KIT1925MMA6233Q

Document Number: MMA6231Q
Rev 2, 10/2006
Freescale Semiconductor
Technical Data
© Freescale Semiconductor, Inc., 2006. All rights reserved.
±10g Dual Axis
Micromachined Accelerometer
The MMA6200 series of low cost capacitive micromachined accelerometers
feature signal conditioning, a 1-pole low pass filter and temperature
compensation. Zero-g offset full scale span and filter cut-off are factory set
and require no external devices. A full system self-test capability verifies
system functionality.
Features
Low Noise
Low Cost
Low Power
2.7 V to 3.6 V Operation
6mm x 6mm x 1.98 mm QFN
Integral Signal Conditioning with Low Pass Filter
Linear Output
Ratiometric Performance
•Self-Test
Robust Design, High Shocks Survivability
Typical Applications
Pedometer
Appliance Control
Impact Monitoring
Vibration Monitoring and Recording
Position & Motion Sensing
Freefall Detection
Smart Portable Electronics
ORDERING INFORMATION
Device Name
Bandwidth
Response
I
DD
Case No. Package
MMA6231Q 300 Hz 1.2 mA 1477-02 QFN-16, Tube
MMA6231QR2 300 Hz 1.2 mA 1477-02 QFN-16,Tape & Reel
MMA6233Q 900 Hz 2.2 mA 1477-02 QFN-16, Tube
MMA6233QR2 900 Hz 2.2 mA 1477-02 QFN-16,Tape & Reel
MMA6231Q
MMA6233Q
MMA6230Q Series: X-Y AXIS
SENSITIVITY MICROMACHINED
ACCELEROMETER
±10 g
16-LEAD
QFN
CASE 1477-02
Top View
Figure 1. Pin Connections
Bottom View
1516 14 13
12
11
10
1
2
3
4
5678
9N/C
N/C
N/C
N/C
N/CN/C
N/C
N/C
N/C
X
OUT
Y
OUT
ST
NC
NC
V
DD
V
SS
MMA6231Q
Sensors
2 Freescale Semiconductor
ELECTRO STATIC DISCHARGE (ESD)
WARNING: This device is sensitive to electrostatic
discharge.
Although the Freescale accelerometers contain internal
2 kV ESD protection circuitry, extra precaution must be taken
by the user to protect the chip from ESD. A charge of over
2000 volts can accumulate on the human body or associated
test equipment. A charge of this magnitude can alter the
performance or cause failure of the chip. When handling the
accelerometer, proper ESD precautions should be followed
to avoid exposing the device to discharges which may be
detrimental to its performance.
X-FilterX-GainX-Integrator
X-Temp
Comp
Clock Generator
Oscillator
Control Logic &
EEPROM Trim Circuits
Y-Temp
Comp
Y-FilterY-GainY-Integrator
G-Cell
Sensor
Self Test
ST
V
DD
X
OUT
Y
OUT
V
SS
Figure 2. Simplified Accelerometer Functional Block Diagram
Table 1. Maximum Ratings
(Maximum ratings are the limits to which the device can be exposed without causing permanent damage.)
Rating Symbol Value Unit
Maximum Acceleration (all axis) g
max
±2000 g
Supply Voltage V
DD
–0.3 to +3.6 V
Drop Test
(1)
1. Dropped onto concrete surface from any axis.
D
drop
1.2 m
Storage Temperature Range T
stg
40 to +125 °C
MMA6231Q
Sensors
Freescale Semiconductor 3
Table 2. Operating Characteristics
Unless otherwise noted: -20°C < T
A
< 85°C, 3.0 V < V
DD
< 3.6 V, Acceleration = 0g, Loaded output
(1)
1. For a loaded output, the measurements are observed after an RC filter consisting of a 1.0 k resistor and a 0.1 µF capacitor to ground.
Characteristic Symbol Min Typ Max Unit
Operating Range
(2)
2. These limits define the range of operation for which the part will meet specification.
Supply Voltage
(3)
3. Within the supply range of 2.7 and 3.6 V, the device operates as a fully calibrated linear accelerometer. Beyond these supply limits the device
may operate as a linear device but is not guaranteed to be in calibration.
V
DD
2.7 3.3 3.6 V
Supply Current
MMA6231Q I
DD
—1.2 1.5 mA
MMA6233Q I
DD
—2.2 3.0 mA
Operating Temperature Range T
A
–20 +85 °C
Acceleration Range g
FS
—10 g
Output Signal
Zero g (T
A
= 25°C, V
DD
= 3.3 V)
(4)
4. The device can measure both + and – acceleration. With no input acceleration the output is at midsupply. For positive acceleration the output
will increase above V
DD
/2. For negative acceleration, the output will decrease below V
DD
/2.
V
OFF
1.485 1.65 1.815 V
Zero g V
OFF
, T
A
—2.0 mg/°C
Sensitivity (T
A
= 25°C, V
DD
= 3.3 V) S 111 120 129 mV/g
Sensitivity S, T
A
0.015 %/°C
Bandwidth Response
MMA6231Q f
_3dB
300 Hz
MMA6233Q f
_3dB
900 Hz
Nonlinearity NL
OUT
–1.0 +1.0 % FSO
Noise
MMA6231Q RMS (0.1 Hz – 1 kHz) n
RMS
—0.7mVrms
MMA6233Q RMS (0.1 Hz – 1 kHz) n
RMS
—0.6
Power Spectral Density RMS (0.1 Hz – 1 kHz)
MMA6231Q n
PSD
—50 ug/Hz
MMA6233Q n
PSD
—30
Self-Test
Output Response g
ST
2.0 g
Input Low V
IL
0.3 V
DD
V
Input High V
IH
0.7 V
DD
—V
DD
V
Pull-Down Resistance
(5)
5. The digital input pin has an internal pull-down resistance to prevent inadvertent self-test initiation due to external board level leakages.
R
PO
43 57 71 k
Response Time
(6)
6. Time for the output to reach 90% of its final value after a self-test is initiated.
t
ST
—2.0 ms
Output Stage Performance
Full-Scale Output Range (I
OUT
= 200 µA) V
FSO
V
SS
+0.25 V
DD
–0.25 V
Capacitive Load Drive
(7)
7. Preserves phase margin (60°) to guarantee output amplifier stability.
C
L
100 pF
Output Impedance Z
O
50 300
Power-Up Response Time
MMA6231Q t
RESPONSE
—2.0 ms
MMA6233Q t
RESPONSE
—0.7 ms
Mechanical Characteristics
Transverse Sensitivity
(8)
8. A measure of the device’s ability to reject an acceleration applied 90° from the true axis of sensitivity.
V
ZX
,
YX
,
ZY
–5.0 +5.0 % FSO

KIT1925MMA6233Q

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
KIT SENSOR ACCEL MMA6233Q
Lifecycle:
New from this manufacturer.
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