Sheet No.: D2-A05902EN
Fig.24 Application Circuit
10
Remarks : Please be aware that all data in the graph are just for reference and not for guarantee.
PC942J00000F Series
Cathode
Anode
+
GND
O
2
O
1
V
CC
+
Load
6V
E
C
B
Power transistor
module
TTL, microcomputer, etc.
+5V
This application circuit shows the general example of a circuit, and is not a disign guarantee for right opera-
tion.
Sheet No.: D2-A05902EN
11
PC942J00000F Series
Design Considerations
Transistor of detector side in bipolar configuration may be damaged by static electricity due to its minute de-
sign.
When handling these devices, general countermeasure against static electricity should be taken to avoid
breakdown of devices or degradation of characteristics.
Notes about static electricity
In order to stabilize power supply line, we should certainly recommend to connect a by-pass capacitor of
0.01µF or more between V
CC
and GND near the device.
In case that some sudden big noise caused by voltage variation is provided between primary and secondary
terminals of photocoupler some current caused by it is floating capacitance may be generated and result in
false operation since current may go through IRED or current may change.
If the photocoupler may be used under the circumstances where noise will be generated we recommend to
use the bypass capacitors at the both ends of IRED.
The detector which is used in this device, has parasitic diode between each pins and GND.
There are cases that miss operation or destruction possibly may be occurred if electric potential of any pin
becomes below GND level even for instant.
Therefore it shall be recommended to design the circuit that electric potential of any pin does not become
below GND level.
This product is not designed against irradiation and incorporates non-coherent IRED.
Design guide
Sheet No.: D2-A05902EN
For additional design assistance, please review our corresponding Optoelectronic Application Notes.
12
PC942J00000F Series
Degradation
In general, the emission of the IRED used in photocouplers will degrade over time.
In the case of long term operation, please take the general IRED degradation (50% degradation over 5
years) into the design consideration.
Please decide the input current which become 2 times of MAX. I
FLH
.
Recommended Foot Print (reference)
2.542.54
1.7
2.2
8.2
2.54
(Unit : mm)

PC942J00000F

Mfr. #:
Manufacturer:
Sharp Microelectronics
Description:
OPTOISO 5KV OPIC 8DIP
Lifecycle:
New from this manufacturer.
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