o
n
s
e
(
Z
t
h
J
A
)
°
C
/
W
0.20
0.10
D = 0.50
0.02
0.01
0.05
SINGLE PULSE
( THERMAL RESPONSE )
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthja + T
A
-75 -50 -25 0 25 50 75 100 125 150
T
J
, Temperature ( °C )
1.0
1.5
2.0
2.5
-
V
G
S
(
t
h
)
,
G
a
t
e
t
h
r
e
s
h
o
l
d
V
o
l
t
a
g
e
(
V
)
I
D
= -100µA
25 50 75 100 125 150
T
A
, Ambient Temperature (°C)
0
5
10
15
20
-
I
D
,
D
r
a
i
n
C
u
r
r
e
n
t
(
A
)
0.1 1 10 100
-V
DS
, Drain-to-Source Voltage (V)
0.1
1
10
100
1000
-
I
D
,
D
r
a
i
n
-
t
o
-
S
o
u
r
c
e
C
u
r
r
e
n
t
(
A
)
OPERATION IN THIS AREA
LIMITED BY R
DS
(on)
T
A
= 25°C
Tj = 150°C
Single Pulse
100µsec
1msec
10msec
IRF9310PbF
www.irf.com 5
Fig 14. Maximum Avalanche Energy vs. Drain Current
Fig 12. On-Resistance vs. Gate Voltage
Fig 13. Typical On-Resistance vs. Drain Current
Fig 16. Typical Power vs. Time
* Reverse Polarity of D.U.T for P-Channel
P.W.
Period
di/dt
Diode Recovery
dv/dt
Ripple 5%
Body Diode Forward Drop
Re-Applied
Voltage
Reverse
Recovery
Current
Body Diode Forward
Current
V
GS
=10V
V
DD
I
SD
Driver Gate Drive
D.U.T. I
SD
Waveform
D.U.T. V
DS
Waveform
Inductor Curent
D =
P. W .
Period
* V
GS
= 5V for Logic Level Devices
*
Inductor Current
Circuit Layout Considerations
Low Stray Inductance
Ground Plane
Low Leakage Inductance
Current Transformer
di/dt controlled by R
G
Driver same type as D.U.T.
I
SD
controlled by Duty Factor "D"
D.U.T. - Device Under Test
+
+
+
-
-
-
R
G
V
DD
D.U.T *
Fig 17. Diode Reverse Recovery Test Circuit for P-Channel HEXFET
®
Power MOSFETs
2 4 6 8 10 12 14 16 18 20
-V
GS,
Gate -to -Source Voltage (V)
2
4
6
8
10
12
R
D
S
(
o
n
)
,
D
r
a
i
n
-
t
o
-
S
o
u
r
c
e
O
n
R
e
s
i
s
t
a
n
c
e
(
m
)
T
J
= 125°C
T
J
= 25°C
I
D
= -20A
25 50 75 100 125 150
Starting T
J
, Junction Temperature (°C)
0
300
600
900
1200
1500
1800
2100
2400
2700
E
A
S
,
S
i
n
g
l
e
P
u
l
s
e
A
v
a
l
a
n
c
h
e
E
n
e
r
g
y
(
m
J
)
I
D
TOP -1.8A
-2.7A
BOTTOM -16A
0 20 40 60 80 100 120 140 160
-I
D
, Drain Current (A)
2
4
6
8
10
12
14
R
D
S
(
o
n
)
,
D
r
a
i
n
-
t
o
-
S
o
u
r
c
e
O
n
R
e
s
i
s
t
a
n
c
e
(
m
)
V
GS
= -10V
V
GS
= -4.5V
1E-5 1E-4 1E-3 1E-2 1E-1 1E+0
Time (sec)
0
200
400
600
800
1000
S
i
n
g
l
e
P
u
l
s
e
P
o
w
e
r
(
W
)
IRF9310PbF
6 www.irf.com
Fig 18a. Gate Charge Test Circuit
Fig 18b. Gate Charge Waveform
Fig 19b. Unclamped Inductive Waveforms
Fig 19a. Unclamped Inductive Test Circuit
Fig 20b. Switching Time Waveforms
Fig 20a. Switching Time Test Circuit
Vds
Vgs
Id
Vgs(th)
Qgs1
Qgs2QgdQgodr
1K
VCC
DUT
0
L
S
20K
S
R
G
I
AS
0.01
t
p
D.U.T
L
V
DS
V
DD
DRIVER
A
15V
-20V
-V
GS
V
DS
-V
GS
Pulse Width ≤ 1 µs
Duty Factor ≤ 0.1 %
R
D
V
GS
V
DD
R
G
D.U.T.
+
-
t
p
V
(
BR
)
DSS
I
AS
V
DS
90%
10%
V
GS
t
d(on)
t
r
t
d(off)
t
f

IRF9310TRPBF

Mfr. #:
Manufacturer:
Infineon / IR
Description:
MOSFET MOSFT P-Ch -30V -20A 4.6mOhm
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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